"High-Resolution All-Digital Duty-Cycle Corrector in 65-nm CMOS Technology."

Ching-Che Chung, Duo Sheng, Sung-En Shen (2014)

Details and statistics

DOI: 10.1109/TVLSI.2013.2260186

access: closed

type: Journal Article

metadata version: 2020-03-11

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