- Yvon Savaria, Vinod K. Agarwal, Nicholas C. Rumin, Jeremiah F. Hayes:
A Design for Machines with Built-In Tolerance to Soft Errors. ITC 1984: 649-659 - Douglas K. Shirachi:
CODEC Testing Using Synchronized Analog and Digital Signals. ITC 1984: 447-454 - David M. Singer:
Testability Analysis of MOS VLSI Circuits. ITC 1984: 690-696 - E. A. Sloane:
Transfer Function Estimation Part I : Theoretical and Practical Considerations. ITC 1984: 426-439 - Leslie Turner Smith, Roy R. Rezac:
Methodology for and Results from the Use of a Hardware Logic Simulation Engine for Fault Simulation. ITC 1984: 224-228 - Corot W. Starke:
Built-In Test for CMOS Circuits. ITC 1984: 309-314 - Zuhi Sun, Laung-Terng Wang:
Self-Testing of Embedded RAMs. ITC 1984: 148-156 - Alfred K. Susskind:
A Technique for Making Asynchronous Sequential Circuits Readily Testable. ITC 1984: 842-846 - Stephen R. Teta:
Using a Synchronous High-Speed Sensor System to Diagnose Microprocessor Boards. ITC 1984: 564-571 - Erwin Trischler:
ATWIG, An Automatic Test Pattern Generator with Inherent Guidance. ITC 1984: 80-87 - Jon Turino:
A Totally Universal Reset, Initialization (and) Nodal Observation Circuit. ITC 1984: 878-884 - Bill Underwood, M. Ray Mercer:
Correlating Testability with Fault Detection. ITC 1984: 697-704 - Prab Varma, Anthony P. Ambler, Keith Baker:
An Analysis of the Economics of Self Test. ITC 1984: 20-30 - R. F. Voitus:
PBX System Test: Fast Functional Testing Without System Assembly. ITC 1984: 482-488 - Kou Wada, Satoshi Tazawa, Katsutoshi Kubota:
A Flexible Database System and Its Application in VLSI Process Development. ITC 1984: 359-366 - F. C. Wang:
Testability Analysis: What Role Should it Play in IC Design ? ITC 1984: 725-727 - Steven L. Watkins, Kenny Liu, Mitchell Schrift, Robert Patrie:
C : An Important Tool for Test Software Development. ITC 1984: 636-641 - Todd Westerhoff, Andre DiMino:
The Role of the Engineering Work Station in Test Program Development. ITC 1984: 493-496 - Donald L. Wheater:
IBM's Cost Performance Array Tester Architecture for the 80's. ITC 1984: 466-470 - A. Jesse Wilkinson:
A Method for Test System Diagnostics Based on the Principles of Artificial Intelligence. ITC 1984: 188-195 - Tom W. Williams:
Sufficient Testing In A Self-Testing Environment. ITC 1984: 167-173 - Robert Willoner:
The Importance of Fault Simulation. ITC 1984: 728-729 - Beau R. Wilson Jr., Eugene R. Hnatek:
Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). ITC 1984: 778-788 - David M. Wu, Charles E. Radke, C. C. Beh:
Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC 1984: 713-717 - Yervant Zorian, Vinod K. Agarwal:
Higher Certainty of Error Coverage by Output Data Modification. ITC 1984: 140-147 - Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. IEEE Computer Society 1984 [contents]