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@inproceedings{DBLP:conf/ats/Ang13,
author = {Chin Hai Ang},
title = {Single Test Clock with Programmable Clock Enable Constraints for Multi-clock
Domain SoC {ATPG} Testing},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {195--200},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.44},
doi = {10.1109/ATS.2013.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Ang13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaiHWCCLCL13,
author = {Bing{-}Chuan Bai and
Chun{-}Lung Hsu and
Ming{-}Hsueh Wu and
Chen{-}An Chen and
Yee{-}Wen Chen and
Kun{-}Lun Luo and
Liang{-}Chia Cheng and
James Chien{-}Mo Li},
title = {Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile {SRAM}},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {123--127},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.32},
doi = {10.1109/ATS.2013.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BaiHWCCLCL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BanerjeeCKC13,
author = {Suvadeep Banerjee and
Hyun Woo Choi and
David C. Keezer and
Abhijit Chatterjee},
title = {Enhanced Resolution Time-Domain Reflectometry for High Speed Channels:
Characterizing Spatial Discontinuities with Non-ideal Stimulus},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {277--282},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.58},
doi = {10.1109/ATS.2013.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BanerjeeCKC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaoTC13,
author = {Fang Bao and
Mohammad Tehranipoor and
Harry H. Chen},
title = {Worst-Case Critical-Path Delay Analysis Considering Power-Supply Noise},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {37--42},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.17},
doi = {10.1109/ATS.2013.17},
timestamp = {Mon, 17 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/BaoTC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaranowskiKW13,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Securing Access to Reconfigurable Scan Networks},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {295--300},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.61},
doi = {10.1109/ATS.2013.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BaranowskiKW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BernardiCRH13,
author = {Paolo Bernardi and
Lyl M. Ciganda and
Matteo Sonza Reorda and
Said Hamdioui},
title = {An Efficient Method for the Test of Embedded Memory Cores during the
Operational Phase},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {227--232},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.50},
doi = {10.1109/ATS.2013.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BernardiCRH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BhattaTHC13,
author = {Debesh Bhatta and
Nicholas Tzou and
Sen{-}Wen Hsiao and
Abhijit Chatterjee},
title = {Time Domain Reconstruction of Incoherently Undersampled Periodic Waveforms
Using Bandwidth Interleaving},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {283--288},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.59},
doi = {10.1109/ATS.2013.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BhattaTHC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChanNCLY13,
author = {Koay Soon Chan and
Nuzrul Fahmi Nordin and
Kim Chon Chan and
Terk Zyou Lok and
Chee Wai Yong},
title = {Multi-histogram {ADC} {BIST} System for {ADC} Linearity Testing},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {213--214},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.47},
doi = {10.1109/ATS.2013.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChanNCLY13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenCHWLBC13,
author = {Chen{-}An Chen and
Yee{-}Wen Chen and
Chun{-}Lung Hsu and
Ming{-}Hsueh Wu and
Kun{-}Lun Luo and
Bing{-}Chuan Bai and
Liang{-}Chia Cheng},
title = {Cost-Effective TAP-Controlled Serialized Compressed Scan Architecture
for 3D Stacked ICs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {107--108},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.29},
doi = {10.1109/ATS.2013.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenCHWLBC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenT13,
author = {Jifeng Chen and
Mohammad Tehranipoor},
title = {Critical Paths Selection and Test Cost Reduction Considering Process
Variations},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {259--264},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.55},
doi = {10.1109/ATS.2013.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengH0CZGG13,
author = {Da Cheng and
Hsunwei Hsiung and
Bin Liu and
Jianing Chen and
Jia Zeng and
Ramesh Govindan and
Sandeep K. Gupta},
title = {A New March Test for Process-Variation Induced Delay Faults in SRAMs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {115--122},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.31},
doi = {10.1109/ATS.2013.31},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChengH0CZGG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DuttaKC13,
author = {Arpita Dutta and
Subhadip Kundu and
Santanu Chattopadhyay},
title = {Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal
Variance during Testing},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {25--30},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.15},
doi = {10.1109/ATS.2013.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DuttaKC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Eggersglussv13,
author = {Stephan Eggersgl{\"{u}}{\ss}},
title = {Peak Capture Power Reduction for Compact Test Sets Using Opt-Justification-Fill},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {31--36},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.16},
doi = {10.1109/ATS.2013.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Eggersglussv13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ErbKSWB13,
author = {Dominik Erb and
Michael A. Kochte and
