"Scan Power Reduction for Linear Test Compression Schemes Through Seed ..."

Mingjing Chen, Alex Orailoglu (2012)

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DOI: 10.1109/TVLSI.2011.2173509

access: closed

type: Journal Article

metadata version: 2020-03-11

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Mingjing Chen, Alex Orailoglu:
Scan Power Reduction for Linear Test Compression Schemes Through Seed Selection. IEEE Trans. Very Large Scale Integr. Syst. 20(12): 2170-2183 (2012)

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