• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 25 matches

• 2020
• 
  Salem Abdennadher, Kyle Tripician, Senthil Singaravelu:
  At Speed Testing Challenges and Solutions for 56Gbps and 112Gbps PAM4 SerDes. LATS 2020: 1-5
• 
  Alexander Aponte-Moreno, José Isaza-González, Alejandro Serrano-Cases, Antonio Martínez-Álvarez, Sergio Cuenca-Asensi, Felipe Restrepo-Calle:
  An Experimental Comparison of Fault Injection Tools for Microprocessor-based Systems. LATS 2020: 1-6
• 
  Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot:
  Implementing indirect test of RF circuits without compromising test quality: a practical case study. LATS 2020: 1-6
• 
  Carlos Bernal, Manuel Jiménez, Chris Aquino, Raul Cedres:
  A Test Architecture and VIE to Characterize Dielectric Absorption in Small Capacitors. LATS 2020: 1-5
• 
  Matheus Deon Bordignon, Rodolfo Adamshuk Silva:
  Mutation Operators for Concurrent Programs in Elixir. LATS 2020: 1-6
• 
  Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
  Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters. LATS 2020: 1-6
• 
  Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Matteo Sonza Reorda, Marcello Traiola, Emanuele Valea:
  Evaluating the Code Encryption Effects on Memory Fault Resilience. LATS 2020: 1-6
• 
  Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen:
  Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS 2020: 1-6
• 
  Bruno L. Costa, Carlos J. González, Rafael Galhardo Vaz, Odair Lelis Gonçalez, Tiago R. Balen:
  Influence of sampling frequency on TID response of SAR ADCs. LATS 2020: 1-6
• 
  Moabe F. Domingos, George H. Castro, Jarbas Silveira, Felipe G. A. e Silva, M. K. D. Pereira, Pedro Lima:
  MMS: A Software for Error Monitoring in Memories Protected by ECC. LATS 2020: 1-6
• 
  David Ruiz Falcó, Alejandro Serrano-Cases, Antonio Martínez-Álvarez, Sergio Cuenca-Asensi:
  Soft error reliability predictor based on a Deep Feedforward Neural Network. LATS 2020: 1-5
• 
  Raphael Segabinazzi Ferreira, Jörg Nolte, Fabian Vargas, Nevin George, Michael Hübner:
  Run-time Hardware Reconfiguration of Functional Units to Support Mixed-Critical Applications. LATS 2020: 1-6
• 
  João Carlos Britto Filho, Marcelo Lubaszewski:
  A Highly Reliable Wearable Device for Fall Detection. LATS 2020: 1-7
• 
  Marcio Gonçalves, José Rodrigo Azambuja, Josie E. Rodriguez Condia, Matteo Sonza Reorda, Luca Sterpone:
  Evaluating Software-based Hardening Techniques for General-Purpose Registers on a GPGPU. LATS 2020: 1-6
• 
  Ievgen Kabin, Zoya Dyka, Marcin Aftowicz, Dan Klann, Peter Langendörfer:
  Resistance of the Montgomery kP Algorithm against Simple SCA: Theory and Practice. LATS 2020: 1-6
• 
  Pedro Lima, Caio Vieira, Jorge Reis, Alexandre Almeida, Jarbas Silveira, Roger C. Goerl, César A. M. Marcon:
  Optimizing RISC-V ISA Usage by Sharing Coprocessors on MPSoC. LATS 2020: 1-5
• 
  Israel C. Lopes, Vincent Pouget, Frederic Wrobel, Frédéric Saigné, Antoine D. Touboul, Ketil Røed:
  Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects. LATS 2020: 1-6
• 
  Cleiton Magano Marques, Cristina Meinhardt, Paulo F. Butzen:
  Soft Error Reliability of SRAM cells during the three operation states. LATS 2020: 1-6
• 
  Zahira Perez, Javier Mesalles, Hector Villacorta, Fabian Vargas, Víctor H. Champac:
  Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells. LATS 2020: 1-6
• 
  Davide Piumatti, Matteo Vincenzo Quitadamo, Matteo Sonza Reorda, Franco Fiori:
  Testing Heatsink Faults in Power Transistors by means of Thermal Model. LATS 2020: 1-6
• 
  Ricardo A. L. Reis, Cristina Meinhardt, Alexandra L. Zimpeck, Leonardo Heitich Brendler, Leonardo B. Moraes:
  Circuit Level Design Methods to Mitigate Soft Errors. LATS 2020: 1-3
• 
  Hardi Selg, Maksim Jenihhin, Peeter Ellervee:
  Wafer-Level Die Re-Test Success Prediction Using Machine Learning. LATS 2020: 1-5
• 
  Jacopo Sini, M. D'Auria, Massimo Violante:
  Towards Vehicle-Level Simulator Aided Failure Mode, Effect, and Diagnostic Analysis of Automotive Power Electronics Items. LATS 2020: 1-6
• 
  Ghislain Takam Tchendjou, Emmanuel Simeu:
  Parametric faults detection and concealment on imager with FPGA implementation. LATS 2020: 1-6
• 
  IEEE Latin-American Test Symposium, LATS 2020, Maceio, Brazil, March 30 - April 2, 2020. IEEE 2020, ISBN 978-1-7281-8731-0 [contents]