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@inproceedings{DBLP:conf/itc/AbsherL89,
author = {Richard Absher and
J. E. (Ned) Lecky},
title = {Engineering Curricula for "Meeting the Tests of Time"},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {242--244},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82300},
doi = {10.1109/TEST.1989.82300},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbsherL89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgrawalACT89,
author = {Prathima Agrawal and
Vishwani D. Agrawal and
Kwang{-}Ting Cheng and
Raffi Tutundjian},
title = {Fault Simulation in a Pipelined Multiprocessor System},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {727--734},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82361},
doi = {10.1109/TEST.1989.82361},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgrawalACT89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AkersJ89,
author = {Sheldon B. Akers and
Winston Jansz},
title = {Test Set Embedding in a Built-In Self-Test Environment},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {257--263},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82306},
doi = {10.1109/TEST.1989.82306},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AkersJ89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AkiyamaNAKK89,
author = {Kohei Akiyama and
Hiroshi Nishimura and
Kyoji Anazawa and
Akito Kishida and
Nobuyuki Kasuga},
title = {High-Resolution Analog Measurement on Mixed-Signal {LSI} Tester},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {124--128},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82286},
doi = {10.1109/TEST.1989.82286},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AkiyamaNAKK89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Al-Arian89,
author = {Sami A. Al{-}Arian},
title = {Design and Test in the Universities},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {245--245},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82301},
doi = {10.1109/TEST.1989.82301},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Al-Arian89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Alcorn89,
author = {Barry A. Alcorn},
title = {Writing Correct and Usable Specifications for Board Test: {A} Case
Study},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {773--786},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82366},
doi = {10.1109/TEST.1989.82366},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Alcorn89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AllinghamBPV89,
author = {Don Allingham and
Pat Bashford and
Mike Peters and
Dean Vendl},
title = {DesignTestTM: {A} Solution to the Problems of {ASIC} Verification},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {893--902},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82380},
doi = {10.1109/TEST.1989.82380},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AllinghamBPV89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AnirudhanM89,
author = {P. N. Anirudhan and
Premachandran R. Menon},
title = {Symbolic Test Generation for Hierarchically Modeled Digital Systems},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {461--469},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82329},
doi = {10.1109/TEST.1989.82329},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AnirudhanM89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BallewS89,
author = {W. David Ballew and
Lauren M. Streb},
title = {Board-Level Boundary-Scan: Regaining Observability with an Additional
{IC}},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {182--189},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82293},
doi = {10.1109/TEST.1989.82293},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BallewS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bardell89,
author = {Paul H. Bardell},
title = {Calculating the Effects of Linear Dependencies in m-Sequences Used
as Test Stimuli},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {252--256},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82305},
doi = {10.1109/TEST.1989.82305},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bardell89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Barton89,
author = {Steve Barton},
title = {Characterization of High-Speed (Above 50 MHz) Devices Using Advance
ATE-Techniques, Results and Device Problems},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {860--868},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82376},
doi = {10.1109/TEST.1989.82376},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Barton89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BassettBDFGPPW89,
author = {Robert W. Bassett and
Barry J. Butkus and
Stephen L. Dingle and
Marc R. Faucher and
Pamela S. Gillis and
Jeannie H. Panner and
John G. Petrovick and
Donald L. Wheater},
title = {Low Cost Testing of High Density Logic Components},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {550--557},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82339},
doi = {10.1109/TEST.1989.82339},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BassettBDFGPPW89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BeenkerDSS89,
author = {Frans P. M. Beenker and
Rob Dekker and
Rudi Stans and
Max van der Star},
title = {A Testability Strategy for Silicon Compilers},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {660--669},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82353},
doi = {10.1109/TEST.1989.82353},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BeenkerDSS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ben-BassatBBCK89,
author = {Moshe Ben{-}Bassat and
Defna Ben{-}Arie and
Israel Beniaminy and
Jonathan Cheifetz and
Michael Klinger},
title = {A Proposed Benchmark Unit for Evaluating Electronic Troubleshooting
Expert Systems},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {78--86},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82280},
doi = {10.1109/TEST.1989.82280},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Ben-BassatBBCK89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BenkoskiS89,
author = {Jacques Benkoski and
Andrzej J. Strojwas},
