share record
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Carol Pyron , Rex Sallade : CAE Functionality for Verification of Diagnostic Programs. ITC 1989 : 94-102 share record
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Rahul Razdan , M. Anwaruddin , Predrag G. Kovijanic , R. Ganesh , H.-C. Shih : An Interactive Sequential Test Pattern Generation System. ITC 1989 : 38-46 share record
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Kenneth Rose : Design Assurance in a University Setting. ITC 1989 : 247-248 share record
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Eric Rosenfeld : Issues for Mixed-Signal CAD-Tester Interface. ITC 1989 : 585-590 share record
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Kazuhiro Sakashita , Takeshi Hashizume , Takashi Ohya , Isao Takimoto , Shuichi Kato : Cell-Based Test Design Method. ITC 1989 : 909-916 share record
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Michael W. Salter , Kemon P. Taschioglou : Mainstream ATE: To Reduce LSI and VLSI Test Cost. ITC 1989 : 591-596 share record
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Arif Samad , Martin Bell : Automating ASIC Design-for-Testability: The VLSI Test Assistant. ITC 1989 : 819-828 share record
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Ron Santella : The Role of Test in a "Continuous Improvement" Environment. ITC 1989 : 304-308 share record
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Thomas M. Sarfert , Remo G. Markgraf , Erwin Trischler , Michael H. Schulz : Hierarchical Test Pattern Generation Based on High-Level Primitives. ITC 1989 : 470-479 share record
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Yvon Savaria , Bruno Laguë , Bozena Kaminska : A Pragmatic Approach to the Design of Self-Testing Circuits. ITC 1989 : 745-754 share record
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Jacob Savir , William H. McAnney , Salvatore R. Vecchio : Testing for Coupled Cells in Random-Access Memories. ITC 1989 : 439-451 share record
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Michael H. Schulz , Elisabeth Auth : Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits. ITC 1989 : 28-37 share record
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Yinan N. Shen , Fabrizio Lombardi : Location and Identification for Single and Multiple Faults in Testable Redundant PLAs for Yield Enhancement. ITC 1989 : 670-678 share record
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Jerry M. Soden , R. Keith Treece , Michael R. Taylor , Charles F. Hawkins : CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. ITC 1989 : 423-430 share record
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Jay M. Stepleton : A New System Architecture for a Combined In-Circuit/Functional Tester. ITC 1989 : 763-772 share record
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Charles E. Stroud , Ahmed E. Barbour : Design for Testability and Test Generation for Static Redundancy System Level Fault-Tolerant Circuits. ITC 1989 : 812-818 share record
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Kenneth R. Stuchlik : IC Characteristic Matching for Optimal System Performance. ITC 1989 : 309-315 share record
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George Swan , Yatin Trivedi , David J. Wharton : CrossCheck: A Practical Solution for ASIC Testability. ITC 1989 : 903-908 share record
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Christopher G. Talbot , Suresh Rajan : A Logic Analyzer Tool That Cuts E-Beam Prober Acquisition Times. ITC 1989 : 923 share record
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Kurt H. Thearling , Jacob A. Abraham : An Easily Computed Functional Level Testability Measure. ITC 1989 : 381-390 share record
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Yasuo Tokunaga , Jürgen Frosien : High Performance Electron Beam Tester for Voltage Measurement on Unpassivated and Passivated Devices. ITC 1989 : 917-922 share record
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Yoichi Tsubuku , Takao Nishida , Hiroshi Shiga , Ken Ohga , Hirohisa Nishine , Mamoru Kaneko : Main Frame Diagnosis Support System. ITC 1989 : 283-289 share record
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Bill Underwood , Jack Ferguson : The Parallel-Test-Detect Fault Simulation Algorithm. ITC 1989 : 712-717 share record
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Sue Vining : Tradeoff Decisions Made for P11149.1 Controller Design. ITC 1989 : 47-54 share record
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Melisa N. Vittrup , Glendon S. Frashure : A Fundamental Approach to SPC Implementation. ITC 1989 : 249-251 share record
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Xaiolin Wang , Fredrick J. Hill , Zhengkin Mi : A Sequential Circuit Fault Simulation by Surrogate Fault Propagation. ITC 1989 : 9-18 share record
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Bruce A. Webster : An Integrated Analog Test Simulation Environment. ITC 1989 : 567-571 share record
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James Westover : Practical Test Strategies for Users of 100 PPM ICs. ITC 1989 : 295-303 share record
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Chin-Long Wey : Fault Location in Repairable Programmable Logic Arrays. ITC 1989 : 679-685 share record
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Dhiren Xavier , Robert C. Aitken , André Ivanov , Vinod K. Agarwal : : Experiments on Aliasing in Signature Analysis Registers. ITC 1989 : 344-354