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@inproceedings{DBLP:conf/latw/AbdennadherAX18,
  author       = {Salem Abdennadher and
                  Michael Altmann and
                  Bin Xue},
  title        = {Challenges and emerging solutions in testing {HBM} {IO} {\&} systems},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349690},
  doi          = {10.1109/LATW.2018.8349690},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/AbdennadherAX18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/Aponte-MorenoMR18,
  author       = {Alexander Aponte{-}Moreno and
                  Alejandro Moncada and
                  Felipe Restrepo{-}Calle and
                  Cesar Augusto Pedraza},
  title        = {A review of approximate computing techniques towards fault mitigation
                  in {HW/SW} systems},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8347241},
  doi          = {10.1109/LATW.2018.8347241},
  timestamp    = {Mon, 13 Nov 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/Aponte-MorenoMR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/ArmelinNd18,
  author       = {F{\'{a}}bio B. Armelin and
                  L{\'{\i}}rida A. B. Naviner and
                  Roberto d'Amore},
  title        = {Using {FPGA} self-produced transients to emulate SETs for {SER} estimation},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349663},
  doi          = {10.1109/LATW.2018.8349663},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/ArmelinNd18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/ArmelinNd18a,
  author       = {F{\'{a}}bio B. Armelin and
                  Lirida A. B. Naviner and
                  Roberto d'Amore},
  title        = {Probability aware fault-injection approach for {SER} estimation},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349692},
  doi          = {10.1109/LATW.2018.8349692},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/ArmelinNd18a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/AzizaCRV18,
  author       = {Hassen Aziza and
                  Karine Couli{\'{e}} and
                  Wenceslas Rahajandraibe and
                  Remy Vauche},
  title        = {Using short-term fourier transform for particle detection and recognition
                  in a {CMOS} oscillator-based chain},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349684},
  doi          = {10.1109/LATW.2018.8349684},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/AzizaCRV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/BatistaMM18,
  author       = {Carlos L. G. Batista and
                  Eliane Martins and
                  Maria de F{\'{a}}tima Mattiello{-}Francisco},
  title        = {On the use of a failure emulator mechanism at nanosatellite subsystems
                  integration tests},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8347242},
  doi          = {10.1109/LATW.2018.8347242},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/BatistaMM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/BeckerVWMRH18,
  author       = {Thales E. Becker and
                  F{\'{a}}bio Fedrizzi Vidor and
                  Gilson I. Wirth and
                  Thorsten Meyers and
                  Julia Reker and
                  Ulrich Hilleringmann},
  title        = {Time domain electrical characterization in zinc oxide nanoparticle
                  thin-film transistors},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349695},
  doi          = {10.1109/LATW.2018.8349695},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/BeckerVWMRH18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/BenevenutiK18,
  author       = {Fabio Benevenuti and
                  Fernanda Lima Kastensmidt},
  title        = {Reliability evaluation on interfacing with {AXI} and {AXI-S} on Xilinx
                  Zynq-7000 AP-SoC},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8347233},
  doi          = {10.1109/LATW.2018.8347233},
  timestamp    = {Fri, 27 Apr 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/BenevenutiK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/BenitesK18,
  author       = {Luis Alberto Contreras Benites and
                  Fernanda Lima Kastensmidt},
  title        = {Automated design flow for applying Triple Modular Redundancy {(TMR)}
                  in complex digital circuits},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349668},
  doi          = {10.1109/LATW.2018.8349668},
  timestamp    = {Fri, 27 Apr 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/BenitesK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/CantoroFPR0R18,
  author       = {Riccardo Cantoro and
                  Andrea Firrincieli and
                  Davide Piumatti and
                  Marco Restifo and
                  Ernesto S{\'{a}}nchez and
                  Matteo Sonza Reorda},
  title        = {About on-line functionally untestable fault identification in microprocessor
                  cores for safety-critical applications},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349679},
  doi          = {10.1109/LATW.2018.8349679},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/CantoroFPR0R18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/CardosoB18,
  author       = {Paulo Vinicius Cardoso and
                  Patr{\'{\i}}cia Pitthan Barcelos},
  title        = {Validation of a dynamic checkpoint mechanism for Apache Hadoop with
                  failure scenarios},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8347240},
  doi          = {10.1109/LATW.2018.8347240},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/CardosoB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/CarvalhoSCN18,
  author       = {Dionisio de Carvalho and
                  Bruno Sanches and
                  M. De Carvalho and
                  Wilhelmus A. M. Van Noije},
  title        = {A flexible stand-alone FPGA-based {ATE} for {ASIC} manufacturing tests},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8347236},
  doi          = {10.1109/LATW.2018.8347236},