title = {Computation of Delay Defect and Delay Fault Probabilities Using a
Statistical Timing Simulator},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {153--160},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82289},
doi = {10.1109/TEST.1989.82289},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BenkoskiS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BirchakH89,
author = {J. R. Birchak and
H. K. Haill},
title = {Coupling Coefficients for Signal Lines Separated by Ground Lines on
{PC} Boards},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {190--198},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82294},
doi = {10.1109/TEST.1989.82294},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BirchakH89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bouldin89,
author = {Donald W. Bouldin},
title = {The Push for Test in Universities},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {246--246},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82302},
doi = {10.1109/TEST.1989.82302},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bouldin89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrandI89,
author = {Daniel Brand and
Vijay S. Iyengar},
title = {Synthesis of Pseudo-Random Pattern Testable Designs},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {501--508},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82333},
doi = {10.1109/TEST.1989.82333},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrandI89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Branson89,
author = {Christopher W. Branson},
title = {A High Performance, 10-Volt Integrated Pin Electronics Driver},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {846--853},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82374},
doi = {10.1109/TEST.1989.82374},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Branson89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrglezKG89,
author = {Franc Brglez and
Gershon Kedem and
Clay Gloster},
title = {Hardware-Based Weighted Random Pattern Generation for Boundary Scan},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {264--274},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82307},
doi = {10.1109/TEST.1989.82307},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrglezKG89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bryson89,
author = {Stephen W. Bryson},
title = {Custom Pin Electronics for {VLSI} Automatic Test Equipment},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {854--859},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82375},
doi = {10.1109/TEST.1989.82375},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bryson89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CalhounB89,
author = {John D. Calhoun and
Franc Brglez},
title = {A Framework and Method for Hierarchical Test Generation},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {480--490},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82331},
doi = {10.1109/TEST.1989.82331},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CalhounB89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CamerikDJ89,
author = {F. Camerik and
P. A. J. Dirks and
Jochen A. G. Jess},
title = {Qualification and Quantification of Process-Induced Product-Related
Defects},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {643--652},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82351},
doi = {10.1109/TEST.1989.82351},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CamerikDJ89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Chakravarty89,
author = {Sreejit Chakravarty},
title = {A Testable Realization of {CMOS} Combinational Circuits},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {509--518},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82334},
doi = {10.1109/TEST.1989.82334},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Chakravarty89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChanW89,
author = {John C. Chan and
Baxter F. Womack},
title = {Diagnostics Based on Fault Signature},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {935},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82387},
doi = {10.1109/TEST.1989.82387},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChanW89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenM89,
author = {C. H. Chen and
Premachandran R. Menon},
title = {An Approach to Functional Level Testability Analysis},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {373--380},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82321},
doi = {10.1109/TEST.1989.82321},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenM89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Chin89,
author = {Kenneth R. Chin},
title = {Functional Testing of Circuits and {SMD} Boards with Limited Nodal
Access},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {129--143},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82287},
doi = {10.1109/TEST.1989.82287},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Chin89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChuangG89,
author = {C. C. Chuang and
Anup K. Gupta},
title = {The Analysis of Parallel {BIST} by the Combined Markov Chain {(CMC)}
Model},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {337--343},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82317},
doi = {10.1109/TEST.1989.82317},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChuangG89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DahburaUY89,
author = {Anton T. Dahbura and
M. {\"{U}}mit Uyar and
Chi W. Yau},
title = {An Optimal Test Sequence for the {JTAG/IEEE} {P1149.1} Test Access
Port Controller},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {55--62},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82277},
doi = {10.1109/TEST.1989.82277},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DahburaUY89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DettloffT89,
author = {Wayne D. Dettloff and
Melodie D. Tebbs},
title = {The Omnitest System: {A} No-Generate, No-Compile, Interactive Test
Methodology},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {572--576},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82342},
