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@inproceedings{DBLP:conf/vts/AbrahamGK06,
author = {Jais Abraham and
Uday Goel and
Arun Kumar},
title = {Multi-Cycle Sensitizable Transition Delay Faults},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {306--313},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.49},
doi = {10.1109/VTS.2006.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AbrahamGK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AgrawalBG06,
author = {Vishwani D. Agrawal and
Soumitra Bose and
Vijay Gangaram},
title = {Upper Bounding Fault Coverage by Structural Analysis and Signal Monitoring},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {88--93},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.89},
doi = {10.1109/VTS.2006.89},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AgrawalBG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Appello06,
author = {Davide Appello},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {240--241},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.75},
doi = {10.1109/VTS.2006.75},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Appello06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AppelloTBGRR06,
author = {Davide Appello and
Vincenzo Tancorre and
Paolo Bernardi and
Michelangelo Grosso and
Maurizio Rebaudengo and
Matteo Sonza Reorda},
title = {On the Automation of the Test Flow of Complex SoCs},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {166--171},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.51},
doi = {10.1109/VTS.2006.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AppelloTBGRR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AshoueiBC06,
author = {Maryam Ashouei and
Soumendu Bhattacharya and
Abhijit Chatterjee},
title = {Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based
Probabilistic Error Correction},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {208--213},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.27},
doi = {10.1109/VTS.2006.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AshoueiBC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BalenCLR06,
author = {Tiago R. Balen and
Jos{\'{e}} Vicente Calvano and
Marcelo Lubaszewski and
Michel Renovell},
title = {Functional Test of Field Programmable Analog Arrays},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {326--333},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.37},
doi = {10.1109/VTS.2006.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BalenCLR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BernardiGRR06,
author = {Paolo Bernardi and
Michelangelo Grosso and
Maurizio Rebaudengo and
Matteo Sonza Reorda},
title = {A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {386--391},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.9},
doi = {10.1109/VTS.2006.9},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BernardiGRR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BotaRRS06,
author = {Sebasti{\`{a}} A. Bota and
M. Rosales and
Jos{\'{e}} Luis Rossell{\'{o}} and
Jaume Segura},
title = {Low V{\_}D{\_}D vs. Delay: Is it Really a Good Correlation Metric
for Nanometer ICs?},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {358--363},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.44},
doi = {10.1109/VTS.2006.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BotaRRS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BrownB06,
author = {Jason G. Brown and
R. D. (Shawn) Blanton},
title = {Exploiting Regularity for Inductive Fault Analysis},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {364--369},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.35},
doi = {10.1109/VTS.2006.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BrownB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Chandramouli06,
author = {R. Chandramouli},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {420--421},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.72},
doi = {10.1109/VTS.2006.72},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Chandramouli06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChenHO06,
author = {Mingjing Chen and
Hosam Haggag and
Alex Orailoglu},
title = {Decision Tree Based Mismatch Diagnosis in Analog Circuits},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {278--285},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.26},
doi = {10.1109/VTS.2006.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChenHO06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChmelarM06,
author = {Erik Chmelar and
Edward J. McCluskey},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {156--157},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.81},
doi = {10.1109/VTS.2006.81},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChmelarM06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChoP06,
author = {Minsik Cho and
David Z. Pan},
title = {{PEAKASO:} Peak-Temperature Aware Scan-Vector Optimization},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {52--57},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.56},
doi = {10.1109/VTS.2006.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChoP06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChungG06,
author = {Kun Young Chung and
Sandeep K. Gupta},
title = {Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time
Borrowing},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {8--15},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.45},
doi = {10.1109/VTS.2006.45},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ChungG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Courtois06,
author = {Bernard Courtois},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {150--151},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.76},
doi = {10.1109/VTS.2006.76},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Courtois06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DattaCNA06,
author = {Ramyanshu Datta and
Gary D. Carpenter and
Kevin J. Nowka and
Jacob A. Abraham},
title = {A Scheme for On-Chip Timing Characterization},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {24--29},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.11},
doi = {10.1109/VTS.2006.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DattaCNA06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DurbhaLW06,
author = {Sai Raghuram Durbha and
Amit Laknaur and
Haibo Wang},
title = {Investigating the Efficiency of Integrator-Based Capacitor Array Testing
