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"Scalable Device Array for Statistical Characterization of BTI-Related ..."

Hiromitsu Awano, Shumpei Morita, Takashi Sato (2017)

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DOI: 10.1109/TVLSI.2016.2638021

access: closed

type: Journal Article

metadata version: 2022-04-09

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  dblp key:
  - journals/tvlsi/AwanoMS17
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  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/AwanoMS17
Hiromitsu Awano, Shumpei Morita, Takashi Sato:
Scalable Device Array for Statistical Characterization of BTI-Related Parameters. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1455-1466 (2017)

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