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@inproceedings{DBLP:conf/vts/Bahai17,
  author       = {Ahmad Bahai},
  title        = {Keynote address: Opening keynote},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928915},
  doi          = {10.1109/VTS.2017.7928915},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/Bahai17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/BhaskaranCSVNA17,
  author       = {Bonita Bhaskaran and
                  Sailendra Chadalavada and
                  Shantanu Sarangi and
                  Nithin Valentine and
                  Venkat Abilash Reddy Nerallapally and
                  Ayub Abdollahian},
  title        = {At-speed capture global noise reduction {\&} low-power memory
                  test architecture},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928936},
  doi          = {10.1109/VTS.2017.7928936},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/BhaskaranCSVNA17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/BurchardERS017,
  author       = {Jan Burchard and
                  Dominik Erb and
                  Sudhakar M. Reddy and
                  Adit D. Singh and
                  Bernd Becker},
  title        = {Efficient SAT-based generation of hazard-activated {TSOF} tests},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928943},
  doi          = {10.1109/VTS.2017.7928943},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/BurchardERS017.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/ChagantiXC17,
  author       = {Shravan K. Chaganti and
                  Li Xu and
                  Degang Chen},
  title        = {A low-cost method for separation and accurate estimation of {ADC}
                  noise, aperture jitter, and clock jitter},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928950},
  doi          = {10.1109/VTS.2017.7928950},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ChagantiXC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/Chatzidimitriou17,
  author       = {Athanasios Chatzidimitriou and
                  Manolis Kaliorakis and
                  Sotiris Tselonis and
                  Dimitris Gizopoulos},
  title        = {Performance-aware reliability assessment of heterogeneous chips},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928940},
  doi          = {10.1109/VTS.2017.7928940},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/Chatzidimitriou17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/ChengLWGL017,
  author       = {Yun Cheng and
                  Huawei Li and
                  Ying Wang and
                  Yingke Gao and
                  Bo Liu and
                  Xiaowei Li},
  title        = {Flip-flop clustering based trace signal selection for post-silicon
                  debug},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928929},
  doi          = {10.1109/VTS.2017.7928929},
  timestamp    = {Thu, 11 May 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/ChengLWGL017.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/ChungC17,
  author       = {Kun Young Chung and
                  Stefano Di Carlo},
  title        = {Innovative practices session 9C {DFT} and data for diagnostics},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928954},
  doi          = {10.1109/VTS.2017.7928954},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ChungC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/DeshmukhKWH17,
  author       = {Jyotirmoy V. Deshmukh and
                  Wolfgang Kunz and
                  Hans{-}Joachim Wunderlich and
                  Sybille Hellebrand},
  title        = {Special session on early life failures},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928933},
  doi          = {10.1109/VTS.2017.7928933},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/DeshmukhKWH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/DibajAS17,
  author       = {Roya Dibaj and
                  Dhamin Al{-}Khalili and
                  Maitham Shams},
  title        = {Comprehensive investigation of gate oxide short in FinFETs},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928960},
  doi          = {10.1109/VTS.2017.7928960},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/DibajAS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/DuanC17,
  author       = {Yan Duan and
                  Degang Chen},
  title        = {Accurate jitter decomposition in high-speed links},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928918},
  doi          = {10.1109/VTS.2017.7928918},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/DuanC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/GentAH17,
  author       = {Kelson Gent and
                  Akash Agrawal and
                  Michael S. Hsiao},
  title        = {A framework for fast test generation at the {RTL}},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928942},
  doi          = {10.1109/VTS.2017.7928942},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/GentAH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/GotetiC17,
  author       = {Prashant Goteti and
                  Sreejit Chakravarty},
  title        = {Innovative practices session 6C {DFT} for functional safety},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928945},
  doi          = {10.1109/VTS.2017.7928945},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/GotetiC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/GuinZS17,
  author       = {Ujjwal Guin and
                  Ziqi Zhou and
                  Adit D. Singh},
  title        = {A novel design-for-security {(DFS)} architecture to prevent unauthorized