doi = {10.1109/TEST.1989.82342},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DettloffT89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Devadas89,
author = {Srinivas Devadas},
title = {Delay Test Generation for Synchronous Sequential Circuits},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {144--152},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82288},
doi = {10.1109/TEST.1989.82288},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Devadas89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DevadasMN89,
author = {Srinivas Devadas and
Hi{-}Keung Tony Ma and
A. Richard Newton},
title = {Redundancies and Don't Cares in Sequential Logic Synthesis},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {491--500},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82332},
doi = {10.1109/TEST.1989.82332},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DevadasMN89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DislisDMLA89,
author = {Chryssa Dislis and
I. D. Dear and
J. R. Miles and
S. C. Lau and
Anthony P. Ambler},
title = {Cost Analysis of Test Method Environments},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {875--883},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82378},
doi = {10.1109/TEST.1989.82378},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DislisDMLA89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Downey89,
author = {Arthur E. Downey},
title = {"ATG" Test Generation Software},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {829--837},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82372},
doi = {10.1109/TEST.1989.82372},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Downey89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Duncan89,
author = {Samuel H. Duncan},
title = {A {BIST} Design Methodology Experiment},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {755--762},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82364},
doi = {10.1109/TEST.1989.82364},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Duncan89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ErnstSJ89,
author = {Rolf Ernst and
S. Sutarwala and
J.{-}Y. Jou},
title = {{TSG:} {A} Test System Generator for Debugging and Regression Test
of High-Level Behavioral Synthesis Tools},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {937},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82389},
doi = {10.1109/TEST.1989.82389},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ErnstSJ89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FavalliODR89,
author = {Michele Favalli and
Piero Olivo and
Maurizio Damiani and
Bruno Ricc{\`{o}}},
title = {{CMOS} Design for Improved {IC} Testability},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {934},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82386},
doi = {10.1109/TEST.1989.82386},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FavalliODR89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FranklinSK89,
author = {Manoj Franklin and
Kewal K. Saluja and
Kozo Kinoshita},
title = {Design of a {BIST} {RAM} with Row/Column Pattern Sensitive Fault Detection
Capability},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {327--336},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82316},
doi = {10.1109/TEST.1989.82316},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FranklinSK89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Grabel89,
author = {David Grabel},
title = {Data Verification: {A} Prerequisite for Heuristic Diagnostics},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {519--526},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82335},
doi = {10.1109/TEST.1989.82335},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Grabel89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HallSP89,
author = {D. J. Hall and
Anthony W. Sloman and
G. S. Plows},
title = {Rapid Data Acquisition for E-Beam Testing},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {928},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82385},
doi = {10.1109/TEST.1989.82385},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HallSP89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HallidayYC89,
author = {Andy Halliday and
Greg Young and
Alfred L. Crouch},
title = {Prototype Testing Simplified by Scannable Buffers and Latches},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {174--181},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82292},
doi = {10.1109/TEST.1989.82292},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HallidayYC89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hansen89,
author = {Peter Hansen},
title = {Testing Conventional Logic and Memory Clusters Using Boundary Scan
Devices as Virtual {ATE} Channels},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {166--173},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82291},
doi = {10.1109/TEST.1989.82291},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Hansen89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HarwoodM89,
author = {Wallace Harwood and
Mark McDermott},
title = {Testability Features of the {MC68332} Modular Microcontroller},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {615--623},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82349},
doi = {10.1109/TEST.1989.82349},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HarwoodM89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HassanARN89,
author = {Abu S. M. Hassan and
Vinod K. Agarwal and
Janusz Rajski and
Benoit Nadeau{-}Dostie},
title = {Testing of Glue Logic Interconnects Using Boundary Scan Architecture},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {700--711},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82358},
doi = {10.1109/TEST.1989.82358},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HassanARN89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HatayamaIHTKI89,
author = {Kazumi Hatayama and
Mitsuji Ikeda and
Terumine Hayashi and
Masahiro Takakura and
Kuniaki Kishida and
Shun Ishiyama},
title = {Enhanced Delay Test Generator for High-Speed Logic LSIs},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {161--165},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82290},