Techniques},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {320--325},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.42},
doi = {10.1109/VTS.2006.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DurbhaLW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DuttaT06,
author = {Avijit Dutta and
Nur A. Touba},
title = {Iterative {OPDD} Based Signal Probability Calculation},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {72--77},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.43},
doi = {10.1109/VTS.2006.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DuttaT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FanMHKG06,
author = {Xinyue Fan and
Will R. Moore and
Camelia Hora and
Mario Konijnenburg and
Guido Gronthoud},
title = {A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {266--271},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.6},
doi = {10.1109/VTS.2006.6},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/FanMHKG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GalivancheG06,
author = {Rajesh Galivanche and
Bob Gottlieb},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {422--423},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.64},
doi = {10.1109/VTS.2006.64},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GalivancheG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GinezDCGLPV06,
author = {Olivier Ginez and
Jean Michel Daga and
Marylene Combe and
Patrick Girard and
Christian Landrault and
Serge Pravossoudovitch and
Arnaud Virazel},
title = {An Overview of Failure Mechanisms in Embedded Flash Memories},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {108--113},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.19},
doi = {10.1109/VTS.2006.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GinezDCGLPV06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GrecuPIS06,
author = {Cristian Grecu and
Partha Pratim Pande and
Andr{\'{e}} Ivanov and
Res Saleh},
title = {{BIST} for Network-on-Chip Interconnect Infrastructures},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {30--35},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.22},
doi = {10.1109/VTS.2006.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GrecuPIS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GuglielmoFMP06,
author = {Giuseppe Di Guglielmo and
Franco Fummi and
Cristina Marconcini and
Graziano Pravadelli},
title = {Improving Gate-Level {ATPG} by Traversing Concurrent EFSMs},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {172--179},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.39},
doi = {10.1109/VTS.2006.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GuglielmoFMP06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GuoMALSV06,
author = {Ruifeng Guo and
Subhasish Mitra and
M. Enamul Amyeen and
Jinkyu Lee and
Srihari Sivaraj and
Srikanth Venkataraman},
title = {Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and
Gate Exhaustive},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {66--71},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.34},
doi = {10.1109/VTS.2006.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GuoMALSV06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HarutunyanVZ06,
author = {Gurgen Harutunyan and
Valery A. Vardanian and
Yervant Zorian},
title = {Minimal March Test Algorithm for Detection of Linked Static Faults
in Random Access Memories},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {120--127},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.46},
doi = {10.1109/VTS.2006.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HarutunyanVZ06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Hatayama06,
author = {Kazumi Hatayama},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {200--201},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.69},
doi = {10.1109/VTS.2006.69},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Hatayama06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HsiaoCW06,
author = {Yu{-}Ying Hsiao and
Chao{-}Hsun Chen and
Cheng{-}Wen Wu},
title = {A Built-In Self-Repair Scheme for NOR-Type Flash Memory},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {114--119},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.5},
doi = {10.1109/VTS.2006.5},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/HsiaoCW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HsiehL06,
author = {Hsieh{-}Hung Hsieh and
Liang{-}Hung Lu},
title = {Integrated {CMOS} Power Sensors for {RF} {BIST} Applications},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {234--239},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.40},
doi = {10.1109/VTS.2006.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HsiehL06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HsiehLB06,
author = {Tong{-}Yu Hsieh and
Kuen{-}Jong Lee and
Melvin A. Breuer},
title = {An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {130--135},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.18},
doi = {10.1109/VTS.2006.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HsiehLB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Ivanov06,
author = {Andr{\'{e}} Ivanov},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {424--425},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.71},
doi = {10.1109/VTS.2006.71},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Ivanov06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Khoche06,
author = {Ajay Khoche},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {152--153},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.73},
doi = {10.1109/VTS.2006.73},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Khoche06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KhocheM06,
author = {Ajay Khoche and
Peter Muhmenthaler},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {288--289},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.77},
doi = {10.1109/VTS.2006.77},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KhocheM06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KhocheRO06,
author = {Ajay Khoche and
Mike Rodgers and
Pete O'Neil},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {426},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.62},
doi = {10.1109/VTS.2006.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KhocheRO06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KimT06,
author = {Kee Sup Kim and
Mohammad Tehranipoor},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {292--293},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.66},
