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"A Sub-1-V 65-nm MOS Threshold Monitoring-Based Voltage Reference."

Xiao Liang Tan, Pak Kwong Chan, Uday Dasgupta (2015)

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DOI: 10.1109/TVLSI.2014.2361766

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/TanCD15
Xiao Liang Tan, Pak Kwong Chan, Uday Dasgupta:
A Sub-1-V 65-nm MOS Threshold Monitoring-Based Voltage Reference. IEEE Trans. Very Large Scale Integr. Syst. 23(10): 2317-2321 (2015)

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