"Strain energy imaging of a power MOS transistor using speckle interferometry."

Stefan Dilhaire et al. (2004)

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DOI: 10.1109/TR.2004.829165

access: closed

type: Journal Article

metadata version: 2021-10-14

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Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Wilfrid Claeys:
Strain energy imaging of a power MOS transistor using speckle interferometry. IEEE Trans. Reliab. 53(2): 293-296 (2004)

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