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"Optimization of Experimental Designs for System- Level Accelerated Life ..."

Dae-Hyun Kim, Shu-Han Hsu, Linda Milor (2019)

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DOI: 10.1109/TVLSI.2019.2909086

access: closed

type: Journal Article

metadata version: 2021-06-29

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Dae-Hyun Kim, Shu-Han Hsu, Linda Milor:
Optimization of Experimental Designs for System- Level Accelerated Life Test in a Memory System Degraded by Time-Dependent Dielectric Breakdown. IEEE Trans. Very Large Scale Integr. Syst. 27(7): 1640-1651 (2019)

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