doi = {10.1109/TEST.1989.82290},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HatayamaIHTKI89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HaupertCL89,
author = {David Haupert and
Fu{-}Gin Chen and
David Lee},
title = {{VLSI} Package Reliability Risk Due to Accelerated Environmental Testing},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {938},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82390},
doi = {10.1109/TEST.1989.82390},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HaupertCL89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HellebrandW89,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {The Pseudo-Exhaustive Test of Sequential Circuits},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {19--27},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82273},
doi = {10.1109/TEST.1989.82273},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HellebrandW89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HnatekL89,
author = {Eugene R. Hnatek and
Billy R. Livesay},
title = {Quality Issues of High Pin Count Fine Pitch {VLSI} Packages},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {397--422},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82324},
doi = {10.1109/TEST.1989.82324},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HnatekL89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hsue89,
author = {Ching{-}Wen Hsue},
title = {Clock Signal Distribution Network for High-Speed Testers},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {199--207},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82295},
doi = {10.1109/TEST.1989.82295},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Hsue89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HudliS89,
author = {Raghu V. Hudli and
Sharad C. Seth},
title = {Testability Analysis of Synchronous Sequential Circuits Based on Structural
Data},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {364--372},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82320},
doi = {10.1109/TEST.1989.82320},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HudliS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IllmanC89,
author = {Richard Illman and
Stephen Clarke},
title = {Built-In Self-Test of the Macrolan Chip},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {735--744},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82362},
doi = {10.1109/TEST.1989.82362},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IllmanC89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Jacomet89,
author = {Marcel Jacomet},
title = {{FANTESTIC:} Towards a Powerful Fault Analysis and Test Pattern Generator
for Integrated Circuits},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {633--642},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82350},
doi = {10.1109/TEST.1989.82350},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Jacomet89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JarwalaY89,
author = {Najmi T. Jarwala and
Chi W. Yau},
title = {A New Framework for Analyzing Test Generation and Diagnosis Algorithms
for Wiring Interconnects},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {63--70},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82278},
doi = {10.1109/TEST.1989.82278},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JarwalaY89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JarwalaY89a,
author = {Najmi T. Jarwala and
Chi W. Yau},
title = {A Unified Theory for Designing Optimal Test Generation and Diagnosis
Algorithms for Board Interconnects},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {71--77},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82279},
doi = {10.1109/TEST.1989.82279},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JarwalaY89a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KaminskaS89,
author = {Bozena Kaminska and
Yvon Savaria},
title = {Design-for-Testability Using Test Design Yield and Decision Theory},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {884--892},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82379},
doi = {10.1109/TEST.1989.82379},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KaminskaS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KikuchiHMYT89,
author = {Shuji Kikuchi and
Yoshihiko Hayashi and
Takashi Matsumoto and
Ryozou Yoshino and
Ryuichi Takagi},
title = {A 250 MHz Shared-Resource {VLSI} Test System with High Pin Count and
Memory Test Capability},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {558--566},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82340},
doi = {10.1109/TEST.1989.82340},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KikuchiHMYT89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/King89,
author = {Phillip N. King},
title = {Flexible, High-Performance Pin Electronics Implementation},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {787--794},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82367},
doi = {10.1109/TEST.1989.82367},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/King89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KooRT89,
author = {Kenrick Koo and
Steve Ramseyer and
Al Tejeda},
title = {A Testing Methodology for New-Generation Specialty Memory Devices},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {452--460},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82328},
doi = {10.1109/TEST.1989.82328},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KooRT89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrausKHO89,
author = {Rainer Kraus and
Oskar Kowarik and
Kurt Hoffmann and
Dieter Oberle},
title = {Design for Test of Mbit DRAMs},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {316--321},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82314},
doi = {10.1109/TEST.1989.82314},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KrausKHO89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LaMayC89,
author = {John L. LaMay and
Dan C. Caldwell},
title = {A Telecommunications Line Interface Test System Architecture},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {216--221},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82297},
