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@article{DBLP:journals/mj/OrtegaA24, author = {Carlos Alfredo Pelcastre Ortega and M{\'{o}}nico Linares Aranda}, title = {Hourglass transistor: An alternative and improved {MOS} structure robust to total ionization dose radiation}, journal = {Microelectron. J.}, volume = {152}, pages = {106391}, year = {2024}, url = {https://doi.org/10.1016/j.mejo.2024.106391}, doi = {10.1016/J.MEJO.2024.106391}, timestamp = {Fri, 20 Sep 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mj/OrtegaA24.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mj/Ma0GLHWGX23, author = {Wuying Ma and Xiaoping Ouyang and Hongxia Guo and Pei Li and Baoping He and Zujun Wang and Shilong Gou and Yuanyuan Xue}, title = {Impact of thermal baking before radiation on the total dose response of bipolar device}, journal = {Microelectron. J.}, volume = {135}, pages = {105764}, year = {2023}, url = {https://doi.org/10.1016/j.mejo.2023.105764}, doi = {10.1016/J.MEJO.2023.105764}, timestamp = {Sat, 03 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mj/Ma0GLHWGX23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iccel/BambaWW23, author = {Daisuke Bamba and Minoru Watanabe and Nobuya Watanabe}, title = {Total-Ionizing-Dose Tolerance Analysis of a Radiation-Hardened Image Sensor}, booktitle = {{IEEE} International Conference on Consumer Electronics, {ICCE} 2023, Las Vegas, NV, USA, January 6-8, 2023}, pages = {1--2}, year = {2023}, crossref = {DBLP:conf/iccel/2023}, url = {https://doi.org/10.1109/ICCE56470.2023.10043521}, doi = {10.1109/ICCE56470.2023.10043521}, timestamp = {Tue, 21 Feb 2023 18:13:47 +0100}, biburl = {https://dblp.org/rec/conf/iccel/BambaWW23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/hpec/SlaterTLM20, author = {Windy S. Slater and Nayana P. Tiwari and Tyler M. Lovelly and Jesse K. Mee}, title = {Total Ionizing Dose Radiation Testing of {NVIDIA} Jetson Nano GPUs}, booktitle = {2020 {IEEE} High Performance Extreme Computing Conference, {HPEC} 2020, Waltham, MA, USA, September 22-24, 2020}, pages = {1--3}, year = {2020}, crossref = {DBLP:conf/hpec/2020}, url = {https://doi.org/10.1109/HPEC43674.2020.9286222}, doi = {10.1109/HPEC43674.2020.9286222}, timestamp = {Thu, 14 Jan 2021 08:55:23 +0100}, biburl = {https://dblp.org/rec/conf/hpec/SlaterTLM20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mj/GeGXZZLJLLS19, author = {X. Ge and Wen Gao and Feng Xu and Chen Zhao and Yang Zhao and X. Li and D. Jiang and H. Liu and Y. Li and G. Sun}, title = {Total-ionization-dose characterization of a radiation-hardened mixed-signal microcontroller SoC in 180{\unicode{8239}}nm {CMOS} technology for nanosatellites}, journal = {Microelectron. J.}, volume = {87}, pages = {65--72}, year = {2019}, url = {https://doi.org/10.1016/j.mejo.2019.04.007}, doi = {10.1016/J.MEJO.2019.04.007}, timestamp = {Thu, 26 Jan 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mj/GeGXZZLJLLS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ieiceee/HuDZLZ18, author = {Zhiyuan Hu and Lihua Dai and Zhengxuan Zhang and Xiaoyun Li and Shichang Zou}, title = {Total dose radiation induced changes of the floating body effects in the partially depleted {SOI} {NMOS} with ultrathin gate oxide}, journal = {{IEICE} Electron. Express}, volume = {15}, number = {4}, pages = {20171236}, year = {2018}, url = {https://doi.org/10.1587/elex.15.20171236}, doi = {10.1587/ELEX.15.20171236}, timestamp = {Fri, 12 Feb 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/ieiceee/HuDZLZ18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LawalLLH18, author = {Olarewaju Mubashiru Lawal and Shuhuan Liu and Zhuoqi Li and Aqil Hussain}, title = {\({}^{\mbox{60}}\)Co gamma radiation total ionizing dose combined with conducted electromagnetic interference studies in BJTs}, journal = {Microelectron. Reliab.