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export results for "Gate Leakage Impact on Full Open Defects in Interconnect Lines"

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@article{DBLP:journals/tvlsi/ArumiMFEHK11,
  author       = {Daniel Arum{\'{\i}} and
                  Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and
                  Joan Figueras and
                  Stefan Eichenberger and
                  Camelia Hora and
                  Bram Kruseman},
  title        = {Gate Leakage Impact on Full Open Defects in Interconnect Lines},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {19},
  number       = {12},
  pages        = {2209--2220},
  year         = {2011},
  url          = {https://doi.org/10.1109/TVLSI.2010.2077315},
  doi          = {10.1109/TVLSI.2010.2077315},
  timestamp    = {Wed, 11 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/ArumiMFEHK11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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