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"Test Data Compression Using Selective Encoding of Scan Slices."

Zhanglei Wang, Krishnendu Chakrabarty (2008)

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DOI: 10.1109/TVLSI.2008.2000674

access: closed

type: Journal Article

metadata version: 2022-01-03

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  - journals/tvlsi/WangC08
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  - https://dblp.org/rec/journals/tvlsi/WangC08
Zhanglei Wang, Krishnendu Chakrabarty:
Test Data Compression Using Selective Encoding of Scan Slices. IEEE Trans. Very Large Scale Integr. Syst. 16(11): 1429-1440 (2008)

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