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Kozo Kinoshita , Kewal K. Saluja : Built-in Testing of Memory Using On-chip Compact Testing Scheme. ITC 1984 : 271-281 share record
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Graeme R. Kinsey : Information and Material Flow Within a Production Test Cell. ITC 1984 : 212-217 share record
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R. E. Kizis , G. C. Wickham : Multi-Port Test Data Supply System. ITC 1984 : 630-635 share record
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A. J. Kombol : Processing of Test Data between Design and Testing. ITC 1984 : 789-793 share record
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John Kuban , John Salick : Testability Features of the MC68020. ITC 1984 : 821-826 export record
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conf/itc/KuollenspergerKSWWW84 share record
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P. Köllensperger , A. Krupp , Mathias Sturm , R. Weyl , F. Widulla , Eckhard Wolfgang : Automated Electron Beam Testing of VLSI Circuits. ITC 1984 : 550-557 share record
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E. Kurzweil , L. Jambut : Access Time Evaluation of Fast Static MOS Memories. ITC 1984 : 263-270 share record
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Terence Lee : In-Circuit Analog Component Testing at High Frequencies. ITC 1984 : 455-461 share record
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S. Daniel Lee , Tom Middleton : Behavioral Simulation of VLSI Test System Aids Debugging and Analysis of Test Programs. ITC 1984 : 614-620 share record
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M. V. Limaye , K. Rajanikanth , H. S. Jamadagni : Disc Drive Testing Instrument. ITC 1984 : 506-512 share record
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Tonysheng Lin , Stephen Y. H. Su : Functional Test Generation of Digital LSI/VLSI Systems Using Machine Symbolic Execution Technique. ITC 1984 : 660-668 share record
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Yashwant K. Malaiya , Shoubao Yang : The Coverage Problem for Random Testing. ITC 1984 : 237-245 share record
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Sushil K. Malik , E. F. Chace : MOS Gate Oxide Quality Control and Reliability Assessment by Voltage Ramping. ITC 1984 : 384-389 share record
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Wojciech Maly , F. Joel Ferguson , John Paul Shen : Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells. ITC 1984 : 390-399 share record
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Kenneth D. Mandl : CMOS VLSI Challenges to Test. ITC 1984 : 642-648 share record
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Sridhar R. Manthani , Sudhakar M. Reddy : On CMOS Totally Self-Checking Circuits. ITC 1984 : 866-877 share record
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William H. McAnney , Paul H. Bardell , V. P. Gupta : Random Testing for Stuck-At Storage Cells in an Embedded Memory. ITC 1984 : 157-166 share record
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M. Melgara , M. Paolini , R. Roncella , S. Morpurgo : CVT-FERT : Automatic Generator of Analytical Faults at Register Transfer Level from Electrical and Topological Descriptions. ITC 1984 : 250-257 share record
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Robert Mullis : An Expert System for VLSI Tester Diagnostics. ITC 1984 : 196-199 share record
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Mark A. Myers : DeltaI vs. DeltaY : A Quantitative Analysis of the Trade-offs Between Higher Capital Investment and Higher Yield in PCB Testing. ITC 1984 : 8-19 share record
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Y. Nishimura , Mitsuhiro Hamada , Y. Hayasaka : A New Timing Calibration Method for High Speed Memory Test. ITC 1984 : 113-117 share record
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J. S. Pittman , William C. Bruce : Test Logic Economic Considerations in a Commercial VLSI Chip Environment. ITC 1984 : 31-39 share record
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F. Pool , J. Hop , J. P. L. Lagerberg , C. Da Costa : Testing a 317K bit High Speed Video Memory with a VSLI Test System. ITC 1984 : 294-301 share record
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Vin Ratford , Mike Gill : Software Verification Techniques. ITC 1984 : 621-626 share record
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Douglas W. Raymond : In-Circuit Testability Factors: Shoot With a Rifle. ITC 1984 : 572-580 share record
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Gordon D. Robinson : Artificial Intelligence and Testing. ITC 1984 : 200-205 share record
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J. Paul Roth , Vojin G. Oklobdzija , John F. Beetem : Test Generation for FET Switching Circuits. ITC 1984 : 59-62 share record
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Eric Sacher : Component Level Fault-Isolation Techniques in a Systems Test Environment. ITC 1984 : 489-492 share record
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Tohru Sasaki , Shunichi Kato , Nobuyoshi Nomizu , Hidetoshi Tanaka : Logic Design Verification Using Automated Test Generation. ITC 1984 : 88-95 share record
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Tadaaki Satoh , Akira Takagi , Masami Kita , Katsuhiko Shirakawa , Shimpei Takeshita : 21-Bit Precision and High-Speed DC Measurement System. ITC 1984 : 123-133