Volume 56,
Number 1,
March 2007
- Jason W. Rupe:
Editorial - IEEE Editors Survey on the Features of Accepted Papers.
2-9
- Yi-Kuei Lin:
Reliability of a Flow Network Subject to Budget Constraints.
10-16
- Yi-Kuei Lin:
System Reliability of a Limited-Flow Network in Multicommodity Case.
17-25
- M. Agarwal, K. Sen, P. Mohan:
GERT Analysis of m-Consecutive-k-Out-of-n Systems.
26-34
- Serkan Eryilmaz:
On the Lifetime Distribution of Consecutive -out-of-n: F System.
35-39
- Huairui Guo, Haitao Liao, Wenbiao Zhao, Adamantios Mettas:
A New Stochastic Model for Systems Under General Repairs.
40-49
- Kin-Ping Hui:
Monte Carlo Network Reliability Ranking Estimation.
50-57
- Liudong Xing:
Reliability Evaluation of Phased-Mission Systems With Imperfect Fault Coverage and Common-Cause Failures.
58-68
- Wei-Ting Kary Chien, S. F. Yang:
A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing.
69-76
- Chenhua Li, N. Fard:
Optimum Bivariate Step-Stress Accelerated Life Test for Censored Data.
77-84
- Francis G. Pascual:
Accelerated Life Test Planning With Independent Weibull Competing Risks With Known Shape Parameter.
85-93
- J. Onishi, S. Kimura, R. J. W. James, Y. Nakagawa:
Solving the Redundancy Allocation Problem With a Mix of Components Using the Improved Surrogate Constraint Method.
94-101
- B. M. Golam Kibria, Saralees Nadarajah:
Reliability Modeling: Linear Combination and Ratio of Exponential and Rayleigh.
102-105
- Furong Tan, Zhibin Jiang, Suk Joo Bae:
Generalized Linear Mixed Models for Reliability Analysis of Multi-Copy Repairable Systems.
106-114
- Noyan Turkkan, Thu Pham-Gia:
System Stress-Strength Reliability: The Multivariate Case.
115-124
- J. Nierwinski:
Reliability Sampling Methodology Using Simulation and Re-Sampling.
125-131
- Ammar M. Sarhan:
Analysis of Incomplete, Censored Data in Competing Risks Models With Generalized Exponential Distributions.
132-138
- L.-R. Chang-Chien, Yin-Juin Lin, Chin-Chung Wu:
A Real-Time Contingency Reserve Scheduling for an Isolated Power System.
139-147
- Gregory Levitin:
Optimal Defense Strategy Against Intentional Attacks.
148-157
- M. Giorgio, Maurizio Guida, Gianpaolo Pulcini:
A Wear Model for Assessing the Reliability of Cylinder Liners in Marine Diesel Engines.
158-166
- Jason W. Rupe:
Review of Optimal Reliability Design, Fundamentals and Applications.
167
- Jason W. Rupe:
Review of Reliability of Large Scale Systems.
167-168
- Way Kuo:
Corrections to "Challenges Related to Reliability in Nano Electronics".
169
Volume 56,
Number 2,
June 2007
- Way Kuo:
Editorial: How Reliable is Teaching Evaluation? The Relationship of Class Size to Teaching Evaluation Scores.
178-181
- George R. Roelke, Rusty O. Baldwin, Barry E. Mullins, Yong C. Kim:
A Cache Architecture for Extremely Unreliable Nanotechnologies.
182-197
- Chin-Yu Huang, Sy-Yen Kuo, Michael R. Lyu:
An Assessment of Testing-Effort Dependent Software Reliability Growth Models.
198-211
- Taghi M. Khoshgoftaar, Kehan Gao:
Count Models for Software Quality Estimation.
212-222
- Kehan Gao, Taghi M. Khoshgoftaar:
A Comprehensive Empirical Study of Count Models for Software Fault Prediction.
223-236
- Taghi M. Khoshgoftaar, Yi Liu:
A Multi-Objective Software Quality Classification Model Using Genetic Programming.
237-245
- Babu Zachariah, R. N. Rattihalli:
Failure Size Proportional Models and an Analysis of Failure Detection Abilities of Software Testing Strategies.
246-253
- Changcheng Huang, Minzhe Li, Anand Srinivasan:
A Scalable Path Protection Mechanism for Guaranteed Network Reliability Under Multiple Failures.
254-267
- Li Bai:
Generalized Access Structure Congestion System.
268-274
- Dirk P. Kroese, Kin-Ping Hui, Sho Nariai:
Network Reliability Optimization via the Cross-Entropy Method.
275-287
- Sy-Yen Kuo, Fu-Min Yeh, Hung-Yau Lin:
Efficient and Exact Reliability Evaluation for Networks With Imperfect Vertices.
288-300
- Narayanaswamy Balakrishnan, Arezou Habibi Rad, Naser Reza Arghami:
Testing Exponentiality Based on Kullback-Leibler Information With Progressively Type-II Censored Data.
301-307
- Theodora Dimitrakopoulou, Konstantinos Adamidis, Sotirios Loukas:
A Lifetime Distribution With an Upside-Down Bathtub-Shaped Hazard Function.
308-311
- Ammar M. Sarhan, Frank M. Guess, John S. Usher:
Estimators for Reliability Measures in Geometric Distribution Model Using Dependent Masked System Life Test Data.
