Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Program error rate-based wear leveling for NAND flash memory."

Xin Shi et al. (2018)

> Home

Details and statistics

DOI: 10.23919/DATE.2018.8342205

access: closed

type: Conference or Workshop Paper

metadata version: 2018-04-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/date/ShiWWXL18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/ShiWWXL18
Xin Shi, Fei Wu, Shunzhuo Wang, Changsheng Xie, Zhonghai Lu:
Program error rate-based wear leveling for NAND flash memory. DATE 2018: 1241-1246

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.