"Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices."

Suk Joo Bae et al. (2007)

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DOI: 10.1109/TR.2007.903232

access: closed

type: Journal Article

metadata version: 2020-07-09

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Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam:
Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices. IEEE Trans. Reliab. 56(3): 392-400 (2007)

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