                  {IC} overproduction},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928946},
  doi          = {10.1109/VTS.2017.7928946},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/GuinZS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/GuptaAAN17,
  author       = {Sandeep Gupta and
                  Miron Abramovici and
                  Magdy Abadir and
                  Sridhar Narayanan},
  title        = {Keynote address tribute to Professor Mel Breuer: Contributions to
                  {CAD} and Test},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928916},
  doi          = {10.1109/VTS.2017.7928916},
  timestamp    = {Thu, 21 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/GuptaAAN17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/HatayamaI17,
  author       = {Kazumi Hatayama and
                  Masahiro Ishida},
  title        = {Innovative practices session 9B innovative practices in Asia-1: From
                  quality perspective},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928953},
  doi          = {10.1109/VTS.2017.7928953},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/HatayamaI17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/HatayamaI17a,
  author       = {Kazumi Hatayama and
                  Masahiro Ishida},
  title        = {Innovative practices session 10B innovative practices in Asia-2: From
                  cost perspective},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928957},
  doi          = {10.1109/VTS.2017.7928957},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/HatayamaI17a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/Huang17,
  author       = {Yu Huang},
  title        = {Innovative practices session 11C SoC testing},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928962},
  doi          = {10.1109/VTS.2017.7928962},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/Huang17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/HuangLWNCWLC17,
  author       = {Yu{-}Hao Huang and
                  Ching{-}Ho Lu and
                  Tse{-}Wei Wu and
                  Yu{-}Teng Nien and
                  Ying{-}Yen Chen and
                  Max Wu and
                  Jih{-}Nung Lee and
                  Mango C.{-}T. Chao},
  title        = {Methodology of generating dual-cell-aware tests},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928925},
  doi          = {10.1109/VTS.2017.7928925},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/HuangLWNCWLC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/IbrahimK17,
  author       = {Ahmed Ibrahim and
                  Hans G. Kerkhoff},
  title        = {Structured scan patterns retargeting for dynamic instruments access},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928955},
  doi          = {10.1109/VTS.2017.7928955},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/IbrahimK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/IslamK17,
  author       = {Md. Nazmul Islam and
                  Sandip Kundu},
  title        = {An analytical model for predicting the residual life of an {IC} and
                  design of residual-life meter},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928938},
  doi          = {10.1109/VTS.2017.7928938},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/IslamK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/KimM17,
  author       = {Dae{-}Hyun Kim and
                  Linda Milor},
  title        = {A methodology for estimating memory lifetime using a system-level
                  accelerated life test and error-correcting codes},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928935},
  doi          = {10.1109/VTS.2017.7928935},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/KimM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/KrishnankuttyRB17,
  author       = {Deepak Krishnankutty and
                  Ryan W. Robucci and
                  Nilanjan Banerjee and
                  Chintan Patel},
  title        = {Fiscal: Firmware identification using side-channel power analysis},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928948},
  doi          = {10.1109/VTS.2017.7928948},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/KrishnankuttyRB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/LeeWTC17,
  author       = {Kao{-}Chi Lee and
                  Kai{-}Chiang Wu and
                  Chih{-}Ying Tsai and
                  Mango Chia{-}Tso Chao},
  title        = {Fast {WAT} test structure for measuring Vt variance based on latch-based
                  comparators},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928928},
  doi          = {10.1109/VTS.2017.7928928},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/LeeWTC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/LiCPNC17,
  author       = {Zipeng Li and
                  Jonathon E. Colburn and
                  Vinod Pagalone and
                  Kaushik Narayanun and
                  Krishnendu Chakrabarty},
  title        = {Test-cost optimization in a scan-compression architecture using support-vector
                  regression},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928956},
  doi          = {10.1109/VTS.2017.7928956},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/LiCPNC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/LiL17,
  author       = {Huawei Li and
                  Xiaowei Li},
  title        = {Innovative practices session 10C formal verification practices in
                  industry},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928958},
