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Publication search results
found 322 matches
- 2005
- Vieri Del Bianco, Luigi Lavazza:
An Empirical Assessment of Function Point-Like Object-Oriented Metrics. IEEE METRICS 2005: 40 - Luigi Buglione, Alain Abran:
A Model for Performance Management and Estimation. IEEE METRICS 2005: 9 - Gerardo Canfora, Luigi Cerulo:
Impact Analysis by Mining Software and Change Request Repositories. IEEE METRICS 2005: 29 - Rasvan Constantinescu:
An Outsourcing Model of Software Development. IEEE METRICS 2005: 47 - Bernhard Daubner:
Empowering Software Development Environments by Automatic Software Measurement. IEEE METRICS 2005: 45 - Stéphane Ducasse, Michele Lanza, Laura Ponisio:
Butterflies: A Visual Approach to Characterize Packages. IEEE METRICS 2005: 7 - Bernd G. Freimut, Christian Denger, Markus Ketterer:
An Industrial Case Study of Implementing and Validating Defect Classification for Process Improvement and Quality Management. IEEE METRICS 2005: 19 - Birgit Geppert, Audris Mockus, Frank Rößler:
Refactoring for Changeability: A Way to Go? IEEE METRICS 2005: 13 - Daniel M. Germán, Abram Hindle:
Measuring Fine-Grained Change in Software: Towards Modification-Aware Change Metrics. IEEE METRICS 2005: 28 - Carlo Ghezzi:
Flexible Processes for Evolvable Products. IEEE METRICS 2005: 1 - Swapna S. Gokhale, Robert E. Mullen:
Dynamic Code Coverage Metrics: A Lognormal Perspective. IEEE METRICS 2005: 33 - Stein Grimstad:
Understanding of Estimation Accuracy in Software Development Projects. IEEE METRICS 2005: 42 - Stein Grimstad, Magne Jørgensen, Kjetil Moløkken-Østvold:
The Clients' Impact on Effort Estimation Accuracy in Software Development Projects. IEEE METRICS 2005: 3 - Tanja Gruschke:
Empirical Studies of Software Cost Estimation: Training of Effort Estimation Uncertainty Assessment Skills. IEEE METRICS 2005: 48 - Tanja Gruschke, Magne Jørgensen:
Assessing Uncertainty of Software Development Effort Estimates: The Learning from Outcome Feedback. IEEE METRICS 2005: 4 - Gábor Guta:
Software Measurement in Large. IEEE METRICS 2005: 44 - Tracy Hall, Austen Rainer, Dorota Jagielska:
Using Software Development Progress Data to Understand Threats to Project Outcomes. IEEE METRICS 2005: 18 - Vahan Harput, Hermann Kaindl, Stefan Kramer:
Extending Function Point Analysis of Object-Oriented Requirements Specifications. IEEE METRICS 2005: 39 - Ahmed E. Hassan, Jingwei Wu, Richard C. Holt:
Visualizing Historical Data Using Spectrographs. IEEE METRICS 2005: 31 - Siw Elisabeth Hove, Bente Anda:
Experiences from Conducting Semi-structured Interviews in Empirical Software Engineering Research. IEEE METRICS 2005: 23 - Letizia Jaccheri, Thomas Østerlie:
Can We Teach Empirical Software Engineering? IEEE METRICS 2005: 25 - Magne Jørgensen, Tore Dybå, Barbara A. Kitchenham:
Teaching Evidence-Based Software Engineering to University Students. IEEE METRICS 2005: 24 - Denis Kozlov:
Evaluation and Improvement of the Software and Process Quality through Their Cross-Impact. IEEE METRICS 2005: 43 - Jingyue Li, Reidar Conradi, Odd Petter N. Slyngstad, Christian Bunse, Muhammad Umair Ahmed Khan, Marco Torchiano, Maurizio Morisio:
Validation of New Theses on Off-the-Shelf Component Based Development. IEEE METRICS 2005: 26 - Paul Luo Li, James D. Herbsleb, Mary Shaw:
Finding Predictors of Field Defects for Open Source Software Systems in Commonly Available Data Sources: A Case Study of OpenBSD. IEEE METRICS 2005: 32 - Gernot Armin Liebchen, Martin J. Shepperd:
Software Productivity Analysis of a Large Data Set and Issues of Confidentiality and Data Quality. IEEE METRICS 2005: 46 - Mikael Lindvall, Paolo Donzelli, Sima Asgari, Victor R. Basili:
Towards Reusable Measurement Patterns. IEEE METRICS 2005: 21 - Michael Yanguo Liu, Issa Traoré:
Measurement Framework for Software Privilege Protection Based on User Interaction Analysis. IEEE METRICS 2005: 10 - Chris Lokan:
What Should You Optimize When Building an Estimation Model?. IEEE METRICS 2005: 34 - Cristina Marinescu, Radu Marinescu, Tudor Gîrba:
Towards a Simplified Implementation of Object-Oriented Design Metrics. IEEE METRICS 2005: 11
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