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Changsheng Xie
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Publications
- 2023
- [j85]Yu Wang, You Zhou, Fei Wu, Yu Zhong, Jian Zhou, Zhonghai Lu, Shu Li, Zhengyong Wang, Changsheng Xie:
Holistic and Opportunistic Scheduling of Background I/Os in Flash-Based SSDs. IEEE Trans. Computers 72(11): 3127-3139 (2023) - [c177]Yu Wang, You Zhou, Zhonghai Lu, Xiaoyi Zhang, Kun Wang, Feng Zhu, Shu Li, Changsheng Xie, Fei Wu:
FlexZNS: Building High-Performance ZNS SSDs with Size-Flexible and Parity-Protected Zones. ICCD 2023: 291-299 - 2022
- [j80]Lanlan Cui, Xiaojian Liu, Fei Wu, Zhonghai Lu, Changsheng Xie:
A Low Bit-Width LDPC Min-Sum Decoding Scheme for NAND Flash. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(6): 1971-1975 (2022) - 2021
- [j69]Weihua Liu, Fei Wu, Meng Zhang, Chengmo Yang, Zhonghai Lu, Jiguang Wan, Changsheng Xie:
DEPS: Exploiting a Dynamic Error Prechecking Scheme to Improve the Read Performance of SSD. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(1): 66-77 (2021) - [c170]Weihua Liu, Fei Wu, Jian Zhou, Meng Zhang, Chengmo Yang, Zhonghai Lu, Yu Wang, Changsheng Xie:
Modeling of Threshold Voltage Distribution in 3D NAND Flash Memory. DATE 2021: 1729-1732 - 2020
- [j63]Ruixiang Ma, Fei Wu, Zhonghai Lu, Wenmin Zhong, Qiulin Wu, Jiguang Wan, Changsheng Xie:
BlockHammer: Improving Flash Reliability by Exploiting Process Variation Aware Proactive Failure Prediction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12): 4563-4574 (2020) - 2019
- [j62]Ruixiang Ma, Fei Wu, Meng Zhang, Zhonghai Lu, Jiguang Wan, Changsheng Xie:
RBER-Aware Lifetime Prediction Scheme for 3D-TLC NAND Flash Memory. IEEE Access 7: 44696-44708 (2019) - [j59]You Zhou, Fei Wu, Zhonghai Lu, Xubin He, Ping Huang, Changsheng Xie:
SCORE: A Novel Scheme to Efficiently Cache Overlong ECCs in NAND Flash Memory. ACM Trans. Archit. Code Optim. 15(4): 60:1-60:25 (2019) - [c159]Weihua Liu, Fei Wu, Meng Zhang, Yifei Wang, Zhonghai Lu, Xiangfeng Lu, Changsheng Xie:
Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge Trap NAND Flash. DATE 2019: 312-315 - 2018
- [j52]Shunzhuo Wang, Fei Wu, Zhonghai Lu, Jiaona Zhou, Changsheng Xie:
WARD: Wear Aware RAID Design Within SSDs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(11): 2918-2928 (2018) - [j51]Qin Xiong, Fei Wu, Zhonghai Lu, Yue Zhu, You Zhou, Yibing Chu, Changsheng Xie, Ping Huang:
Characterizing 3D Floating Gate NAND Flash: Observations, Analyses, and Implications. ACM Trans. Storage 14(2): 16:1-16:31 (2018) - [c150]Xin Shi, Fei Wu, Shunzhuo Wang, Changsheng Xie, Zhonghai Lu:
Program error rate-based wear leveling for NAND flash memory. DATE 2018: 1241-1246 - [c146]Fei Wu, Yue Zhu, Qin Xiong, Zhonghai Lu, You Zhou, Weizhen Kong, Changsheng Xie:
Characterizing 3D Charge Trap NAND Flash: Observations, Analyses and Applications. ICCD 2018: 381-388 - [c141]Hao Lv, You Zhou, Fei Wu, Weijun Xiao, Xubin He, Zhonghai Lu, Changsheng Xie:
Exploiting Minipage-Level Mapping to Improve Write Efficiency of NAND Flash. NAS 2018: 1-10 - 2017
- [j43]Qin Xiong, Fei Wu, Zhonghai Lu, Changsheng Xie:
Extending Real-Time Analysis for Wormhole NoCs. IEEE Trans. Computers 66(9): 1532-1546 (2017) - [c138]Shunzhuo Wang, Fei Wu, Zhonghai Lu, You Zhou, Qin Xiong, Meng Zhang, Changsheng Xie:
Lifetime adaptive ECC in NAND flash page management. DATE 2017: 1253-1556 - [c129]Yue Zhu, Fei Wu, Qin Xiong, Zhonghai Lu, Changsheng Xie:
ALARM: A Location-Aware Redistribution Method to Improve 3D FG NAND Flash Reliability. NAS 2017: 1-10 - [c126]Qin Xiong, Fei Wu, Zhonghai Lu, Yue Zhu, You Zhou, Yibing Chu, Changsheng Xie, Ping Huang:
Characterizing 3D Floating Gate NAND Flash. SIGMETRICS (Abstracts) 2017: 31-32 - 2016
- [c125]Qin Xiong, Zhonghai Lu, Fei Wu, Changsheng Xie:
Real-Time Analysis for Wormhole NoC: Revisited and Revised. ACM Great Lakes Symposium on VLSI 2016: 75-80
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