  doi          = {10.1109/VTS.2017.7928958},
  timestamp    = {Thu, 11 May 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/LiL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/LiuKW17,
  author       = {Chang Liu and
                  Michael A. Kochte and
                  Hans{-}Joachim Wunderlich},
  title        = {Aging monitor reuse for small delay fault testing},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928921},
  doi          = {10.1109/VTS.2017.7928921},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/LiuKW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/LuVSAM17,
  author       = {Yichuan Lu and
                  Georgios Volanis and
                  Kiruba S. Subramani and
                  Angelos Antonopoulos and
                  Yiorgos Makris},
  title        = {Knob non-idealities in learning-based post-production tuning of analog/RF
                  ICs: Impact {\&} remedies},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928952},
  doi          = {10.1109/VTS.2017.7928952},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/LuVSAM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/MakrisRM17,
  author       = {Yiorgos Makris and
                  Srivaths Ravi and
                  Amit Majumdar},
  title        = {Foreword},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--2},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928910},
  doi          = {10.1109/VTS.2017.7928910},
  timestamp    = {Thu, 18 Apr 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/MakrisRM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/MomtazBC17,
  author       = {Md Imran Momtaz and
                  Suvadeep Banerjee and
                  Abhijit Chatterjee},
  title        = {On-line diagnosis and compensation for parametric failures in linear
                  state variable circuits and systems using time-domain checksum observers},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928961},
  doi          = {10.1109/VTS.2017.7928961},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/MomtazBC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/NatarajanS17,
  author       = {Suriya Natarajan and
                  Abhijit Sathaye},
  title        = {Innovative practices session 4C data analytics in test},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928934},
  doi          = {10.1109/VTS.2017.7928934},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/NatarajanS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/ParekhjiM17,
  author       = {Rubin A. Parekhji and
                  Srinivas Modekurty},
  title        = {Innovative practices session 2C: "How is industry simplifying analog
                  test"},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928927},
  doi          = {10.1109/VTS.2017.7928927},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ParekhjiM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/Pomeranz17,
  author       = {Irith Pomeranz},
  title        = {Fail data reduction for diagnosis of scan chain faults under transparent-scan},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928924},
  doi          = {10.1109/VTS.2017.7928924},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/Pomeranz17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/Pomeranz17a,
  author       = {Irith Pomeranz},
  title        = {Using piecewise-functional broadside tests for functional broadside
                  test compaction},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928944},
  doi          = {10.1109/VTS.2017.7928944},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/Pomeranz17a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/PradeepNP17,
  author       = {Wilson Pradeep and
                  Prakash Narayanan and
                  Rubin A. Parekhji},
  title        = {An optimised {SDD} {ATPG} and {SDQL} computation method across different
                  pattern sets},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928922},
  doi          = {10.1109/VTS.2017.7928922},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/PradeepNP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/RajendranSN17,
  author       = {Jeyavijayan (JV) Rajendran and
                  Peilin Song and
                  Suriya Natarajan},
  title        = {Innovative practices session 3C hardware security},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928931},
  doi          = {10.1109/VTS.2017.7928931},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/RajendranSN17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/Raychowdhury17,
  author       = {Arijit Raychowdhury},
  title        = {Innovative practices session 4A variation-tolerant design of circuits/systems},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928932},
  doi          = {10.1109/VTS.2017.7928932},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/Raychowdhury17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/RenaudMBM17,
  author       = {Guillaume Renaud and
                  Marc Margalef{-}Rovira and
                  Manuel J. Barrag{\'{a}}n and
                  Salvador Mir},
  title        = {Analysis of an efficient on-chip servo-loop technique for reduced-code
                  static linearity test of pipeline ADCs},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928951},
  doi          = {10.1109/VTS.2017.7928951},
  timestamp    = {Wed, 28 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/RenaudMBM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/Sarson17,
  author       = {Peter Sarson},
