- Alberto Martin-Lopez, Andrea Arcuri, Sergio Segura, Antonio Ruiz-Cortés:
Black-Box and White-Box Test Case Generation for RESTful APIs: Enemies or Allies? ISSRE 2021: 231-241 - Amirfarhad Nilizadeh, Marlon Calvo, Gary T. Leavens, Xuan-Bach Dinh Le:
More Reliable Test Suites for Dynamic APR by using Counterexamples. ISSRE 2021: 208-219 - Vesna Nowack, David Bowes, Steve Counsell, Tracy Hall, Saemundur Haraldsson, Emily Winter, John R. Woodward:
Expanding Fix Patterns to Enable Automatic Program Repair. ISSRE 2021: 12-23 - Eduard Pinconschi, Rui Abreu, Pedro Adão:
A Comparative Study of Automatic Program Repair Techniques for Security Vulnerabilities. ISSRE 2021: 196-207 - Zhengyi Qiu, Shudi Shao, Qi Zhao, Guoliang Jin:
A Characteristic Study of Deadlocks in Database-Backed Web Applications. ISSRE 2021: 510-521 - Allison Sullivan:
HawkEye: User-Guided Enumeration of Scenarios. ISSRE 2021: 569-578 - Xiaoyu Sun, Xiao Chen, Kui Liu, Sheng Wen, Li Li, John Grundy:
Characterizing Sensor Leaks in Android Apps. ISSRE 2021: 498-509 - Weijing Wang, Junjie Chen, Lin Yang, Hongyu Zhang, Pu Zhao, Bo Qiao, Yu Kang, Qingwei Lin, Saravanakumar Rajmohan, Feng Gao, Zhangwei Xu, Yingnong Dang, Dongmei Zhang:
How Long Will it Take to Mitigate this Incident for Online Service Systems? ISSRE 2021: 36-46 - Hongjun Wu, Zhuo Zhang, Shangwen Wang, Yan Lei, Bo Lin, Yihao Qin, Haoyu Zhang, Xiaoguang Mao:
Peculiar: Smart Contract Vulnerability Detection Based on Crucial Data Flow Graph and Pre-training Techniques. ISSRE 2021: 378-389 - Dangwei Wu, Beijun Shen, Yuting Chen, He Jiang, Lei Qiao:
Tensfa: Detecting and Repairing Tensor Shape Faults in Deep Learning Systems. ISSRE 2021: 11-21 - Canhua Wu, Nengwen Zhao, Lixin Wang, Xiaoqin Yang, Shining Li, Ming Zhang, Xing Jin, Xidao Wen, Xiaohui Nie, Wenchi Zhang, Kaixin Sui, Dan Pei:
Identifying Root-Cause Metrics for Incident Diagnosis in Online Service Systems. ISSRE 2021: 91-102 - Guanping Xiao, Jun Liu, Zheng Zheng, Yulei Sui:
Nondeterministic Impact of CPU Multithreading on Training Deep Learning Systems. ISSRE 2021: 557-568 - Luyao Ye, Erqing Li, Dongdong Zhao, Shengwu Xiong, Siwei Zhou, Jianwen Xiang:
An Efficient Approximation for Quantitative Analysis of Dynamic Fault Trees. ISSRE 2021: 242-252 - Cheng Zeng, Chun Ying Zhou, Shengkai Lv, Peng He, Jie Huang:
GCN2defect : Graph Convolutional Networks for SMOTETomek-based Software Defect Prediction. ISSRE 2021: 69-79 - Shaokun Zhang, Yuanchun Li, Weixiang Yan, Yao Guo, Xiangqun Chen:
Dependency-aware Form Understanding. ISSRE 2021: 139-149 - Zhen Zhang, Peng Wu, Yuhang Chen, Jing Su:
Out-of-Distribution Detection through Relative Activation-Deactivation Abstractions. ISSRE 2021: 150-161 - Shize Zhang, Yunfeng Zhao, Jianyuan Lu, Biao Lyu, Shunmin Zhu, Zhiliang Wang, Jiahai Yang, Lin He, Jianping Wu:
CloudPin: A Root Cause Localization Framework of Shared Bandwidth Package Traffic Anomalies in Public Cloud Networks. ISSRE 2021: 367-377 - Shenglin Zhang, Chenyu Zhao, Yicheng Sui, Ya Su, Yongqian Sun, Yuzhi Zhang, Dan Pei, Yizhe Wang:
Robust KPI Anomaly Detection for Large-Scale Software Services with Partial Labels. ISSRE 2021: 103-114 - Hengyu Zhao, Siva Kumar Sastry Hari, Timothy Tsai, Michael B. Sullivan, Stephen W. Keckler, Jishen Zhao:
Suraksha: A Framework to Analyze the Safety Implications of Perception Design Choices in AVs. ISSRE 2021: 434-445 - Weining Zheng, Yuan Jiang, Xiaohong Su:
Vu1SPG: Vulnerability detection based on slice property graph representation learning. ISSRE 2021: 457-467 - Wei Zheng, Manqing Zhang, Hui Tang, Yuanfang Cai, Xiang Chen, Xiaoxue Wu, Abubakar Omari Abdallah Semasaba:
Automatically Identifying Bug Reports with Tactical Vulnerabilities by Deep Feature Learning. ISSRE 2021: 333-344 - Quanyi Zou, Lu Lu, Zhanyu Yang, Hao Xu:
Multi-source Cross Project Defect Prediction with Joint Wasserstein Distance and Ensemble Learning. ISSRE 2021: 57-68 - Zhi Jin, Xuandong Li, Jianwen Xiang, Leonardo Mariani, Ting Liu, Xiao Yu, Nahgmeh Ivaki:
32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021, Wuhan, China, October 25-28, 2021. IEEE 2021, ISBN 978-1-6654-2587-2 [contents]