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"Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques."

Vojtech Mrazek et al. (2019)

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DOI: 10.1109/TVLSI.2019.2923848

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/MrazekSDSS19
Vojtech Mrazek, Lukás Sekanina, Roland Dobai, Marek Sýs, Petr Svenda:
Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques. IEEE Trans. Very Large Scale Integr. Syst. 27(12): 2734-2744 (2019)

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