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"A process variation compensating technique with an on-die leakage current ..."

Chris H. Kim et al. (2006)

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DOI: 10.1109/TVLSI.2006.878226

access: closed

type: Journal Article

metadata version: 2022-02-25

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Chris H. Kim, Kaushik Roy, Steven Hsu, Ram Krishnamurthy, Shekhar Borkar:
A process variation compensating technique with an on-die leakage current sensor for nanometer scale dynamic circuits. IEEE Trans. Very Large Scale Integr. Syst. 14(6): 646-649 (2006)

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