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"A Test Chip for Characterization of the Series Association of MOSFETs."

Rafael Sanchotene Silva et al. (2019)

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DOI: 10.1109/TVLSI.2019.2908338

access: closed

type: Journal Article

metadata version: 2020-10-26

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Rafael Sanchotene Silva, Lucas Pereira Luiz, Márcio Cherem Schneider, Carlos Galup-Montoro:
A Test Chip for Characterization of the Series Association of MOSFETs. IEEE Trans. Very Large Scale Integr. Syst. 27(8): 1967-1971 (2019)

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