doi = {10.1109/TEST.1989.82297},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LaMayC89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Landis89,
author = {David L. Landis},
title = {A Self-Test System Architecture for Reconfigurable {WSI}},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {275--282},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82308},
doi = {10.1109/TEST.1989.82308},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Landis89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LangleyBC89,
author = {Frank J. Langley and
Ronald R. Boatright and
Laurence Crosby},
title = {Composite Electro-Optical Testing of Surface-Mount Device Boards-One
Manufacturer's Experience},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {686--691},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82356},
doi = {10.1109/TEST.1989.82356},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LangleyBC89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lanier89,
author = {Kenneth Lanier},
title = {Methods of Test Waveform Synthesis for High-Speed Data Communication
Devices},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {222--230},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82298},
doi = {10.1109/TEST.1989.82298},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lanier89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LanzoniOR89,
author = {Massimo Lanzoni and
Piero Olivo and
Bruno Ricc{\`{o}}},
title = {A Testing Technique to Characterize E2PROM's Aging and Endurance},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {391--396},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82323},
doi = {10.1109/TEST.1989.82323},
timestamp = {Wed, 03 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LanzoniOR89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Larrabee89,
author = {Tracy Larrabee},
title = {Efficient Generation of Test Patterns Using Boolean Difference},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {795--802},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82368},
doi = {10.1109/TEST.1989.82368},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Larrabee89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeenstraS89,
author = {Jens Leenstra and
Lambert Spaanenburg},
title = {On the Design and Test of Asynchronous Macros Embedded in Synchronous
Systems},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {838--845},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82373},
doi = {10.1109/TEST.1989.82373},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeenstraS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lesmeister89,
author = {Gary J. Lesmeister},
title = {The Linear Array Systolic Tester {(LAST)}},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {543--549},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82338},
doi = {10.1109/TEST.1989.82338},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lesmeister89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeveugleS89,
author = {R{\'{e}}gis Leveugle and
Gabriele Saucier},
title = {Optimized Synthesis of Dedicated Controllers with Concurrent Checking
Capabilities},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {355--363},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82319},
doi = {10.1109/TEST.1989.82319},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeveugleS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LevittA89,
author = {Marc E. Levitt and
Jacob A. Abraham},
title = {The Economics of Scan Design},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {869--874},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82377},
doi = {10.1109/TEST.1989.82377},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LevittA89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LuschS89,
author = {Robert F. Lusch and
Endre F. Sarkany},
title = {Techniques for Improved Testability in the {IBM} {ES/9370} System},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {290--294},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82310},
doi = {10.1109/TEST.1989.82310},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LuschS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MalekMP89,
author = {Miroslaw Malek and
Antoine N. Mourad and
Mihir Pandya},
title = {Topological Testing},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {103--110},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82283},
doi = {10.1109/TEST.1989.82283},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MalekMP89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MalyN89,
author = {Wojciech Maly and
Samir B. Naik},
title = {Process Monitoring Oriented {IC} Testing},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {527--532},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82336},
doi = {10.1109/TEST.1989.82336},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MalyN89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MalzfeldtMOK89,
author = {W. Malzfeldt and
W. Mohr and
H.{-}D. Oberle and
K. Kodalle},
title = {Fast Automatic Failbit Analysis for DRAMs},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {431--438},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82326},
doi = {10.1109/TEST.1989.82326},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MalzfeldtMOK89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mann89,
author = {William R. Mann},
title = {{R96MFX} Test Strategy},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {611--614},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82348},
doi = {10.1109/TEST.1989.82348},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Mann89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MatsudaATOF89,
author = {Yoshio Matsuda and
Kazutami Arimoto and
Masaki Tsukude and
Tsukasa Oishi and
Kazuyasu Fujishima},
title = {A New Array Architecture for Parallel Testing in {VLSI} Memories},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {322--326},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82315},
doi = {10.1109/TEST.1989.82315},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MatsudaATOF89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Max89,
