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"Dynamic Statistical-Timing-Analysis-Based VLSI Path Delay Test Pattern ..."

Bao Liu, Lu Wang (2015)

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DOI: 10.1109/TVLSI.2014.2352937

access: closed

type: Journal Article

metadata version: 2023-12-21

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Bao Liu, Lu Wang:
Dynamic Statistical-Timing-Analysis-Based VLSI Path Delay Test Pattern Generation. IEEE Trans. Very Large Scale Integr. Syst. 23(9): 1577-1590 (2015)

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