Matthias Sauer and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Accurate Multi-cycle {ATPG} in Presence of X-Values},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {245--250},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.53},
doi = {10.1109/ATS.2013.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ErbKSWB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FukazawaIII13,
author = {Yuki Fukazawa and
Tsuyoshi Iwagaki and
Hideyuki Ichihara and
Tomoo Inoue},
title = {A Transient Fault Tolerant Test Pattern Generator for On-line Built-in
Self-Test},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {85--90},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.24},
doi = {10.1109/ATS.2013.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FukazawaIII13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GentH13,
author = {Kelson Gent and
Michael S. Hsiao},
title = {Functional Test Generation at the {RTL} Using Swarm Intelligence and
Bounded Model Checking},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {233--238},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.51},
doi = {10.1109/ATS.2013.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GentH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HanS13,
author = {Chao Han and
Adit D. Singh},
title = {Hazard Initialized {LOC} Tests for {TDF} Undetectable {CMOS} Open
Defects},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {189--194},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.43},
doi = {10.1109/ATS.2013.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HanS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeKYL13,
author = {Masaki Hashizume and
Tomoaki Konishi and
Hiroyuki Yotsuyanagi and
Shyue{-}Kung Lu},
title = {Testable Design for Electrical Testing of Open Defects at Interconnects
in 3D ICs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {13--18},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.13},
doi = {10.1109/ATS.2013.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HashizumeKYL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HoLW13,
author = {Yingchieh Ho and
Katherine Shu{-}Min Li and
Sying{-}Jyan Wang},
title = {Leakage Monitoring Technique in Near-Threshold Systems with a Time-Based
Bootstrapped Ring Oscillator},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {91--96},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.25},
doi = {10.1109/ATS.2013.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HoLW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HouL13,
author = {Chih{-}Sheng Hou and
Jin{-}Fu Li},
title = {Testing Disturbance Faults in Various {NAND} Flash Memories},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {221--226},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.49},
doi = {10.1109/ATS.2013.49},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HouL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiaoWC13,
author = {Sen{-}Wen Hsiao and
Xian Wang and
Abhijit Chatterjee},
title = {Analog Sensor Based Testing of Phase-Locked Loop Dynamic Performance
Parameters},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {50--55},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.19},
doi = {10.1109/ATS.2013.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsiaoWC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiehPK13,
author = {Tong{-}Yu Hsieh and
Yi{-}Han Peng and
Chia{-}Chi Ku},
title = {An Efficient Test Methodology for Image Processing Applications Based
on Error-Tolerance},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {289--294},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.60},
doi = {10.1109/ATS.2013.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsiehPK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiungC0GG13,
author = {Hsunwei Hsiung and
Da Cheng and
Bin Liu and
Ramesh Govindan and
Sandeep K. Gupta},
title = {Interplay of Failure Rate, Performance, and Test Cost in {TCAM} under
Process Variations},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {251--258},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.54},
doi = {10.1109/ATS.2013.54},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HsiungC0GG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsuHHL13,
author = {Shuo{-}You Hsu and
Chih{-}Hsiang Hsu and
Ting{-}Shuo Hsu and
Jing{-}Jia Liou},
title = {A Region-Based Framework for Design Feature Identification of Systematic
Process Variations},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {265--270},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.56},
doi = {10.1109/ATS.2013.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsuHHL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangHTCS13,
author = {Li{-}Ren Huang and
Shi{-}Yu Huang and
Kun{-}Han Tsai and
Wu{-}Tung Cheng and
Stephen K. Sunter},
title = {Mid-bond Interposer Wire Test},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {153--158},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.37},
doi = {10.1109/ATS.2013.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangHTCS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JiangACARP13,
author = {Jie Jiang and
Marina Aparicio and
Mariane Comte and
Florence Aza{\"{\i}}s and
Michel Renovell and
Ilia Polian},
title = {{MIRID:} Mixed-Mode IR-Drop Induced Delay Simulator},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {177--182},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.41},
doi = {10.1109/ATS.2013.41},
timestamp = {Thu, 11 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/JiangACARP13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KangLCK13,
author = {Wooheon Kang and
Changwook Lee and
Keewon Cho and
Sungho Kang},
title = {A Die Selection and Matching Method with Two Stages for Yield Enhancement
of 3-D Memories},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {301--306},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.62},
doi = {10.1109/ATS.2013.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KangLCK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KatohDIKLT13,
