"Highly Defect Detectable and SEU-Resilient Robust Scan-Test-Aware Latch ..."

Ruijun Ma et al. (2025)

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DOI: 10.1109/TVLSI.2024.3467089

access: closed

type: Journal Article

metadata version: 2025-02-14

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Ruijun Ma, Stefan Holst, Hui Xu, Xiaoqing Wen, Senling Wang, Jiuqi Li, Aibin Yan:
Highly Defect Detectable and SEU-Resilient Robust Scan-Test-Aware Latch Design. IEEE Trans. Very Large Scale Integr. Syst. 33(2): 449-461 (2025)

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