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ORCIDTechnometrics, Volume 47
Volume 47, Number 1, 2005
- Daniel Peña
:
A New Statistic for Influence in Linear Regression. 1-12 - Brian D. Marx, Paul H. C. Eilers:
Multidimensional Penalized Signal Regression. 13-22 - Irwin Guttman, Daniel Peña, Dolores Redondas:
A Bayesian Approach for Predicting With Polynomial Regression of Unknown Degree. 23-33 - Qiqing Yu, George Y. C. Wong:
Modified Semiparametric Maximum Likelihood Estimator in Linear Regression Analysis With Complete Data or Right-Censored Data. 34-42 - David J. Olive, Douglas M. Hawkins:
Variable Selection for 1D Regression Models. 43-50 - Arden Miller:
The Analysis of Unreplicated Factorial Experiments Using All Possible Comparisons. 51-63 - Mia Hubert, Peter J. Rousseeuw, Karlien Vanden Branden:
ROBPCA: A New Approach to Robust Principal Component Analysis. 64-79 - Christopher K. Wikle, L. Mark Berliner:
Combining Information Across Spatial Scales. 80-91
- Jim Rutherford:
Planning, Construction, and Statistical Analysis of Comparative Experiments. 92-93 - Weiming Ke:
The Optimal Design of Blocked and Split-Plot Experiments. 94 - Andrew M. Kuhn:
Multivariate Statistical Methods in Quality Management. 94-95 - W. Michael Conklin:
Multivariate Bayesian Statistics: Models for Source Separation and Signal Unmixing. 95 - Olçay Arslan:
Measurement and Multivariate Analysis. 95-96 - William L. Seaver:
Random Graphs for Statistical Pattern Recognition. 96 - Lianfen Qian:
Statistical Curves and Parameters: Choosing an Appropriate Approach. 96-97 - Lorrie L. Hoffman, Elayne Reiss:
Statistical Models. 97 - Lawrence E. Barker:
Logit Models From Economics and Other Fields. 97-98 - Hoon Kim:
A First Course in Statistical Methods. 98-99 - Robert V. Brill:
Basic Statistics and Data Analysis. 99-100 - William A. Brenneman:
Statistics for Research. 100 - Bruce D. McCullough:
Diagnostic Checks in Time Series. 100 - Chunming Zhang:
Ranked Set Sampling: Theory and Applications. 100-101 - Nicholas Rose:
Highly Structured Stochastic Systems. 101 - Daniel Zelterman:
Bayesian Artificial Intelligence. 101-102 - Thomas D. Sandry:
Applied Data Mining. 102-103 - Donald E. Myers:
Reliability and Statistics in Geotechnical Engineering. 103-104
Volume 47, Number 2, 2005
- Runze Li, Agus Sudjianto:
Analysis of Computer Experiments Using Penalized Likelihood in Gaussian Kriging Models. 111-120 - Hongquan Xu, Lih-Yuan Deng:
Moment Aberration Projection for Nonregular Fractional Factorial Designs. 121-131 - Warren F. Kuhfeld, Randall D. Tobias:
Large Factorial Designs for Product Engineering and Marketing Research Applications. 132-141 - Maria J. Bayarri, Gonzalo García-Donato:
A Bayesian Sequential Look at u-Control Charts. 142-151 - Ramkumar Rajagopal, Enrique del Castillo:
Model-Robust Process Optimization Using Bayesian Model Averaging. 152-163 - Douglas M. Hawkins, K. D. Zamba:
Statistical Process Control for Shifts in Mean or Variance Using a Changepoint Formulation. 164-173 - A. Ian McLeod, E. R. Vingilis:
Power Computations for Intervention Analysis. 174-181 - Scott W. McKane, Luis A. Escobar, William Q. Meeker:
Sample Size and Number of Failure Requirements for Demonstration Tests With Log-Location-Scale Distributions and Failure Censoring. 182-190 - Debbie J. Dupuis:
Ozone Concentrations: A Robust Analysis of Multivariate Extremes. 191-201 - Richard R. Picard:
Importance Sampling for Simulation of Markovian Physical Processes. 202-211 - Belén Fernández de Castro, Serge Guillas, Wenceslao González-Manteiga:
