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@article{DBLP:journals/mj/Ma0GLHWGX23,
  author       = {Wuying Ma and
                  Xiaoping Ouyang and
                  Hongxia Guo and
                  Pei Li and
                  Baoping He and
                  Zujun Wang and
                  Shilong Gou and
                  Yuanyuan Xue},
  title        = {Impact of thermal baking before radiation on the total dose response
                  of bipolar device},
  journal      = {Microelectron. J.},
  volume       = {135},
  pages        = {105764},
  year         = {2023}
}

@inproceedings{DBLP:conf/iccel/BambaWW23,
  author       = {Daisuke Bamba and
                  Minoru Watanabe and
                  Nobuya Watanabe},
  title        = {Total-Ionizing-Dose Tolerance Analysis of a Radiation-Hardened Image
                  Sensor},
  booktitle    = {{ICCE}},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2023}
}

@inproceedings{DBLP:conf/hpec/SlaterTLM20,
  author       = {Windy S. Slater and
                  Nayana P. Tiwari and
                  Tyler M. Lovelly and
                  Jesse K. Mee},
  title        = {Total Ionizing Dose Radiation Testing of {NVIDIA} Jetson Nano GPUs},
  booktitle    = {{HPEC}},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2020}
}

@article{DBLP:journals/mj/GeGXZZLJLLS19,
  author       = {X. Ge and
                  Wen Gao and
                  Feng Xu and
                  Chen Zhao and
                  Yang Zhao and
                  X. Li and
                  D. Jiang and
                  H. Liu and
                  Y. Li and
                  G. Sun},
  title        = {Total-ionization-dose characterization of a radiation-hardened mixed-signal
                  microcontroller SoC in 180{\unicode{8239}}nm {CMOS} technology for
                  nanosatellites},
  journal      = {Microelectron. J.},
  volume       = {87},
  pages        = {65--72},
  year         = {2019}
}

@article{DBLP:journals/ieiceee/HuDZLZ18,
  author       = {Zhiyuan Hu and
                  Lihua Dai and
                  Zhengxuan Zhang and
                  Xiaoyun Li and
                  Shichang Zou},
  title        = {Total dose radiation induced changes of the floating body effects
                  in the partially depleted {SOI} {NMOS} with ultrathin gate oxide},
  journal      = {{IEICE} Electron. Express},
  volume       = {15},
  number       = {4},
  pages        = {20171236},
  year         = {2018}
}

@article{DBLP:journals/mr/LawalLLH18,
  author       = {Olarewaju Mubashiru Lawal and
                  Shuhuan Liu and
                  Zhuoqi Li and
                  Aqil Hussain},
  title        = {\({}^{\mbox{60}}\)Co gamma radiation total ionizing dose combined
                  with conducted electromagnetic interference studies in BJTs},
  journal      = {Microelectron. Reliab.},
  volume       = {82},
  pages        = {159--164},
  year         = {2018}
}

@article{DBLP:journals/ieiceee/HaoHLKSZZ17,
  author       = {Minru Hao and
                  Huiyong Hu and
                  Chen{-}Guang Liao and
                  Haiyan Kang and
                  Han Su and
                  Qian Zhang and
                  Yingbo Zhao},
  title        = {Total ionizing dose radiation effect on the threshold voltage for
                  the uniaxial strained Si nano {NMOSFET}},
  journal      = {{IEICE} Electron. Express},
  volume       = {14},
  number       = {11},
  pages        = {20170411},
  year         = {2017}
}

@article{DBLP:journals/mr/HaoHLWKZ17,
  author       = {Minru Hao and
                  Huiyong Hu and
                  Chen{-}Guang Liao and
                  Bin Wang and
                  Haiyan Kang and
                  He{-}Ming Zhang},
  title        = {Influence of {\(\gamma\)}-ray total dose radiation effect on the hot
                  carrier gate current of the uniaxial strained Si nano-scale {NMOSFET}},
  journal      = {Microelectron. Reliab.},
  volume       = {75},
  pages        = {69--76},
  year         = {2017}
}

@article{DBLP:journals/js/WangHMYHLS16,
  author       = {Zujun Wang and
                  Baoping He and
                  Wuying Ma and
                  Zhibin Yao and
                  Shaoyan Huang and
                  Minbo Liu and
                  Jiangkun Sheng},
  title        = {Evaluation of the Degradation on a {COTS} Linear {CCD} Induced by
                  Total Ionizing Dose Radiation Damage},
  journal      = {J. Sensors},
  volume       = {2016},
  pages        = {9604042:1--9604042:6},
  year         = {2016}
}

@article{DBLP:journals/sensors/HsiehLJW16,
  author       = {Wen{-}Ching Hsieh and
                  Hao{-}Tien Daniel Lee and
                  Fuh{-}Cheng Jong and
                  Shich{-}Chuan Wu},
  title        = {Performance Improvement of Total Ionization Dose Radiation Sensor
                  Devices Using Fluorine-Treated {MOHOS}},
  journal      = {Sensors},
  volume       = {16},
  number       = {4},
  pages        = {450},
  year         = {2016}
}

@inproceedings{DBLP:conf/apccas/ZhengW16,
  author       = {Ran Zheng and
                  Jia Wang},
  title        = {Dark current analysis of P-type and N-type pixels under total ionizing
                  dose radiation effects},
  booktitle    = {{APCCAS}},
  pages        = {499--501},
  publisher    = {{IEEE}},
  year         = {2016}
}

@article{DBLP:journals/mj/YangWDY14,
  author       = {Xiao{-}liang Yang and
                  Ying Wang and
                  Bin Du and
                  Cheng{-}Hao Yu},
  title        = {Total dose radiation effects of hybrid bulk/SOI {CMOS} active pixel
                  with buried channel {SOI} source follower},
  journal      = {Microelectron. J.},
  volume       = {45},
  number       = {4},
  pages        = {477--481},
  year         = {2014}
}

@inproceedings{DBLP:conf/mwscas/ChangCSLJLK14,
  author       = {Joseph S. Chang and
                  Kwen{-}Siong Chong and
                  Wei Shu and
                  Tong Lin and
                  Jize Jiang and
                  Ne Kyaw Zwa Lwin and
                  Yang Kang},
  title        = {Radiation-hardened library cell template and its total ionizing dose
                  {(TID)} delay characterization in 65nm {CMOS} process},
  booktitle    = {{MWSCAS}},
  pages        = {821--824},
  publisher    = {{IEEE}},
  year         = {2014}
}

@inproceedings{DBLP:conf/latw/BenficaP0LLGGHC11,
  author       = {Juliano Benfica and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Fabian Vargas and
                  Jos{\'{e}} Lipovetzky and
                  Ariel Lutenberg and
                  Sebasti{\'{a}}n E. Garc{\'{\i}}a and
                  Edmundo Gatti and
                  Fernando Hernandez and
                  Ney Laert Vilar Calazans},
  title        = {Configurable platform for {IC} combined tests of total-ionizing dose
                  radiation and electromagnetic immunity},
  booktitle    = {{LATW}},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2011}
}