  timestamp    = {Wed, 07 Dec 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/CarvalhoSCN18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/EinsfeldtG18,
  author       = {Augusto Einsfeldt and
                  Renato C. Giacomini},
  title        = {Fault-tolerant architecture with full recovery under presence of {SEU}},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349670},
  doi          = {10.1109/LATW.2018.8349670},
  timestamp    = {Thu, 31 Oct 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/EinsfeldtG18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/EspositoAV18,
  author       = {Stefano Esposito and
                  Serhiy Avramenko and
                  Massimo Violante},
  title        = {{RTOS} for mixed criticality applications deployed on NoC-based {COTS}
                  MPSoC},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8347239},
  doi          = {10.1109/LATW.2018.8347239},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/EspositoAV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/EspositoSV18,
  author       = {Stefano Esposito and
                  Jacopo Sini and
                  Massimo Violante},
  title        = {Real-time validation of mixed-criticality applications},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349683},
  doi          = {10.1109/LATW.2018.8349683},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/EspositoSV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/FiebackTHR18,
  author       = {Moritz Fieback and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Marco Rovatti},
  title        = {Ionizing radiation modeling in {DRAM} transistors},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349678},
  doi          = {10.1109/LATW.2018.8349678},
  timestamp    = {Sat, 05 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/FiebackTHR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/Garcia-Espinosa18,
  author       = {Eduardo Garcia{-}Espinosa and
                  Omar Longoria{-}Gandara and
                  Enrique Gonzalez{-}Garcia and
                  Arturo Veloz{-}Guerrero},
  title        = {Post-silicon validation based on synthetic test patterns for early
                  detection of timing anomalies},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8347237},
  doi          = {10.1109/LATW.2018.8347237},
  timestamp    = {Sun, 25 Oct 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/Garcia-Espinosa18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/GomesSSMMCK18,
  author       = {Iuri Albandes Cunha Gomes and
                  Alejandro Serrano{-}Cases and
                  Antonio J. Sanchez{-}Clemente and
                  Mayler G. A. Martins and
                  Antonio Mart{\'{\i}}nez{-}{\'{A}}lvarez and
                  Sergio Cuenca{-}Asensi and
                  Fernanda Lima Kastensmidt},
  title        = {Improving approximate-TMR using multi-objective optimization genetic
                  algorithm},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349665},
  doi          = {10.1109/LATW.2018.8349665},
  timestamp    = {Fri, 27 Dec 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/GomesSSMMCK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/GomezGC18,
  author       = {Andres F. Gomez and
                  Roberto G{\'{o}}mez and
                  V{\'{\i}}ctor H. Champac},
  title        = {A metric-guided gate-sizing methodology for aging guardband reduction},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349677},
  doi          = {10.1109/LATW.2018.8349677},
  timestamp    = {Fri, 22 Jan 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/GomezGC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/KarelACGR18,
  author       = {Amit Karel and
                  Florence Aza{\"{\i}}s and
                  Mariane Comte and
                  Jean{-}Marc Galli{\`{e}}re and
                  Michel Renovell},
  title        = {Impact of process variations on the detectability of resistive short
                  defects: Comparative analysis between 28nm Bulk and {FDSOI} technologies},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349696},
  doi          = {10.1109/LATW.2018.8349696},
  timestamp    = {Fri, 19 Apr 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/KarelACGR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/KourfaliS18,
  author       = {Alexandra Kourfali and
                  Dirk Stroobandt},
  title        = {Superimposed in-circuit debugging for self-healing {FPGA} overlays},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349688},
  doi          = {10.1109/LATW.2018.8349688},
  timestamp    = {Wed, 25 Sep 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/KourfaliS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/KretlyMV18,
  author       = {Luiz Carlos Kretly and
                  Ricardo Maltione and
                  Marcelo Gradella Villalva},
  title        = {A novel method of impact and failure mechanism analysis of RF-based
                  fault injection: {A} frequency response analyzer, {FRA}},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349671},
  doi          = {10.1109/LATW.2018.8349671},
  timestamp    = {Fri, 27 Apr 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/KretlyMV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/LopesBKSR18,
  author       = {Israel C. Lopes and
                  Fabio Benevenuti and
                  Fernanda Lima Kastensmidt and
                  Altamiro Amadeu Susin and
                  Paolo Rech},
  title        = {Reliability analysis on case-study traffic sign convolutional neural
                  network on APSoC},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8347234},
  doi          = {10.1109/LATW.2018.8347234},
  timestamp    = {Mon, 16 Sep 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/LopesBKSR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/MacieiraB18,
  author       = {Rafael Melo Macieira and
                  Edna Barros},
  title        = {TDevCGen: {A} synthesis toolset of {HW/SW} communication protocol
