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Pradeep Lall
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2020 – today
- 2024
- [c8]Pradeep Lall, Ved Soni:
Cell Lifetime Degradation Model Development for Li-Ion Coin Cells considering Calendar Aging and Post-Knee Degradation (Invited). IRPS 2024: 5 - 2023
- [c7]Pradeep Lall, Ved Soni, Guneet Sethi, Kok Yiang:
Estimation of SOH Degradation of Coin Cells Subjected to Accelerated Life Cycling with Randomized Cycling Depths and C-Rates. IRPS 2023: 1-10
2010 – 2019
- 2018
- [c6]Pradeep Lall, Hao Zhang, Rahul Lall:
PHM of state-of-charge for flexible power sources in wearable electronics with EKF. IRPS 2018: 2-1 - [c5]Pradeep Lall, Kazi Mirza, David Locker:
Prognostics health management of electronic systems - A reliability physics approach. IRPS 2018: 6 - 2016
- [j10]Muhannad Mustafa, Jeffrey C. Suhling, Pradeep Lall:
Experimental determination of fatigue behavior of lead free solder joints in microelectronic packaging subjected to isothermal aging. Microelectron. Reliab. 56: 136-147 (2016) - [j9]Pradeep Lall, Di Zhang, Vikas Yadav, David Locker:
High strain rate constitutive behavior of SAC105 and SAC305 leadfree solder during operation at high temperature. Microelectron. Reliab. 62: 4-17 (2016) - [c4]Pradeep Lall, Shantanu Deshpande
, Luu Nguyen:
ANN based RUL assessment for copper-aluminum wirebonds subjected to harsh environments. ICPHM 2016: 1-10 - [c3]Pradeep Lall, Hao Zhang:
Prognostication of remaining useful-life for flexible batteries in foldable wearable electronics. ICPHM 2016: 1-10 - 2015
- [j8]Pradeep Lall
, Peter Sakalaukus
, Lynn Davis
:
Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging. IEEE Access 3: 531-542 (2015) - [c2]Pradeep Lall, Kalyan Dornala, Junchao Wei, Ryan Lowe, Jason Foley:
Prognostication of solder-joint reliability of 0.4mm and 0.5mm pitch bgas subjected to mechanical shocks up to 10, 000G. ICPHM 2015: 1-14 - [c1]Pradeep Lall, Hao Zhang, Lynn Davis
:
Prognostication of LED remaining useful life and color stability in the presence of contamination. ICPHM 2015: 1-8 - 2012
- [j7]Pradeep Lall
, Ryan Lowe, Kai Goebel
:
Prognostics Health Management of Electronic Systems Under Mechanical Shock and Vibration Using Kalman Filter Models and Metrics. IEEE Trans. Ind. Electron. 59(11): 4301-4314 (2012) - [j6]Pradeep Lall
, Ryan Lowe, Kai Goebel
:
Extended Kalman Filter Models and Resistance Spectroscopy for Prognostication and Health Monitoring of Leadfree Electronics Under Vibration. IEEE Trans. Reliab. 61(4): 858-871 (2012) - [j5]Pradeep Lall
, Prashant Gupta, Kai Goebel
:
Decorrelated Feature Space and Neural Nets Based Framework for Failure Modes Clustering in Electronics Subjected to Mechanical Shock. IEEE Trans. Reliab. 61(4): 884-900 (2012) - 2011
- [j4]Robert Neal Dean, Pradeep Lall, Mathias Nowottnick, William R. Harrell:
Guest Editorial. IEEE Trans. Ind. Electron. 58(7): 2579-2581 (2011) - [j3]Pradeep Lall
, Chandan Bhat, Madhura Hande, Vikrant More, Rahul Vaidya, Kai Goebel
:
Prognostication of Residual Life and Latent Damage Assessment in Lead-Free Electronics Under Thermomechanical Loads. IEEE Trans. Ind. Electron. 58(7): 2605-2616 (2011)
2000 – 2009
- 2009
- [j2]Pradeep Lall, Madhura Hande, Chandan Bhat, Vikrant More, Rahul Vaidya:
Prognostication of system-state in lead-free electronics equipment under cyclic and steady-state thermo-mechanical loads. Microelectron. Reliab. 49(8): 825-838 (2009) - 2007
- [j1]Pradeep Lall, Madhura Hande, Chandan Bhat, Nokibul Islam, Jeff Suhling, Jay Lee
:
Feature extraction and damage-precursors for prognostication of lead-free electronics. Microelectron. Reliab. 47(12): 1907-1920 (2007)
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