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"Stack Sizing for Optimal Current Drivability in Subthreshold Circuits."

John Keane et al. (2008)

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DOI: 10.1109/TVLSI.2008.917571

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - journals/tvlsi/KeaneEKSK08
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  - https://dblp.org/rec/journals/tvlsi/KeaneEKSK08
John Keane, Hanyong Eom, Tony Tae-Hyoung Kim, Sachin S. Sapatnekar, Chris H. Kim:
Stack Sizing for Optimal Current Drivability in Subthreshold Circuits. IEEE Trans. Very Large Scale Integr. Syst. 16(5): 598-602 (2008)

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