- Arjan J. C. van Gemund, Gerard L. Reijns:
Errata to "Reliability Analysis of k -out-of- n Systems With Single Cold Standby Using Pearson Distributions" [Jun 12 526-532]. IEEE Trans. Reliab. 61(3): 832 (2012) - Alireza Ghasemi, Melinda R. Hodkiewicz:
Estimating Mean Residual Life for a Case Study of Rail Wagon Bearings. IEEE Trans. Reliab. 61(3): 719-730 (2012) - Rafael Gouriveau, Noureddine Zerhouni:
Connexionist-Systems-Based Long Term Prediction Approaches for Prognostics. IEEE Trans. Reliab. 61(4): 909-920 (2012) - Huairui Guo, Haitao Liao:
Methods of Reliability Demonstration Testing and Their Relationships. IEEE Trans. Reliab. 61(1): 231-237 (2012) - Ramesh C. Gupta:
Bivariate Equilibrium Distribution and Association Measure. IEEE Trans. Reliab. 61(4): 987-993 (2012) - Gilbert Haddad, Peter A. Sandborn, Michael G. Pecht:
An Options Approach for Decision Support of Systems With Prognostic Capabilities. IEEE Trans. Reliab. 61(4): 872-883 (2012) - H. Hirose, T. Sakumura:
The Extended Cumulative Exposure Model (ECEM) and Its Application to Oil Insulation Tests. IEEE Trans. Reliab. 61(3): 625-633 (2012) - Won-Sin Hong, Sun-Yuan Hsieh:
Strong Diagnosability and Conditional Diagnosability of Augmented Cubes Under the Comparison Diagnosis Model. IEEE Trans. Reliab. 61(1): 140-148 (2012) - Khac Tuan Huynh, Anne Barros, Christophe Bérenguer:
Maintenance Decision-Making for Systems Operating Under Indirect Condition Monitoring: Value of Online Information and Impact of Measurement Uncertainty. IEEE Trans. Reliab. 61(2): 410-425 (2012) - Walid Ibrahim, Valeriu Beiu, Azam Beg:
Optimum Reliability Sizing for Complementary Metal Oxide Semiconductor Gates. IEEE Trans. Reliab. 61(3): 675-686 (2012) - Lei Jiang, Qianmei Feng, David W. Coit:
Reliability and Maintenance Modeling for Dependent Competing Failure Processes With Shifting Failure Thresholds. IEEE Trans. Reliab. 61(4): 932-948 (2012) - Burak Kantarci, Hussein T. Mouftah:
Availability and Cost-Constrained Long-Reach Passive Optical Network Planning. IEEE Trans. Reliab. 61(1): 113-124 (2012) - P. K. Kapur, Hoang Pham, Anu G. Aggarwal, Gurjeet Kaur:
Two Dimensional Multi-Release Software Reliability Modeling and Optimal Release Planning. IEEE Trans. Reliab. 61(3): 758-768 (2012) - Way Kuo, Xiaoyan Zhu:
Some Recent Advances on Importance Measures in Reliability. IEEE Trans. Reliab. 61(2): 344-360 (2012) - Way Kuo, Xiaoyan Zhu:
Relations and Generalizations of Importance Measures in Reliability. IEEE Trans. Reliab. 61(3): 659-674 (2012) - Pao-Lien Lai:
A Systematic Algorithm for Identifying Faults on Hypercube-Like Networks Under the Comparison Model. IEEE Trans. Reliab. 61(2): 452-459 (2012) - Pradeep Lall, Prashant Gupta, Kai Goebel:
Decorrelated Feature Space and Neural Nets Based Framework for Failure Modes Clustering in Electronics Subjected to Mechanical Shock. IEEE Trans. Reliab. 61(4): 884-900 (2012) - Pradeep Lall, Ryan Lowe, Kai Goebel:
Extended Kalman Filter Models and Resistance Spectroscopy for Prognostication and Health Monitoring of Leadfree Electronics Under Vibration. IEEE Trans. Reliab. 61(4): 858-871 (2012) - Gregory Levitin, Liudong Xing, Suprasad V. Amari:
Recursive Algorithm for Reliability Evaluation of Non-Repairable Phased Mission Systems With Binary Elements. IEEE Trans. Reliab. 61(2): 533-542 (2012) - Xiaohu Li, Linxiong Li:
Security Analysis of Compromised-Neighbor-Tolerant Networks Using Stochastics. IEEE Trans. Reliab. 61(3): 749-757 (2012) - Yan-Fu Li, Enrico Zio, Yan-Hui Lin:
A Multistate Physics Model of Component Degradation Based on Stochastic Petri Nets and Simulation. IEEE Trans. Reliab. 61(4): 921-931 (2012) - Chien-Tai Lin, Cheng-Chieh Chou:
Statistical Inference for a Lognormal Step-Stress Model With Type-I Censoring. IEEE Trans. Reliab. 61(2): 361-377 (2012) - Yi-Kuei Lin, Ping-Chen Chang:
Evaluation of System Reliabilities for a Maintainable Stochastic-Flow Network. IEEE Trans. Reliab. 61(2): 398-409 (2012) - Yi-Kuei Lin, Ping-Chen Chang, Lance Fiondella:
Quantifying the Impact of Correlated Failures on Stochastic Flow Network Reliability. IEEE Trans. Reliab. 61(3): 692-701 (2012) - Baojun Liu, Li Cai:
Reliability Evaluation for Single Event Transients on Digital Circuits. IEEE Trans. Reliab. 61(3): 687-691 (2012) - Yu Liu, Hong-Zhong Huang, Xiaoling Zhang:
A Data-Driven Approach to Selecting Imperfect Maintenance Models. IEEE Trans. Reliab. 61(1): 101-112 (2012) - Xiaofei Lu, Maoyin Chen, Min Liu, Dong-Hua Zhou:
Exact Results on the Statistically Expected Total Cost and Optimal Solutions for Extended Periodic Imperfect Preventive Maintenance. IEEE Trans. Reliab. 61(2): 378-388 (2012) - Xiaofei Lu, Maoyin Chen, Min Liu, Dong-Hua Zhou:
Optimal Imperfect Periodic Preventive Maintenance for Systems in Time-Varying Environments. IEEE Trans. Reliab. 61(2): 426-439 (2012) - Rúbens de Souza Matos Júnior, Paulo Romero Martins Maciel, Fumio Machida, Dong Seong Kim, Kishor S. Trivedi:
Sensitivity Analysis of Server Virtualized System Availability. IEEE Trans. Reliab. 61(4): 994-1006 (2012) - Kamal Medjaher, Diego Alejandro Tobon-Mejia, Noureddine Zerhouni:
Remaining Useful Life Estimation of Critical Components With Application to Bearings. IEEE Trans. Reliab. 61(2): 292-302 (2012)