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export results for "Gate Leakage Impact on Full Open Defects in Interconnect Lines"
@article{DBLP:journals/tvlsi/ArumiMFEHK11, author = {Daniel Arum{\'{\i}} and Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and Joan Figueras and Stefan Eichenberger and Camelia Hora and Bram Kruseman}, title = {Gate Leakage Impact on Full Open Defects in Interconnect Lines}, journal = {{IEEE} Trans. Very Large Scale Integr. Syst.}, volume = {19}, number = {12}, pages = {2209--2220}, year = {2011}, url = {https://doi.org/10.1109/TVLSI.2010.2077315}, doi = {10.1109/TVLSI.2010.2077315}, timestamp = {Wed, 11 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/tvlsi/ArumiMFEHK11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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