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Publication search results
found 115 matches
- 2005
- Mark Anderson, Patrick Whitcomb:
Practical Guide to Designed Experiments: A Unified Modular Approach. Technometrics 47(4): 514-515 (2005) - Olçay Arslan:
Measurement and Multivariate Analysis. Technometrics 47(1): 95-96 (2005) - Anthony C. Atkinson:
Robust Optimum Designs for Transformation of the Responses in a Multivariate Chemical Kinetic Model. Technometrics 47(4): 478-487 (2005) - Gutti Jogesh Babu:
Bootstrap Techniques for Signal Processing. Technometrics 47(3): 374-375 (2005) - Subhash C. Bagui:
Combining Pattern Classifiers: Methods and Algorithms. Technometrics 47(4): 517-518 (2005) - Mark Bailey:
The Complete Idiot's Guide to Statistics. Technometrics 47(4): 524 (2005) - Lawrence E. Barker:
Logit Models From Economics and Other Fields. Technometrics 47(1): 97-98 (2005) - Maria J. Bayarri, Gonzalo García-Donato:
A Bayesian Sequential Look at u-Control Charts. Technometrics 47(2): 142-151 (2005) - Dulal K. Bhaumik, Robert D. Gibbons:
Confidence Regions for Random-Effects Calibration Curves With Heteroscedastic Errors. Technometrics 47(2): 223-231 (2005) - David E. Booth:
Chemometrics: From Basics to Wavelet Transform. Technometrics 47(2): 240 (2005) - David E. Booth:
Multi-Way Analysis: Applications in the Chemical Sciences. Technometrics 47(4): 518-519 (2005) - James E. Breneman:
Kernel Methods for Pattern Analysis. Technometrics 47(2): 237 (2005) - William A. Brenneman:
Statistics for Research. Technometrics 47(1): 100 (2005) - Robert V. Brill:
Basic Statistics and Data Analysis. Technometrics 47(1): 99-100 (2005) - Tom L. Burr, Herbert A. Fry:
Biased Regression: The Case for Cautious Application. Technometrics 47(3): 284-296 (2005) - Vittorio Castelli:
Bayesian Nonparametrics via Neural Networks, Herbert K. H. Lee. Technometrics 47(2): 235 (2005) - Belén Fernández de Castro, Serge Guillas, Wenceslao González-Manteiga:
Functional Samples and Bootstrap for Predicting Sulfur Dioxide Levels. Technometrics 47(2): 212-222 (2005) - Charles W. Champ, L. Allison Jones-Farmer, Steven E. Rigdon:
Properties of the T2 Control Chart When Parameters Are Estimated. Technometrics 47(4): 437-445 (2005) - Snigdhansu Chatterjee:
Procrustes Problems. Technometrics 47(3): 376 (2005) - W. Michael Conklin:
Multivariate Bayesian Statistics: Models for Source Separation and Signal Unmixing. Technometrics 47(1): 95 (2005) - Radu V. Craiu, Thomas C. M. Lee:
Model Selection for the Competing-Risks Model With and Without Masking. Technometrics 47(4): 457-467 (2005) - Yu Ding:
Design and Analysis of Accelerated Tests for Mission-Critical Reliability. Technometrics 47(2): 240 (2005) - Debbie J. Dupuis:
Ozone Concentrations: A Robust Analysis of Multivariate Extremes. Technometrics 47(2): 191-201 (2005) - Ali Esmaili:
Probability and Random Processes. Technometrics 47(3): 375 (2005) - Dianne M. Finkelstein:
A Beginner's Guide to Structural Equation Modeling. Technometrics 47(4): 522 (2005) - Ronald D. Fricker Jr.:
Cognition and Chance: The Psychology of Probabilistic Reasoning. Technometrics 47(3): 376 (2005) - Stephen J. Ganocy:
Introduction to Bayesian Statistics. Technometrics 47(2): 236-237 (2005) - Subir Ghosh:
Generalized Inference in Repeated Measures: Exact Methods in MANOVA and Mixed Models. Technometrics 47(2): 233 (2005) - Jeffrey G. Glosup:
Generalized Linear Models: An Applied Approach. Technometrics 47(2): 232 (2005) - Marvin H. J. Gruber:
Optimization. Technometrics 47(3): 379 (2005)
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