author = {Solomon Max},
title = {Fast Accurate and Complete {ADC} Testing},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {111--117},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82284},
doi = {10.1109/TEST.1989.82284},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Max89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McKeonW89,
author = {Alice McKeon and
Antony Wakeling},
title = {Fault Diagnosis in Analogue Circuits Using {AI} Techniques},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {118--123},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82285},
doi = {10.1109/TEST.1989.82285},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McKeonW89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MidkiffK89,
author = {Scott F. Midkiff and
Wern{-}Yan Koe},
title = {Test Effectiveness Metrics and {CMOS} Faults},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {653--659},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82352},
doi = {10.1109/TEST.1989.82352},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MidkiffK89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MinR89,
author = {Hyoung B. Min and
William A. Rogers},
title = {Search Strategy Switching: An Alternative to Increased Backtracking},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {803--811},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82369},
doi = {10.1109/TEST.1989.82369},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MinR89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Morrin89,
author = {Thomas H. Morrin},
title = {Mixed-Mode Simulation for Time-Domain Fault Analysis},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {231--241},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82299},
doi = {10.1109/TEST.1989.82299},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Morrin89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NadeauP89,
author = {Norman Nadeau and
Sylvie Perreault},
title = {An Analysis of Tungsten Probes' Effect on Yield in a Production Wafer
Probe Environment},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {208--215},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82296},
doi = {10.1109/TEST.1989.82296},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NadeauP89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NozuyamaNI89,
author = {Yasuyuki Nozuyama and
Akira Nishimura and
Jun Iwamura},
title = {Implementation and Evaluation of Microinstruction-Controlled Self
Test Using a Masked Microinstruction Scheme},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {624--632},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82256},
doi = {10.1109/TEST.1989.82256},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NozuyamaNI89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OKeefe89,
author = {Sheila O'Keefe},
title = {Reconfigurable Resource Architecture Improves {VLSI} Tester Utilization},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {597--604},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82346},
doi = {10.1109/TEST.1989.82346},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OKeefe89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Oka89,
author = {David K. Oka},
title = {Transmission Line Simulation for Testing {ISDN} Devices},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {87--93},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82281},
doi = {10.1109/TEST.1989.82281},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Oka89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OlivioDR89,
author = {Piero Olivo and
Maurizio Damiani and
Bruno Ricc{\`{o}}},
title = {On the Design of Multiple-Input Shift-Registers for Signature Analysis
Testing},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {936},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82388},
doi = {10.1109/TEST.1989.82388},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OlivioDR89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pabst89,
author = {J. Stephen Pabst},
title = {Cost Impacts of Automatic Test Equipment Purchase Decisions},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {605--610},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82347},
doi = {10.1109/TEST.1989.82347},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pabst89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParadisS89,
author = {Eric Paradis and
David Stannard},
title = {{SASPL:} {A} Test Program Productivity Analysis Tool},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {577--584},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82343},
doi = {10.1109/TEST.1989.82343},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParadisS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PatilB89,
author = {Srinivas Patil and
Prithviraj Banerjee},
title = {Fault Partitioning Issues in an Integrated Parallel Test Generation/Fault
Simulation Environment},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {718--726},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82360},
doi = {10.1109/TEST.1989.82360},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PatilB89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Patterson89,
author = {J. Patterson},
title = {Improved System Design Through Proper Nesting of Test Levels},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {533--542},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82337},
doi = {10.1109/TEST.1989.82337},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Patterson89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PauletKS89,
author = {Michel Crastes de Paulet and
Margot Karam and
Gabriele Saucier},
title = {Testability Expertise and Test Planning from High-Level Specifications},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {692--699},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82357},
doi = {10.1109/TEST.1989.82357},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PauletKS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PyronS89,
author = {Carol Pyron and
Rex Sallade},
title = {{CAE} Functionality for Verification of Diagnostic Programs},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {94--102},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82282},