doi = {10.1109/VTS.2006.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KimT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KuoH06,
author = {C.{-}Y. Kuo and
J.{-}L. Huang},
title = {A Period Tracking Based On-Chip Sinusoidal Jitter Extraction Technique},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {400--405},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.10},
doi = {10.1109/VTS.2006.10},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KuoH06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LeePR06,
author = {Hangkyu Lee and
Irith Pomeranz and
Sudhakar M. Reddy},
title = {A Test Generation Procedure for Avoiding the Detection of Functionally
Redundant Transition Faults},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {294--299},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.13},
doi = {10.1109/VTS.2006.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LeePR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LeeT06,
author = {Jinkyu Lee and
Nur A. Touba},
title = {Combining Linear and Non-Linear Test Vector Compression Using Correlation-Based
Rectangular Encoding},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {252--257},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.25},
doi = {10.1109/VTS.2006.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LeeT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LeeTP06,
author = {Jeremy Lee and
Mohammad Tehranipoor and
Jim Plusquellic},
title = {A Low-Cost Solution for Protecting IPs Against Scan-Based Side-Channel
Attacks},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {94--99},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.7},
doi = {10.1109/VTS.2006.7},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LeeTP06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiSL06,
author = {Huawei Li and
Pei{-}Fu Shen and
Xiaowei Li},
title = {Robust Test Generation for Precise Crosstalk-induced Path Delay Faults},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {300--305},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.60},
doi = {10.1109/VTS.2006.60},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/LiSL06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LinR06,
author = {Xijiang Lin and
Janusz Rajski},
title = {The Impacts of Untestable Defects on Transition Fault Testing},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {2--7},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.87},
doi = {10.1109/VTS.2006.87},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LinR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiuIP06,
author = {Chunsheng Liu and
Vikram Iyengar and
Dhiraj K. Pradhan},
title = {Thermal-Aware Testing of Network-on-Chip Using Multiple-Frequency
Clocking},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {46--51},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.88},
doi = {10.1109/VTS.2006.88},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiuIP06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiuNO06,
author = {Fang Liu and
Plamen K. Nikolov and
Sule Ozev},
title = {Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {272--277},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.54},
doi = {10.1109/VTS.2006.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiuNO06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NakamuraSF06,
author = {Yoshiyuki Nakamura and
Jacob Savir and
Hideo Fujiwara},
title = {{BIST} Pretest of ICs: Risks and Benefits},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {142--149},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.23},
doi = {10.1109/VTS.2006.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NakamuraSF06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NatarajanBC06,
author = {Vishwanath Natarajan and
Soumendu Bhattacharya and
Abhijit Chatterjee},
title = {Alternate Electrical Tests for Extracting Mechanical Parameters of
{MEMS} Accelerometer Sensors},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {192--199},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.16},
doi = {10.1109/VTS.2006.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NatarajanBC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NatarajanPC06,
author = {Suriyaprakash Natarajan and
Srinivas Patil and
Sreejit Chakravarty},
title = {Path Delay Fault Simulation on Large Industrial Designs},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {16--23},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.55},
doi = {10.1109/VTS.2006.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NatarajanPC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Nicolaidis06,
author = {Michael Nicolaidis},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {286--287},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.79},
doi = {10.1109/VTS.2006.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Nicolaidis06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Nigh06,
author = {Phil Nigh},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {44},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.74},
doi = {10.1109/VTS.2006.74},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Nigh06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Parekhji06,
author = {Rubin A. Parekhji},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {86--87},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.78},
doi = {10.1109/VTS.2006.78},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Parekhji06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Parvathala06,
author = {Praveen Parvathala},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {158--159},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.63},
doi = {10.1109/VTS.2006.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Parvathala06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PutmanG06,
author = {Richard Putman and
Rahul Gawde},
title = {Enhanced Timing-Based Transition Delay Testing for Small Delay Defects},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {336--342},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.33},
doi = {10.1109/VTS.2006.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PutmanG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RadT06,
author = {Reza M. Rad and
Mohammad Tehranipoor},
title = {{SCT:} An Approach For Testing and Configuring Nanoscale Devices},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {370--377},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.61},
