"Test power reductions through computationally efficient, decoupled scan ..."

Ozgur Sinanoglu, Alex Orailoglu (2005)

Details and statistics

DOI: 10.1109/TR.2005.847276

access: closed

type: Journal Article

metadata version: 2020-12-29

a service of  Schloss Dagstuhl - Leibniz Center for Informatics