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"ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining ..."
Hayoung Lee et al. (2022)
- Hayoung Lee
, Younwoo Yoo, Seung Ho Shin, Sungho Kang
:
ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM. IEEE Trans. Very Large Scale Integr. Syst. 30(6): 781-793 (2022)
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