Charles F. Hawkins

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Kaushik Roy 0001

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Publications

2003
[j12]
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Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De:
Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. IEEE Trans. Very Large Scale Integr. Syst. 11(5): 863-870 (2003)
2002
[j11]
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Ali Keshavarzi, James W. Tschanz, Siva G. Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins:
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Des. Test Comput. 19(5): 36-43 (2002)
2000
[j10]
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Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins:
Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. IEEE Trans. Very Large Scale Integr. Syst. 8(6): 717-723 (2000)
[c21]
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Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De:
Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. ITC 2000: 1051-1059
1999
[c20]
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Ali Keshavarzi, Siva G. Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De:
Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. ISLPED 1999: 252-254
1997
[c17]
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Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins:
Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. ITC 1997: 146-155

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