doi = {10.1109/VTS.2006.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RadT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiR06,
author = {Wojciech Rajski and
Janusz Rajski},
title = {Modular Compactor of Test Responses},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {242--251},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.48},
doi = {10.1109/VTS.2006.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RajskiR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RaoOK06,
author = {Wenjing Rao and
Alex Orailoglu and
Ramesh Karri},
title = {Nanofabric Topologies and Reconfiguration Algorithms to Support Dynamically
Adaptive Fault Tolerance},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {214--221},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.50},
doi = {10.1109/VTS.2006.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RaoOK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RolindezMBC06,
author = {Lu{\'{\i}}s Rol{\'{\i}}ndez and
Salvador Mir and
Ahc{\`{e}}ne Bounceur and
Jean{-}Louis Carbon{\'{e}}ro},
title = {A {SNDR} {BIST} for Sigma-Delta Analogue-to-Digital Converters},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {314--319},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.12},
doi = {10.1109/VTS.2006.12},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RolindezMBC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SeshadriPVAR06,
author = {Bharath Seshadri and
Irith Pomeranz and
Srikanth Venkataraman and
M. Enamul Amyeen and
Sudhakar M. Reddy},
title = {Dominance Based Analysis for Large Volume Production Fail Diagnosis},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {392--399},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.29},
doi = {10.1109/VTS.2006.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SeshadriPVAR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SeshadriYV06,
author = {Bharath Seshadri and
Xiaoming Yu and
Srikanth Venkataraman},
title = {Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent
Equivalence Identification},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {380--385},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.14},
doi = {10.1109/VTS.2006.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SeshadriYV06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SharmaJM06,
author = {Ashutosh Sharma and
Anura P. Jayasumana and
Yashwant K. Malaiya},
title = {{X-IDDQ:} {A} Novel Defect Detection Technique Using {IDDQ} Data},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {180--185},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.90},
doi = {10.1109/VTS.2006.90},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SharmaJM06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ShinKA06,
author = {Hongjoong Shin and
Byoungho Kim and
Jacob A. Abraham},
title = {Spectral Prediction for Specification-Based Loopback Test of Embedded
Mixed-Signal Circuits},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {412--419},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.83},
doi = {10.1109/VTS.2006.83},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ShinKA06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SinghX06,
author = {Adit D. Singh and
Gefu Xu},
title = {Output Hazard-Free Transition Tests for Silicon Calibrated Scan Based
Delay Testing},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {349--357},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.53},
doi = {10.1109/VTS.2006.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SinghX06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SrinivasanCT06,
author = {Ganesh Srinivasan and
Abhijit Chatterjee and
Friedrich Taenzler},
title = {Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of
Modern Wireless Transceivers using Spectral Signatures},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {222--227},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.17},
doi = {10.1109/VTS.2006.17},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SrinivasanCT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/StewartT06,
author = {Khadija Jirari Stewart and
Spyros Tragoudas},
title = {Interconnect Testing for Networks on Chips},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {100--107},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.41},
doi = {10.1109/VTS.2006.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/StewartT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/StratigopoulosM06,
author = {Haralampos{-}G. D. Stratigopoulos and
Yiorgos Makris},
title = {Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal
Testing},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {406--411},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.24},
doi = {10.1109/VTS.2006.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/StratigopoulosM06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SutharD06,
author = {Vishal Suthar and
Shantanu Dutt},
title = {Mixed {PLB} and Interconnect {BIST} for FPGAs Without Fault-Free Assumptions},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {36--43},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.47},
doi = {10.1109/VTS.2006.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SutharD06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Topaloglu06,
author = {Rasit Onur Topaloglu},
title = {Early, Accurate and Fast Yield Estimation through Monte Carlo-Alternative
Probabilistic Behavioral Analog System Simulations},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {136--142},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.30},
doi = {10.1109/VTS.2006.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Topaloglu06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TranKC06,
author = {Eric N. Tran and
Vishwashanth Kasulasrinivas and
Sreejit Chakravarty},
title = {Silicon Evaluation of Logic Proximity Bridge Patterns},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {78--85},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.82},
doi = {10.1109/VTS.2006.82},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TranKC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Tschanz06,
author = {James W. Tschanz},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {378--379},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.70},
doi = {10.1109/VTS.2006.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Tschanz06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VenerisM06,
author = {Andreas G. Veneris and