                  monitors from high-level specifications},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349686},
  doi          = {10.1109/LATW.2018.8349686},
  timestamp    = {Fri, 27 Apr 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/MacieiraB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/Marcelli0SJIMMM18,
  author       = {Andrea Marcelli and
                  Ernesto S{\'{a}}nchez and
                  Giovanni Squillero and
                  Muhammad Usman Jamal and
                  Afnan Imtiaz and
                  Simone Machetti and
                  Filippo Mangani and
                  Paolo Monti and
                  Davide Pola and
                  Alessandro Salvato and
                  Michele Simili},
  title        = {Defeating hardware Trojan in microprocessor cores through software
                  obfuscation},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349680},
  doi          = {10.1109/LATW.2018.8349680},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/Marcelli0SJIMMM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/MedeirosBPCB18,
  author       = {G. Cardoso Medeiros and
                  E. Brum and
                  Leticia Bolzani Poehls and
                  Thiago Copetti and
                  Tiago R. Balen},
  title        = {Influence of temperature on dynamic fault behavior due to resistive
                  defects in FinFET-based SRAMs},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349697},
  doi          = {10.1109/LATW.2018.8349697},
  timestamp    = {Fri, 27 Apr 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/MedeirosBPCB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/MoraesWMDMSDCN18,
  author       = {Joao de Moraes and
                  Taisy Silva Weber and
                  Guilherme Muller and
                  Tiago Dall'Agnol and
                  Rafael Macedo and
                  Elaine P. L. Scartezzini and
                  Roque Eduardo Dapper and
                  S{\'{e}}rgio Luis Cechin and
                  Joao Netto},
  title        = {Architecture of an industrial analog input designed to meet safety
                  requirements},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349673},
  doi          = {10.1109/LATW.2018.8349673},
  timestamp    = {Tue, 25 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/MoraesWMDMSDCN18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/MuhlbauerSS18,
  author       = {Felix M{\"{u}}hlbauer and
                  Lukas Schr{\"{o}}der and
                  Mario Sch{\"{o}}lzel},
  title        = {A fault tolerant dynamically scheduled processor with partial permanent
                  fault handling},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349676},
  doi          = {10.1109/LATW.2018.8349676},
  timestamp    = {Mon, 26 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/MuhlbauerSS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/OliveiraGAG18,
  author       = {Juliano Oliveira and
                  Marcilei Aparecida Guazzelli and
                  Marco Antonio Assis and
                  Renato C. Giacomini},
  title        = {Single event effect: Simulations and analysis on 3N163 {PMOS} transistor},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349693},
  doi          = {10.1109/LATW.2018.8349693},
  timestamp    = {Mon, 26 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/OliveiraGAG18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/OliveiraSB18,
  author       = {Ingrid F. V. Oliveira and
                  Rafael B. Schvittz and
                  Paulo F. Butzen},
  title        = {Fault masking ratio analysis of majority voters topologies},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349664},
  doi          = {10.1109/LATW.2018.8349664},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/OliveiraSB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/PathroseAK18,
  author       = {Jerrin Pathrose and
                  Ghazanfar Ali and
                  Hans G. Kerkhoff},
  title        = {{IJTAG} compatible analogue embedded instruments for MPSoC life-time
                  prediction},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349691},
  doi          = {10.1109/LATW.2018.8349691},
  timestamp    = {Fri, 27 Apr 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/PathroseAK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/PereiraMZB18,
  author       = {Lucas M. V. Pereira and
                  Douglas R. Melo and
                  Cesar A. Zeferino and
                  Eduardo A. Bezerra},
  title        = {Analysis of {LEON3} systems integration for a Network-on-Chip},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349694},
  doi          = {10.1109/LATW.2018.8349694},
  timestamp    = {Fri, 13 Aug 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/PereiraMZB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/PetrashinTLVSD18,
  author       = {Pablo A. Petrashin and
                  Luis E. Toledo and
                  Walter J. Lancioni and
                  Carlos Vazquez and
                  Tinus Stander and
                  Fortunato C. Dualibe},
  title        = {Influence of passive oscillator component variation on {OBT} sensitivity
                  in OTAs},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349689},
  doi          = {10.1109/LATW.2018.8349689},
  timestamp    = {Fri, 30 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/PetrashinTLVSD18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/PintoMVP18,
  author       = {George Redivo Pinto and
                  Guilherme Cardoso Medeiros and
                  Fabian Vargas and
                  Leticia Bolzani Poehls},
  title        = {A hardware-based approach for {SEU} monitoring in SRAMs with weak
                  resistive defects},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349667},
  doi          = {10.1109/LATW.2018.8349667},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/PintoMVP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/Plasencia-Balabarca18,