Functional Samples and Bootstrap for Predicting Sulfur Dioxide Levels. 212-222 - Dulal K. Bhaumik, Robert D. Gibbons:
Confidence Regions for Random-Effects Calibration Curves With Heteroscedastic Errors. 223-231
- Jeffrey G. Glosup:
Generalized Linear Models: An Applied Approach. 232 - Diane K. Michelson:
Analysis of Variance for Random Models, Vol. 1: Balanced Data, Theory, Methods, Applications and Data Analysis. 233 - Subir Ghosh:
Generalized Inference in Repeated Measures: Exact Methods in MANOVA and Mixed Models. 233 - David J. Olive:
Introduction to Regression Analysis. 233 - Esteban Walker:
Semiparametric Regression, David Ruppert. 234-248 - Robert A. Lordo:
Nonparametric and Semiparametric Models. 234 - Vittorio Castelli:
Bayesian Nonparametrics via Neural Networks, Herbert K. H. Lee. 235 - Stephen J. Ganocy:
Introduction to Bayesian Statistics. 236-237 - James T. Wassell:
Sensitivity Analysis in Practice, Andrea Saltelli. 236 - Stan Lipovetsky:
Generalized Latent Variable Modeling: Multilevel, Longitudinal, and Structural Equation Models. 237-248 - James E. Breneman:
Kernel Methods for Pattern Analysis. 237 - Pradipta Sarkar:
An Introduction to Statistical Analysis for Business and Industry - A Problem Solving Approach. 238 - Arthur B. Yeh:
Fundamentals of Probability and Statistics for Engineers. 239 - David E. Booth:
Chemometrics: From Basics to Wavelet Transform. 240 - Yu Ding:
Design and Analysis of Accelerated Tests for Mission-Critical Reliability. 240 - Eric R. Ziegel:
Statistics for Petroleum Engineers and Geoscientists. 241 - Ranjan Maitra:
Numerical Issues in Statistical Computing for the Social Scientist. 241 - Eric R. Ziegel:
Statistical Analysis of Financial Data in S-PLUS. 242
Volume 47, Number 3, 2005
- Trevor J. Ringrose, Shaun A. Forth:
Simplifying Multivariate Second-Order Response Surfaces by Fitting Constrained Models Using Automatic Differentiation. 249-259 - Xiangrong Yin, Lynne Seymour:
Standard Errors for the Multiple Roots in Quadratic Response Surface Models. 260-263 - Ricardo A. Maronna:
Principal Components and Orthogonal Regression Based on Robust Scales. 264-273 - John J. Peterson, Andrew M. Kuhn:
Ridge Analysis With Noise Variables. 274-283 - Tom L. Burr, Herbert A. Fry:
Biased Regression: The Case for Cautious Application. 284-296 - Salvatore Ingrassia, Isabella Morlini:
Neural Network Modeling for Small Datasets. 297-311 - Thomas Mathew, David W. Webb:
Generalized p Values and Confidence Intervals for Variance Components: Applications to Army Test and Evaluation. 312-322 - Chen-Tuo Liao, Tsai-Yu Lin, H. K. Iyer:
One- and Two-Sided Tolerance Intervals for General Balanced Mixed Models and Unbalanced One-Way Random Models. 323-335 - Pansoo Kim, Yu Ding:
Optimal Engineering System Design Guided by Data-Mining Methods. 336-348 - Berwin A. Turlach, William N. Venables, Stephen J. Wright:
Simultaneous Variable Selection. 349-363 - Fred Lombard:
Nonparametric Confidence Bands for a Quantile Comparison Function. 364-371
- Theresa L. Utlaut:
Statistical Analysis and Data Display: An Intermediate Course With Examples in S-PLUS, R, and SAS. 371 - Malik Beshir Malik:
Applied Linear Regression. 371-372 - Timothy J. Robinson:
Linear Models With R. 372-373 - Melvin J. Hinich:
Time Series Analysis by State Space Methods. 373 - Jeffrey D. Scargle:
Chaos and Time-Series Analysis. 373 - Bruce D. McCullough:
Statistical Analysis of Stochastic Processes in Time. 373-374 - Donald E. Myers:
Time Series Analysis and Inverse Theory for Geophysicists. 374 - Gutti Jogesh Babu:
Bootstrap Techniques for Signal Processing. 374-375 - Casey A. Volino:
A First Course in Stochastic Models. 375 - Ali Esmaili:
Probability and Random Processes. 375 - Ronald D. Fricker Jr.:
Cognition and Chance: The Psychology of Probabilistic Reasoning. 376 - Snigdhansu Chatterjee:
Procrustes Problems. 376 - Nicole A. Lazar:
Statistics of Extremes: Theory and Applications. 376-377 - Dean V. Neubauer:
Statistics for the Sciences. 377-378 - Roger M. Sauter:
Introduction to Probability and Statistics for Engineers and Scientists. 378 - William J. Wilson:
Multivariate Statistical Methods. 378 - Julia C. O'Neill:
Statistical Techniques for Data Analysis. 379 - Marvin H. J. Gruber:
Optimization. 379
Volume 47, Number 4, 2005
- Randy R. Sitter:
Editor's Report. 385-387 - Randy R. Sitter:
Papers in Information Science and Technology. 387
- German Molina, Maria J. Bayarri, James O. Berger:
Statistical Inverse Analysis for a Network Microsimulator. 388-398 - Baibing Li:
Bayesian Inference for Origin-Destination Matrices of Transport Networks Using the EM Algorithm. 399-408 - Marion R. Reynolds Jr., Zachary G. Stoumbos:
Should Exponentially Weighted Moving Average and Cumulative Sum Charts Be Used With Shewhart Limits? 409-424 - William H. Woodall, Mahmoud A. Mahmoud:
The Inertial Properties of Quality Control Charts. 425-436 - Charles W. Champ, L. Allison Jones-Farmer, Steven E. Rigdon:
Properties of the T2 Control Chart When Parameters Are Estimated. 437-445 - Panagiotis Tsiamyrtzis, Douglas M. Hawkins:
A Bayesian Scheme to Detect Changes in the Mean of a Short-Run Process. 446-456 - Radu V. Craiu, Thomas C. M. Lee:
Model Selection for the Competing-Risks Model With and Without Masking. 457-467 - Nozer D. Singpurwalla:
Decelerated Testing: A Hierarchical Bayes Approach. 468-477 - Anthony C. Atkinson:
Robust Optimum Designs for Transformation of the Responses in a Multivariate Chemical Kinetic Model. 478-487 - Joseph G. Voelkel:
The Efficiencies of Fractional Factorial Designs. 488-494 - Murat Kulahci, Søren Bisgaard:
The Use of Plackett-Burman Designs to Construct Split-Plot Designs. 495-501 - Arden Miller, Randy R. Sitter:
Using Folded-Over Nonorthogonal Designs. 502-513
- Mark Anderson, Patrick Whitcomb:
Practical Guide to Designed Experiments: A Unified Modular Approach. 514-515 - Thomas H. Short:
Stats: Data and Models. 515-516 - Jürgen Symanzik:
Statistical Analysis of Spatial Point Patterns. 516-517 - Charles E. Heckler:
Applied Multivariate Statistical Analysis. 517 - Subhash C. Bagui:
Combining Pattern Classifiers: Methods and Algorithms. 517-518 - David E. Booth:
Multi-Way Analysis: Applications in the Chemical Sciences. 518-519 - Peihua Qiu:
Generalized Least Squares. 519 - Keying Ye:
Applied Bayesian Modeling and Causal Inference From Incomplete-Data Perspectives. 519 - Ananda Sen:
Skew-Elliptical Distributions and Their Applications: A Journey Beyond Normality. 519-521 - Christopher K. Wikle:
Atmospheric Modeling, Data Assimilation, and Predictability. 521 - Hon Keung Tony Ng:
Computational Methods in Statistics and Econometrics. 521-522 - Dianne M. Finkelstein:
A Beginner's Guide to Structural Equation Modeling. 522 - J. P. Morgan:
Design and Analysis: A Researcher's Handbook. 522-523 - Walter T. Morgan:
Applied Statistics for the Six Sigma Green Belt. 523-524 - Mark Bailey:
The Complete Idiot's Guide to Statistics. 524 - Andrew M. Kuhn:
Code Complete. 524-525
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