author = {Kentaroh Katoh and
Yuta Doi and
Satoshi Ito and
Haruo Kobayashi and
Ensi Li and
Nobukazu Takai},
title = {An Analysis of Stochastic Self-Calibration of {TDC} Using Two Ring
Oscillators},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {140--146},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.35},
doi = {10.1109/ATS.2013.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KatohDIKLT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KumarRRR13,
author = {Amit Kumar and
Janusz Rajski and
Sudhakar M. Reddy and
Thomas Rinderknecht},
title = {On the Generation of Compact Deterministic Test Sets for {BIST} Ready
Designs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {201--206},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.45},
doi = {10.1109/ATS.2013.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KumarRRR13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeeA13,
author = {Hsun{-}Cheng Lee and
Jacob A. Abraham},
title = {Digital Calibration for 8-Bit Delay Line {ADC} Using Harmonic Distortion
Correction},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {128--133},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.33},
doi = {10.1109/ATS.2013.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LeeA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiHGWHHCL13,
author = {Katherine Shu{-}Min Li and
Cheng{-}You Ho and
Ruei{-}Ting Gu and
Sying{-}Jyan Wang and
Yingchieh Ho and
Jiun{-}Jie Huang and
Bo{-}Chuan Cheng and
An{-}Ting Liu},
title = {A Layout-Aware Test Methodology for Silicon Interposer in System-in-a-Package},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {159--164},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.38},
doi = {10.1109/ATS.2013.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiHGWHHCL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiQZLY13,
author = {Guoliang Li and
Jun Qian and
Yuan Zuo and
Rui Li and
Qinfu Yang},
title = {Scan Test Data Volume Reduction for SoC Designs in {EDT} Environment},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {103--104},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.27},
doi = {10.1109/ATS.2013.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiQZLY13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LienLHC13,
author = {Wei{-}Cheng Lien and
Kuen{-}Jong Lee and
Tong{-}Yu Hsieh and
Krishnendu Chakrabarty},
title = {A New {LFSR} Reseeding Scheme via Internal Response Feedback},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {97--102},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.26},
doi = {10.1109/ATS.2013.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LienLHC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinH13,
author = {Long{-}Yi Lin and
Hao{-}Chiao Hong},
title = {Design of a Fault-Injectable Fleischer-Laker Switched-Capacitor Biquad
for Verifying the Static Linear Behavior Fault Model},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {62--66},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.20},
doi = {10.1109/ATS.2013.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinLW13,
author = {Bing{-}Yang Lin and
Mincent Lee and
Cheng{-}Wen Wu},
title = {Exploration Methodology for 3D Memory Redundancy Architectures under
Redundancy Constraints},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.11},
doi = {10.1109/ATS.2013.11},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LinLW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuJHHN13,
author = {Shyue{-}Kung Lu and
Hao{-}Cheng Jheng and
Masaki Hashizume and
Jiun{-}Lang Huang and
Pony Ning},
title = {Fault Scrambling Techniques for Yield Enhancement of Embedded Memories},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {215--220},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.48},
doi = {10.1109/ATS.2013.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuJHHN13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MillicanS13,
author = {Spencer K. Millican and
Kewal K. Saluja},
title = {Formulating Optimal Test Scheduling Problem with Dynamic Voltage and
Frequency Scaling},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {165--170},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.39},
doi = {10.1109/ATS.2013.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MillicanS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MiyaseSBWK13,
author = {Kohei Miyase and
Matthias Sauer and
Bernd Becker and
Xiaoqing Wen and
Seiji Kajihara},
title = {Search Space Reduction for Low-Power Test Generation},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {171--176},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.40},
doi = {10.1109/ATS.2013.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MiyaseSBWK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoreiraRWKHBOL13,
author = {Jose Moreira and
Bernhard Roth and
Hubert Werkmann and
Lars Klapproth and
Michael Howieson and
Mark Broman and
Wend Ouedraogo and
Mitchell Lin},
title = {An Active Test Fixture Approach for 40 Gbps and Above At-Speed Testing
Using a Standard {ATE} System},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {271--276},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.57},
doi = {10.1109/ATS.2013.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoreiraRWKHBOL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NikaidoFSNS13,
author = {Masafumi Nikaido and
Yukihisa Funatsu and
Tetsuya Seiyama and
Junpei Nonaka and
Kazuki Shigeta},
title = {Failure Localization of Logic Circuits Using Voltage Contrast Considering
State of Transistors},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {67--72},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.21},
doi = {10.1109/ATS.2013.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NikaidoFSNS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SarsonSS13,
author = {Peter Sarson and
Gregor Schatzberger and
Robert Seitz},
title = {Automotive {EEPROM} Qualification and Cost Optimization},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {105--106},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.28},