}, volume = {82}, pages = {159--164}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2018.01.020}, doi = {10.1016/J.MICROREL.2018.01.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LawalLLH18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ieiceee/HaoHLKSZZ17, author = {Minru Hao and Huiyong Hu and Chen{-}Guang Liao and Haiyan Kang and Han Su and Qian Zhang and Yingbo Zhao}, title = {Total ionizing dose radiation effect on the threshold voltage for the uniaxial strained Si nano {NMOSFET}}, journal = {{IEICE} Electron. Express}, volume = {14}, number = {11}, pages = {20170411}, year = {2017}, url = {https://doi.org/10.1587/elex.14.20170411}, doi = {10.1587/ELEX.14.20170411}, timestamp = {Fri, 12 Feb 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/ieiceee/HaoHLKSZZ17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HaoHLWKZ17, author = {Minru Hao and Huiyong Hu and Chen{-}Guang Liao and Bin Wang and Haiyan Kang and He{-}Ming Zhang}, title = {Influence of {\(\gamma\)}-ray total dose radiation effect on the hot carrier gate current of the uniaxial strained Si nano-scale {NMOSFET}}, journal = {Microelectron. Reliab.}, volume = {75}, pages = {69--76}, year = {2017}, url = {https://doi.org/10.1016/j.microrel.2017.06.018}, doi = {10.1016/J.MICROREL.2017.06.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HaoHLWKZ17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/js/WangHMYHLS16, author = {Zujun Wang and Baoping He and Wuying Ma and Zhibin Yao and Shaoyan Huang and Minbo Liu and Jiangkun Sheng}, title = {Evaluation of the Degradation on a {COTS} Linear {CCD} Induced by Total Ionizing Dose Radiation Damage}, journal = {J. Sensors}, volume = {2016}, pages = {9604042:1--9604042:6}, year = {2016}, url = {https://doi.org/10.1155/2016/9604042}, doi = {10.1155/2016/9604042}, timestamp = {Fri, 02 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/js/WangHMYHLS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/sensors/HsiehLJW16, author = {Wen{-}Ching Hsieh and Hao{-}Tien Daniel Lee and Fuh{-}Cheng Jong and Shich{-}Chuan Wu}, title = {Performance Improvement of Total Ionization Dose Radiation Sensor Devices Using Fluorine-Treated {MOHOS}}, journal = {Sensors}, volume = {16}, number = {4}, pages = {450}, year = {2016}, url = {https://doi.org/10.3390/s16040450}, doi = {10.3390/S16040450}, timestamp = {Wed, 14 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/sensors/HsiehLJW16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/apccas/ZhengW16, author = {Ran Zheng and Jia Wang}, title = {Dark current analysis of P-type and N-type pixels under total ionizing dose radiation effects}, booktitle = {2016 {IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2016, Jeju, South Korea, October 25-28, 2016}, pages = {499--501}, year = {2016}, crossref = {DBLP:conf/apccas/2016}, url = {https://doi.org/10.1109/APCCAS.2016.7804013}, doi = {10.1109/APCCAS.2016.7804013}, timestamp = {Wed, 16 Oct 2019 14:14:50 +0200}, biburl = {https://dblp.org/rec/conf/apccas/ZhengW16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mj/YangWDY14, author = {Xiao{-}liang Yang and Ying Wang and Bin Du and Cheng{-}Hao Yu}, title = {Total dose radiation effects of hybrid bulk/SOI {CMOS} active pixel with buried channel {SOI} source follower}, journal = {Microelectron. J.