312-320
- Yefim Haim Michlin, Genady Grabarnik:
Sequential Testing for Comparison of the Mean Time Between Failures for Two Systems.
321-331
- Ali Haj Shirmohammadi, Zhe George Zhang, Ernie Love:
A Computational Model for Determining the Optimal Preventive Maintenance Policy With Random Breakdowns and Imperfect Repairs.
332-339
- Zehui Li, Peng Zhao:
Reliability Analysis on the delta-Shock Model of Complex Systems.
340-348
- M. J. LuValle:
Identifying Mechanisms That Highly Accelerated Tests Miss.
349-359
- Juan A. Carrasco:
Corrections on "Failure Transition Distance-Based Importance Sampling Schemes for the Simulation of Repairable Fault-Tolerant Computer Systems" [Jun 06 207-236].
360
- M. P. Kaminskiy, V. V. Krivtsov, Saralees Nadarajah:
Erratum [Dec 05 612-616].
360
Volume 56,
Number 3,
September 2007
- Way Kuo, Jason W. Rupe:
R-Impact: Reliability-Based Citation Impact Factor.
366-367
- Min-Hsiung Hsieh, Shuen-Lin Jeng:
Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides.
369-380
- Chong Zhao, Xiaoliang Bai, Sujit Dey:
Evaluating Transient Error Effects in Digital Nanometer Circuits.
381-391
- Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam:
Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices.
392-400
- Shuen-Lin Jeng, Jye-Chyi Lu, Kaibo Wang:
A Review of Reliability Research on Nanotechnology.
401-410
- Wen-Li Wang, Thomas L. Hemminger, Mei-Huei Tang:
A Moving Average Non-Homogeneous Poisson Process Reliability Growth Model to Account for Software with Repair and System Structures.
411-421
- Eduardo Oliveira Costa, Gustavo A. de Souza, Aurora Trinidad Ramirez Pozo, Silvia Regina Vergilio:
Exploring Genetic Programming and Boosting Techniques to Model Software Reliability.
422-434
- Lixuan Lu, Jin Jiang:
Joint Failure Importance for Noncoherent Fault Trees.
435-443
- Yuan-Shun Dai, Gregory Levitin:
Optimal Resource Allocation for Maximizing Performance and Reliability in Tree-Structured Grid Services.
444-453
- Hoang Pham, Chin-Diew Lai:
On Recent Generalizations of the Weibull Distribution.
454-458
- William J. Owen:
An Exponential Damage Model for Strength of Fibrous Composite Materials.
459-463
- Albert F. Myers:
k-out-of-n: G System Reliability With Imperfect Fault Coverage.
464-473
- Jose Emmanuel Ramirez-Marquez, Bethel A. Gebre:
A Classification Tree Based Approach for the Development of Minimal Cut and Path Vectors of a Capacitated Network.
474-487
- Wei-Chang Yen:
A Simple Heuristic Algorithm for Generating All Minimal Paths.
488-494
- Li Bai, Fan Zheng:
Ternary State Circular Sequential k-out-of-n Congestion System.
495-505
- Gary Hardy, Corinne Lucet, Nikolaos Limnios:
K-Terminal Network Reliability Measures With Binary Decision Diagrams.
506-515
- Xian Zhao, Lirong Cui, Way Kuo:
Reliability for Sparsely Connected Consecutive-k Systems.
516-524
- Gerard L. Reijns, Arjan J. C. van Gemund:
Reliability Analysis of Hierarchical Systems Using Statistical Moments.
525-533
- Bhupender Parashar, Gulshan Taneja:
Reliability and Profit Evaluation of a PLC Hot Standby System Based on a Master-Slave Concept and Two Types of Repair Facilities.
534-539
- Dazhi Wang, Kishor S. Trivedi:
Reliability Analysis of Phased-Mission System With Independent Component Repairs.
540-551
- Shaomin Wu, Min Xie:
Classifying Weak, and Strong Components Using ROC Analysis With Application to Burn-In.
552-561
- Tsong Yueh Chen, Robert G. Merkel:
Quasi-Random Testing.
562-568
- Hai-Yan Xu, He-Liang Fei:
Planning Step-Stress Accelerated Life Tests With Two Experimental Variables.
569-579
Volume 56,
Number 4,
December 2007
- Way Kuo:
Compatibility and Simplicity: The Fundamentals of Reliability.
585-586
- Jérôme Collet:
Correction to "Some Remarks on Rare-Event Approximation".
587
- Ming-Wei Wu, Yi-Min Wang, Sy-Yen Kuo, Yennun Huang:
Self-Healing Spyware: Detection, and Remediation.
588-596
- Long Wang, Zbigniew Kalbarczyk, Weining Gu, Ravishankar K. Iyer:
Reliability MicroKernel: Providing Application-Aware Reliability in the OS.
597-614
- Günther A. Hoffmann, Kishor S. Trivedi, Miroslaw Malek:
A Best Practice Guide to Resource Forecasting for Computing Systems.
615-628
- Y. P. Wu, Q. P. Hu, Min Xie, Szu Hui Ng:
Modeling and Analysis of Software Fault Detection and Correction Process by Considering Time Dependency.
629-642
- W. Douglas Obal II, Michael G. McQuinn, William H. Sanders:
Detecting and Exploiting Symmetry in Discrete-State Markov Models.
643-654
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