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"High-Volume Testing and DC Offset Trimming Technique of On-Die Bandgap ..."

Takao Oshita, Jonathan Douglas, Arun Krishnamoorthy (2019)

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DOI: 10.1109/TVLSI.2018.2882567

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/OshitaDK19
Takao Oshita, Jonathan Douglas, Arun Krishnamoorthy:
High-Volume Testing and DC Offset Trimming Technique of On-Die Bandgap Voltage Reference for SOCs and Microprocessors. IEEE Trans. Very Large Scale Integr. Syst. 27(4): 821-829 (2019)

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