doi = {10.1109/TEST.1989.82282},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PyronS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RazdanAKGS89,
author = {Rahul Razdan and
M. Anwaruddin and
Predrag G. Kovijanic and
R. Ganesh and
H.{-}C. Shih},
title = {An Interactive Sequential Test Pattern Generation System},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {38--46},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82275},
doi = {10.1109/TEST.1989.82275},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RazdanAKGS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rose89,
author = {Kenneth Rose},
title = {Design Assurance in a University Setting},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {247--248},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82303},
doi = {10.1109/TEST.1989.82303},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Rose89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rosenfeld89,
author = {Eric Rosenfeld},
title = {Issues for Mixed-Signal CAD-Tester Interface},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {585--590},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82344},
doi = {10.1109/TEST.1989.82344},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Rosenfeld89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SakashitaHOTK89,
author = {Kazuhiro Sakashita and
Takeshi Hashizume and
Takashi Ohya and
Isao Takimoto and
Shuichi Kato},
title = {Cell-Based Test Design Method},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {909--916},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82382},
doi = {10.1109/TEST.1989.82382},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SakashitaHOTK89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SalterT89,
author = {Michael W. Salter and
Kemon P. Taschioglou},
title = {Mainstream {ATE:} To Reduce {LSI} and {VLSI} Test Cost},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {591--596},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82345},
doi = {10.1109/TEST.1989.82345},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SalterT89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SamadB89,
author = {Arif Samad and
Martin Bell},
title = {Automating {ASIC} Design-for-Testability: The {VLSI} Test Assistant},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {819--828},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82371},
doi = {10.1109/TEST.1989.82371},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SamadB89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Santella89,
author = {Ron Santella},
title = {The Role of Test in a "Continuous Improvement" Environment},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {304--308},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82312},
doi = {10.1109/TEST.1989.82312},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Santella89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SarfertMTS89,
author = {Thomas M. Sarfert and
Remo G. Markgraf and
Erwin Trischler and
Michael H. Schulz},
title = {Hierarchical Test Pattern Generation Based on High-Level Primitives},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {470--479},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82330},
doi = {10.1109/TEST.1989.82330},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SarfertMTS89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SavariaLK89,
author = {Yvon Savaria and
Bruno Lagu{\"{e}} and
Bozena Kaminska},
title = {A Pragmatic Approach to the Design of Self-Testing Circuits},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {745--754},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82363},
doi = {10.1109/TEST.1989.82363},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SavariaLK89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SavirMV89,
author = {Jacob Savir and
William H. McAnney and
Salvatore R. Vecchio},
title = {Testing for Coupled Cells in Random-Access Memories},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {439--451},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82327},
doi = {10.1109/TEST.1989.82327},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SavirMV89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchulzA89,
author = {Michael H. Schulz and
Elisabeth Auth},
title = {Essential: An Efficient Self-Learning Test Pattern Generation Algorithm
for Sequential Circuits},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {28--37},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82274},
doi = {10.1109/TEST.1989.82274},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SchulzA89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShenL89,
author = {Yinan N. Shen and
Fabrizio Lombardi},
title = {Location and Identification for Single and Multiple Faults in Testable
Redundant PLAs for Yield Enhancement},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {670--678},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82354},
doi = {10.1109/TEST.1989.82354},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShenL89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SodenTTH89,
author = {Jerry M. Soden and
R. Keith Treece and
Michael R. Taylor and
Charles F. Hawkins},
title = {{CMOS} {IC} Stuck-Open Fault Electrical Effects and Design Considerations},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {423--430},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82325},
doi = {10.1109/TEST.1989.82325},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SodenTTH89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Stepleton89,
author = {Jay M. Stepleton},
title = {A New System Architecture for a Combined In-Circuit/Functional Tester},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {763--772},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82365},
doi = {10.1109/TEST.1989.82365},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Stepleton89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StroudB89,
author = {Charles E. Stroud and
Ahmed E. Barbour},
title = {Design for Testability and Test Generation for Static Redundancy System
