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Sébastien Jorez

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2000 – 2009

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2004
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  - https://dblp.org/rec/journals/tr/DilhaireGJC04
Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Wilfrid Claeys:
Strain energy imaging of a power MOS transistor using speckle interferometry. IEEE Trans. Reliab. 53(2): 293-296 (2004)
2001
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Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patiño Lopez, Emmanuel Schaub, Wilfrid Claeys:
Laser diode COFD analysis by thermoreflectance microscopy. Microelectron. Reliab. 41(9-10): 1597-1601 (2001)

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