  title        = {Innovative practices session 7C automotive quality assurance},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928949},
  doi          = {10.1109/VTS.2017.7928949},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/Sarson17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/SarsonC17,
  author       = {Pete Sarson and
                  Stefano Di Carlo},
  title        = {Innovative practices session 5C automotive test solutions},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928941},
  doi          = {10.1109/VTS.2017.7928941},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/SarsonC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/SarsonSYK17,
  author       = {Peter Sarson and
                  Shohei Shibuya and
                  Tomonori Yanagida and
                  Haruo Kobayashi},
  title        = {A technique for dynamic range improvement of intermodulation distortion
                  products for an Interpolating DAC-based Arbitrary Waveform Generator
                  using a phase switching algorithm},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928917},
  doi          = {10.1109/VTS.2017.7928917},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/SarsonSYK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/SayedOBT17,
  author       = {Nour Sayed and
                  Fabian Oboril and
                  Rajendra Bishnoi and
                  Mehdi Baradaran Tahoori},
  title        = {Leveraging Systematic Unidirectional Error-Detecting Codes for fast
                  {STT-MRAM} cache},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928937},
  doi          = {10.1109/VTS.2017.7928937},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/SayedOBT17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/SiatkowskiWSW17,
  author       = {Sebastian Siatkowski and
                  Li{-}C. Wang and
                  Nik Sumikawa and
                  LeRoy Winemberg},
  title        = {Learning the process for correlation analysis},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928939},
  doi          = {10.1109/VTS.2017.7928939},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/SiatkowskiWSW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/SinhaC17,
  author       = {Arani Sinha and
                  Nitin Chaudhary},
  title        = {Innovative practices session 1C screening for layout sensitive defects},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928923},
  doi          = {10.1109/VTS.2017.7928923},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/SinhaC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/StratigopoulosS17,
  author       = {Haralampos{-}G. D. Stratigopoulos and
                  Christian Streitwieser},
  title        = {Adaptive test flow for mixed-signal ICs},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928919},
  doi          = {10.1109/VTS.2017.7928919},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/StratigopoulosS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/ThibeaultL17,
  author       = {Claude Thibeault and
                  Ali Louati},
  title        = {A new delay testing signal scheme robust to power distribution network
                  impedance variation},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928920},
  doi          = {10.1109/VTS.2017.7928920},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ThibeaultL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/XueB17,
  author       = {Cheng Xue and
                  R. D. (Shawn) Blanton},
  title        = {Test-set reordering for improving diagnosability},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928926},
  doi          = {10.1109/VTS.2017.7928926},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/XueB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/YanHYCL17,
  author       = {Aibin Yan and
                  Zhengfeng Huang and
                  Maoxiang Yi and
                  Jie Cui and
                  Huaguo Liang},
  title        = {{HLDTL:} High-performance, low-cost, and double node upset tolerant
                  latch design},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928930},
  doi          = {10.1109/VTS.2017.7928930},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/YanHYCL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/ZhangHWT17,
  author       = {Dongrong Zhang and
                  Miao Tony He and
                  Xiaoxiao Wang and
                  Mark M. Tehranipoor},
  title        = {Dynamically obfuscated scan for protecting IPs against scan-based
                  attacks throughout supply chain},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928947},
  doi          = {10.1109/VTS.2017.7928947},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ZhangHWT17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/ZuoG17,
  author       = {Xuan Zuo and
                  Sandeep K. Gupta},
  title        = {Asymmetric sizing: An effective design approach for {SRAM} cells against
                  {BTI} aging},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928959},
  doi          = {10.1109/VTS.2017.7928959},
  timestamp    = {Fri, 22 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/ZuoG17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/vts/2017,
  title        = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/7921795/proceeding},
  isbn         = {978-1-5090-4482-5},
  timestamp    = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/2017.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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