Yiorgos Makris},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {290--291},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.80},
doi = {10.1109/VTS.2006.80},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/VenerisM06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VimjamH06,
author = {Vishnu C. Vimjam and
Michael S. Hsiao},
title = {Efficient Fault Collapsing via Generalized Dominance Relations},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {258--265},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.31},
doi = {10.1109/VTS.2006.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/VimjamH06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VorisekSTG06,
author = {Vlado Vorisek and
Bruce Swanson and
Kun{-}Han Tsai and
Dhiraj Goswami},
title = {Improved Handling of False and Multicycle Paths in {ATPG}},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {160--165},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.38},
doi = {10.1109/VTS.2006.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/VorisekSTG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WangS06,
author = {Qi Wang and
Mani Soma},
title = {{RF} Front-end System Gain and Linearity Built-in Test},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {228--233},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.59},
doi = {10.1109/VTS.2006.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WangS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WenKMSSWAK06,
author = {Xiaoqing Wen and
Seiji Kajihara and
Kohei Miyase and
Tatsuya Suzuki and
Kewal K. Saluja and
Laung{-}Terng Wang and
Khader S. Abdel{-}Hafez and
Kozo Kinoshita},
title = {A New {ATPG} Method for Efficient Capture Power Reduction During Scan
Testing},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {58--65},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.8},
doi = {10.1109/VTS.2006.8},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WenKMSSWAK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Wu06,
author = {Cheng{-}Wen Wu},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {128--129},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.68},
doi = {10.1109/VTS.2006.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Wu06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X06,
title = {Forward},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.36},
doi = {10.1109/VTS.2006.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X06a,
title = {Organizing Committee},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.52},
doi = {10.1109/VTS.2006.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X06a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X06b,
title = {Steering Committee},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.84},
doi = {10.1109/VTS.2006.84},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X06b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X06c,
title = {Program Committee},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.57},
doi = {10.1109/VTS.2006.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X06c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X06d,
title = {Reviewers},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.58},
doi = {10.1109/VTS.2006.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X06d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X06e,
title = {Acknowledgments},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.15},
doi = {10.1109/VTS.2006.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X06e.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X06f,
title = {Test Technology Technical Council {(TTTC)}},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.86},
doi = {10.1109/VTS.2006.86},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X06f.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X06g,
title = {Test Technology Educational Program {(TTEP)} Tutorials},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.85},
doi = {10.1109/VTS.2006.85},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X06g.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X06h,
title = {Awards},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.21},
doi = {10.1109/VTS.2006.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X06h.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZhangRPLR06,
author = {Zhuo Zhang and
Sudhakar M. Reddy and
Irith Pomeranz and
Xijiang Lin and
Janusz Rajski},
title = {Scan Tests with Multiple Fault Activation Cycles for Delay Faults},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {343--348},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.91},
doi = {10.1109/VTS.2006.91},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZhangRPLR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZhangZR06,
author = {Rong Zhang and
Zeljko Zilic and
Katarzyna Radecka},
title = {Energy Efficient Software-Based Self-Test for Wireless Sensor Network
Nodes},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {186--191},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.32},
doi = {10.1109/VTS.2006.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZhangZR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZhouCM06,
author = {Quming Zhou and
Mihir R. Choudhury and
Kartik Mohanram},
title = {Design Optimization for Robustness to Single Event Upsets},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {202--207},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.28},
doi = {10.1109/VTS.2006.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZhouCM06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZorianK06,
author = {Yervant Zorian and
Bruce C. Kim},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {334--335},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.65},
doi = {10.1109/VTS.2006.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZorianK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZorianW06,
author = {Yervant Zorian and
Dennis Wassung},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {154--155},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.67},
doi = {10.1109/VTS.2006.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZorianW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2006,
title = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://ieeexplore.ieee.org/xpl/conhome/10758/proceeding},
isbn = {0-7695-2514-8},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/2006.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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