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"ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining ..."

Hayoung Lee et al. (2022)

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DOI: 10.1109/TVLSI.2022.3153894

access: closed

type: Journal Article

metadata version: 2024-02-27

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Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang:
ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM. IEEE Trans. Very Large Scale Integr. Syst. 30(6): 781-793 (2022)

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