"Efficient approaches to testing VHDL DSP models."

James R. Armstrong, Geoff Frank, F. Gail Gray (1996)

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DOI: 10.1007/BF00925501

access: closed

type: Journal Article

metadata version: 2020-05-20

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James R. Armstrong, Geoff Frank, F. Gail Gray:
Efficient approaches to testing VHDL DSP models. J. VLSI Signal Process. 14(2): 221-234 (1996)

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