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Publication search results
found 22 matches
- 2018
- Canras Batunlu
, Al-Hussein Albarbar:
Strategy for enhancing reliability and lifetime of DC-AC inverters used for wind turbines. Microelectron. Reliab. 85: 25-37 (2018) - Siyang Hu, Chengdong Yuan, Alessandro Castagnotto, Boris Lohmann
, Sofiane Bouhedma, Dennis Hohlfeld, Tamara Bechtold
:
Stable reduced order modeling of piezoelectric energy harvesting modules using implicit Schur complement. Microelectron. Reliab. 85: 148-155 (2018) - Josef Hylský, Dávid Strachala, Petr Vyroubal, Pavel Cudek, Jirí Vanek, Petr Vanýsek:
Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode. Microelectron. Reliab. 85: 12-18 (2018) - Masoomeh Karami
, Athena Abdi, Hamid R. Zarandi
:
A cross-layer aging-aware task scheduling approach for multiprocessor embedded systems. Microelectron. Reliab. 85: 190-197 (2018) - Golta Khatibi, A. Betzwar Kotas, Martin Lederer
:
Effect of aging on mechanical properties of high temperature Pb-rich solder joints. Microelectron. Reliab. 85: 1-11 (2018) - Junyeap Kim, Hanbin Yoo, Heesung Lee, Seong Kwang Kim, Sungju Choi
, Sung-Jin Choi, Dae Hwan Kim
, Dong Myong Kim
:
Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length. Microelectron. Reliab. 85: 66-70 (2018) - Yiyuan Li, Jianhua Li, Lixin Xu:
Failure mode analysis of MEMS suspended inductors under mechanical shock. Microelectron. Reliab. 85: 38-48 (2018) - Jorge Loayza, Nicolas Guitard, Bruno Allard, Luong-Viêt Phung
, Blaise Jacquier, Philippe Galy:
Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes. Microelectron. Reliab. 85: 176-189 (2018) - Richard McWilliam, Samir Khan
, Michael Farnsworth, Colin Bell:
Zero-maintenance of electronic systems: Perspectives, challenges, and opportunities. Microelectron. Reliab. 85: 122-139 (2018) - Péter Pálovics
, Ferenc Ender
, Márta Rencz:
Towards the CFD model of flow rate dependent enzyme-substrate reactions in nanoparticle filled flow microreactors. Microelectron. Reliab. 85: 84-92 (2018) - László Pohl
, Zsolt Kohári, András Poppe
:
Vertical natural convection models and their effect on failure analysis in electro-thermal simulation of large-surface OLEDs. Microelectron. Reliab. 85: 198-206 (2018) - Yiming Qu
, Bing Chen, Wei Liu, Jinghui Han, Jiwu Lu, Yi Zhao:
Sub-1 ns characterization methodology for transistor electrical parameter extraction. Microelectron. Reliab. 85: 93-98 (2018) - Gerhard Rzepa
, Jacopo Franco, Barry J. O'Sullivan, A. Subirats, Marko Simicic
, Geert Hellings, Pieter Weckx, Markus Jech, Theresia Knobloch
, Michael Waltl
, Philippe Roussel, Dimitri Linten, Ben Kaczer, Tibor Grasser
:
Comphy - A compact-physics framework for unified modeling of BTI. Microelectron. Reliab. 85: 49-65 (2018) - Junji Sakamoto
, Ryoma Hirata, Tadahiro Shibutani:
Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test. Microelectron. Reliab. 85: 19-24 (2018) - Tim Tilford
, Stoyan Stoyanov
, Jessica B. S. Langbaum, Jan Christoph Janhsen, Matthias Burgard, Richard B. Buxton, Chris Bailey
:
Design, manufacture and test for reliable 3D printed electronics packaging. Microelectron. Reliab. 85: 109-117 (2018) - Zhihua Wang
, Qiong Wu, Xiongjian Zhang, Xinlei Wen, Yongbo Zhang, Chengrui Liu, Huimin Fu:
A generalized degradation model based on Gaussian process. Microelectron. Reliab. 85: 207-214 (2018) - Paul Wild, Dominik Lorenz
, Tobias Grözinger
, André Zimmermann:
Effect of voids on thermo-mechanical reliability of chip resistor solder joints: Experiment, modelling and simulation. Microelectron. Reliab. 85: 163-175 (2018) - Shipeng Yi
, Zhengwei Du:
The influence of microwave pulse width on the thermal burnout effect of an LNA constructed by a GaAs PHEMT. Microelectron. Reliab. 85: 140-147 (2018) - Shipeng Yi
, Zhengwei Du:
The influence of microwave pulse repetition frequency on the thermal burnout effect of a PIN diode limiting-amplifying system. Microelectron. Reliab. 85: 156-162 (2018) - Qingwei Zhang, Ping Li, Yongbo Liao, Gang Wang, Rongzhou Zeng, Heng Wang:
A reverse hysteresis effect of graphene transistors with amorphous silicon gate dielectric. Microelectron. Reliab. 85: 118-121 (2018) - Jian-Xun Zhang
, Xiao-Sheng Si
, Dang-Bo Du, Chang-Hua Hu:
Specification analysis of the deteriorating sensor for required lifetime prognostic performance. Microelectron. Reliab. 85: 71-83 (2018) - Qi Zhao, Xiaoli Qin, Hongbo Zhao, Wenquan Feng:
A novel prediction method based on the support vector regression for the remaining useful life of lithium-ion batteries. Microelectron. Reliab. 85: 99-108 (2018)
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