  author       = {Frank Plasencia{-}Balabarca and
                  Edward Mitacc{-}Meza and
                  Mario Raffo{-}Jara and
                  Carlos Silva C{\'{a}}rdenas},
  title        = {Alternative functional verification methodology for low and medium
                  level designs (Applied to an {AES} encryption module)},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349672},
  doi          = {10.1109/LATW.2018.8349672},
  timestamp    = {Sat, 19 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/Plasencia-Balabarca18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/Rangel-PatinoRV18,
  author       = {Francisco E. Rangel{-}Patino and
                  Jos{\'{e}} Ernesto Rayas{-}S{\'{a}}nchez and
                  Edgar{-}Andrei Vega{-}Ochoa and
                  Nagib Hakim},
  title        = {Direct optimization of a {PCI} express link equalization in industrial
                  post-silicon validation},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8347238},
  doi          = {10.1109/LATW.2018.8347238},
  timestamp    = {Fri, 27 Apr 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/Rangel-PatinoRV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/RodriguesKPB18,
  author       = {Gennaro Severino Rodrigues and
                  Fernanda Lima Kastensmidt and
                  Vincent Pouget and
                  Alberto Bosio},
  title        = {Exploring the inherent fault tolerance of successive approximation
                  algorithms under laser fault injection},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349675},
  doi          = {10.1109/LATW.2018.8349675},
  timestamp    = {Fri, 27 Apr 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/RodriguesKPB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/Santosd18,
  author       = {Marcos Silveira Santos and
                  Roberto d'Amore},
  title        = {Error detection method for the {ARINC429} communication},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349687},
  doi          = {10.1109/LATW.2018.8349687},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/Santosd18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/SeveroCPMMV18,
  author       = {Renato Severo and
                  Celso Maciel da Costa and
                  Adriane Parraga and
                  Debora Motta and
                  Ivan M{\"{u}}ller and
                  Fabian Vargas},
  title        = {Design and test of the {RT-NKE} task scheduling algorithm for multicore
                  architectures},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349682},
  doi          = {10.1109/LATW.2018.8349682},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/SeveroCPMMV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/SilvaD18,
  author       = {Gabriel Natan P. Silva and
                  Ricardo O. Duarte},
  title        = {Towards evolvable hardware and genetic algorithm operators to fail
                  safe systems achievement},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349669},
  doi          = {10.1109/LATW.2018.8349669},
  timestamp    = {Fri, 27 Apr 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/SilvaD18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/SilveiraQZ18,
  author       = {Reinaldo Silveira and
                  Qadeer Qureshi and
                  Rodrigo Zeli},
  title        = {Flexible architecture of memory BISTs},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349666},
  doi          = {10.1109/LATW.2018.8349666},
  timestamp    = {Fri, 27 Apr 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/SilveiraQZ18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/TraiolaV0BB18,
  author       = {Marcello Traiola and
                  Arnaud Virazel and
                  Patrick Girard and
                  Mario Barbareschi and
                  Alberto Bosio},
  title        = {Testing approximate digital circuits: Challenges and opportunities},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349681},
  doi          = {10.1109/LATW.2018.8349681},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/TraiolaV0BB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/TravessiniVVB18,
  author       = {Rodrigo Travessini and
                  Paulo Ricardo Cechelero Villa and
                  Fabian Luis Vargas and
                  Eduardo Augusto Bezerra},
  title        = {Processor core profiling for {SEU} effect analysis},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8347235},
  doi          = {10.1109/LATW.2018.8347235},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/TravessiniVVB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/VillaTVB18,
  author       = {Paulo Ricardo Cechelero Villa and
                  Rodrigo Travessini and
                  Fabian Luis Vargas and
                  Eduardo Augusto Bezerra},
  title        = {Processor checkpoint recovery for transient faults in critical applications},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349674},
  doi          = {10.1109/LATW.2018.8349674},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/VillaTVB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/WangSGC18,
  author       = {Wendong Wang and
                  Adit D. Singh and
                  Ujjwal Guin and
                  Abhijit Chatterjee},
  title        = {Exploiting power supply ramp rate for calibrating cell strength in
                  {SRAM} PUFs},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349685},
  doi          = {10.1109/LATW.2018.8349685},
  timestamp    = {Fri, 27 Apr 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/WangSGC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/latw/2018,
  title        = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/8340944/proceeding},
  isbn         = {978-1-5386-1472-3},
  timestamp    = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/2018.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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