Level Fault-Tolerant Circuits},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {812--818},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82370},
doi = {10.1109/TEST.1989.82370},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StroudB89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Stuchlik89,
author = {Kenneth R. Stuchlik},
title = {{IC} Characteristic Matching for Optimal System Performance},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {309--315},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82313},
doi = {10.1109/TEST.1989.82313},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Stuchlik89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SwanTW89,
author = {George Swan and
Yatin Trivedi and
David J. Wharton},
title = {CrossCheck: {A} Practical Solution for {ASIC} Testability},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {903--908},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82381},
doi = {10.1109/TEST.1989.82381},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SwanTW89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TalbotR89,
author = {Christopher G. Talbot and
Suresh Rajan},
title = {A Logic Analyzer Tool That Cuts E-Beam Prober Acquisition Times},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {923},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82384},
doi = {10.1109/TEST.1989.82384},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TalbotR89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ThearlingA89,
author = {Kurt H. Thearling and
Jacob A. Abraham},
title = {An Easily Computed Functional Level Testability Measure},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {381--390},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82322},
doi = {10.1109/TEST.1989.82322},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ThearlingA89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TokunagaF89,
author = {Yasuo Tokunaga and
J{\"{u}}rgen Frosien},
title = {High Performance Electron Beam Tester for Voltage Measurement on Unpassivated
and Passivated Devices},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {917--922},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82383},
doi = {10.1109/TEST.1989.82383},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TokunagaF89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsubukuNSONK89,
author = {Yoichi Tsubuku and
Takao Nishida and
Hiroshi Shiga and
Ken Ohga and
Hirohisa Nishine and
Mamoru Kaneko},
title = {Main Frame Diagnosis Support System},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {283--289},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82309},
doi = {10.1109/TEST.1989.82309},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsubukuNSONK89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/UnderwoodF89,
author = {Bill Underwood and
Jack Ferguson},
title = {The Parallel-Test-Detect Fault Simulation Algorithm},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {712--717},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82359},
doi = {10.1109/TEST.1989.82359},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/UnderwoodF89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Vining89,
author = {Sue Vining},
title = {Tradeoff Decisions Made for {P11149.1} Controller Design},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {47--54},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82276},
doi = {10.1109/TEST.1989.82276},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Vining89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VittrupF89,
author = {Melisa N. Vittrup and
Glendon S. Frashure},
title = {A Fundamental Approach to {SPC} Implementation},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {249--251},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82304},
doi = {10.1109/TEST.1989.82304},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VittrupF89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangHM89,
author = {Xaiolin Wang and
Fredrick J. Hill and
Zhengkin Mi},
title = {A Sequential Circuit Fault Simulation by Surrogate Fault Propagation},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {9--18},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82272},
doi = {10.1109/TEST.1989.82272},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangHM89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Webster89,
author = {Bruce A. Webster},
title = {An Integrated Analog Test Simulation Environment},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {567--571},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82341},
doi = {10.1109/TEST.1989.82341},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Webster89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Westover89,
author = {James Westover},
title = {Practical Test Strategies for Users of 100 {PPM} ICs},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {295--303},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82311},
doi = {10.1109/TEST.1989.82311},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Westover89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wey89,
author = {Chin{-}Long Wey},
title = {Fault Location in Repairable Programmable Logic Arrays},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {679--685},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82355},
doi = {10.1109/TEST.1989.82355},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Wey89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XavierAIA89,
author = {Dhiren Xavier and
Robert C. Aitken and
Andr{\'{e}} Ivanov and
Vinod K. Agarwal},
title = {: Experiments on Aliasing in Signature Analysis Registers},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {344--354},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82318},
doi = {10.1109/TEST.1989.82318},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XavierAIA89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1989,
title = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://ieeexplore.ieee.org/xpl/conhome/834/proceeding},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/1989.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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