doi = {10.1109/ATS.2013.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SarsonSS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoK13,
author = {Yasuo Sato and
Seiji Kajihara},
title = {A Stochastic Model for NBTI-Induced {LSI} Degradation in Field},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {183--188},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.42},
doi = {10.1109/ATS.2013.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShihHLLWC13,
author = {Chi{-}Jih Shih and
Shih{-}An Hsieh and
Yi{-}Chang Lu and
James Chien{-}Mo Li and
Tzong{-}Lin Wu and
Krishnendu Chakrabarty},
title = {Test Generation of Path Delay Faults Induced by Defects in Power {TSV}},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {43--48},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.18},
doi = {10.1109/ATS.2013.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShihHLLWC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TomitaWSKGTW13,
author = {Akihiro Tomita and
Xiaoqing Wen and
Yasuo Sato and
Seiji Kajihara and
Patrick Girard and
Mohammad Tehranipoor and
Laung{-}Terng Wang},
title = {On Achieving Capture Power Safety in At-Speed Scan-Based Logic {BIST}},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.14},
doi = {10.1109/ATS.2013.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TomitaWSKGTW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TsaiL13,
author = {Kun{-}Han Tsai and
Xijiang Lin},
title = {Multicycle-aware At-speed Test Methodology},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {49},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.66},
doi = {10.1109/ATS.2013.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TsaiL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/VatajeluDBGTVB13,
author = {Elena I. Vatajelu and
Luigi Dilillo and
Alberto Bosio and
Patrick Girard and
Aida Todri and
Arnaud Virazel and
Nabil Badereddine},
title = {Adaptive Source Bias for Improved Resistive-Open Defect Coverage during
{SRAM} Testing},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {109--114},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.30},
doi = {10.1109/ATS.2013.30},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/VatajeluDBGTVB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangCE13,
author = {Ran Wang and
Krishnendu Chakrabarty and
Bill Eklow},
title = {Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D
ICs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {147--152},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.36},
doi = {10.1109/ATS.2013.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangCE13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangKSC13,
author = {Xian Wang and
Blanchard Kenfack and
Estella Silva and
Abhijit Chatterjee},
title = {Built-In Test of Switched-Mode Power Converters: Avoiding {DUT} Damage
Using Alternative Safe Measurements},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {56--61},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.63},
doi = {10.1109/ATS.2013.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangKSC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Xiang13,
author = {Dong Xiang},
title = {A Cost-Effective Scheme for Network-on-Chip Router and Interconnect
Testing},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {207--212},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.46},
doi = {10.1109/ATS.2013.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Xiang13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YamazakiTTHYHS13,
author = {Koji Yamazaki and
Toshiyuki Tsutsumi and
Hiroshi Takahashi and
Yoshinobu Higami and
Hironobu Yotsuyanagi and
Masaki Hashizume and
Kewal K. Saluja},
title = {Diagnosing Resistive Open Faults Using Small Delay Fault Simulation},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {79--84},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.23},
doi = {10.1109/ATS.2013.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YamazakiTTHYHS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangCL13,
author = {Chi{-}Chun Yang and
Che{-}Wei Chou and
Jin{-}Fu Li},
title = {A {TSV} Repair Scheme Using Enhanced Test Access Architecture for
3-D ICs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.12},
doi = {10.1109/ATS.2013.12},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/YangCL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeJZCG13,
author = {Fangming Ye and
Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {73--78},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.22},
doi = {10.1109/ATS.2013.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YeJZCG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YiWAKKKSK13,
author = {Ru Yi and
Minghui Wu and
Koji Asami and
Haruo Kobayashi and
Ramin Khatami and
Atsuhiro Katayama and
Isao Shimizu and
Kentaroh Katoh},
title = {Digital Compensation for Timing Mismatches in Interleaved ADCs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {134--139},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.34},
doi = {10.1109/ATS.2013.34},
timestamp = {Tue, 31 Oct 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YiWAKKKSK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhouWLL013,
author = {Yanhong Zhou and
Tiancheng Wang and
Tao Lv and
Huawei Li and
Xiaowei Li},
title = {Path Constraint Solving Based Test Generation for Hard-to-Reach States},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {239--244},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.52},
doi = {10.1109/ATS.2013.52},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ZhouWLL013.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2013,
title = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://ieeexplore.ieee.org/xpl/conhome/6689800/proceeding},
isbn = {978-0-7695-5080-0},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2013.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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