}, volume = {45}, number = {4}, pages = {477--481}, year = {2014}, url = {https://doi.org/10.1016/j.mejo.2014.02.021}, doi = {10.1016/J.MEJO.2014.02.021}, timestamp = {Thu, 21 Jan 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mj/YangWDY14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mwscas/ChangCSLJLK14, author = {Joseph S. Chang and Kwen{-}Siong Chong and Wei Shu and Tong Lin and Jize Jiang and Ne Kyaw Zwa Lwin and Yang Kang}, title = {Radiation-hardened library cell template and its total ionizing dose {(TID)} delay characterization in 65nm {CMOS} process}, booktitle = {{IEEE} 57th International Midwest Symposium on Circuits and Systems, {MWSCAS} 2014, College Station, TX, USA, August 3-6, 2014}, pages = {821--824}, year = {2014}, crossref = {DBLP:conf/mwscas/2014}, url = {https://doi.org/10.1109/MWSCAS.2014.6908541}, doi = {10.1109/MWSCAS.2014.6908541}, timestamp = {Mon, 27 Mar 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/mwscas/ChangCSLJLK14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/BenficaP0LLGGHC11, author = {Juliano Benfica and Let{\'{\i}}cia Maria Bolzani Poehls and Fabian Vargas and Jos{\'{e}} Lipovetzky and Ariel Lutenberg and Sebasti{\'{a}}n E. Garc{\'{\i}}a and Edmundo Gatti and Fernando Hernandez and Ney Laert Vilar Calazans}, title = {Configurable platform for {IC} combined tests of total-ionizing dose radiation and electromagnetic immunity}, booktitle = {12th Latin American Test Workshop, {LATW} 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011}, pages = {1--6}, year = {2011}, crossref = {DBLP:conf/latw/2011}, url = {https://doi.org/10.1109/LATW.2011.5985935}, doi = {10.1109/LATW.2011.5985935}, timestamp = {Sun, 06 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/BenficaP0LLGGHC11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/iccel/2023, title = {{IEEE} International Conference on Consumer Electronics, {ICCE} 2023, Las Vegas, NV, USA, January 6-8, 2023}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/ICCE56470.2023}, doi = {10.1109/ICCE56470.2023}, isbn = {978-1-6654-9130-3}, timestamp = {Wed, 09 Oct 2024 17:00:59 +0200}, biburl = {https://dblp.org/rec/conf/iccel/2023.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/hpec/2020, title = {2020 {IEEE} High Performance Extreme Computing Conference, {HPEC} 2020, Waltham, MA, USA, September 22-24, 2020}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/HPEC43674.2020}, doi = {10.1109/HPEC43674.2020}, isbn = {978-1-7281-9219-2}, timestamp = {Wed, 09 Oct 2024 17:00:59 +0200}, biburl = {https://dblp.org/rec/conf/hpec/2020.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/apccas/2016, title = {2016 {IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2016, Jeju, South Korea, October 25-28, 2016}, publisher = {{IEEE}}, year = {2016}, url = {https://ieeexplore.ieee.org/xpl/conhome/7786273/proceeding}, isbn = {978-1-5090-1570-2}, timestamp = {Wed, 09 Oct 2024 17:00:59 +0200}, biburl = {https://dblp.org/rec/conf/apccas/2016.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/mwscas/2014, title = {{IEEE} 57th International Midwest Symposium on Circuits and Systems, {MWSCAS} 2014, College Station, TX, USA, August 3-6, 2014}, publisher = {{IEEE}}, year = {2014}, url = {https://ieeexplore.ieee.org/xpl/conhome/6900043/proceeding}, isbn = {978-1-4799-4134-6}, timestamp = {Wed, 09 Oct 2024 17:00:59 +0200}, biburl = {https://dblp.org/rec/conf/mwscas/2014.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/latw/2011, title = {12th Latin American Test Workshop, {LATW} 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011}, publisher = {{IEEE}}, year = {2011}, url = {https://doi.org/10.1109/LATW19499.2011}, doi = {10.1109/LATW19499.2011}, isbn = {978-1-4577-1488-7}, timestamp = {Wed, 09 Oct 2024 17:00:59 +0200}, biburl = {https://dblp.org/rec/conf/latw/2011.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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