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"Launch-on-Shift Test Generation for Testing Scan Designs Containing ..."

Shianling Wu et al. (2012)

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DOI: 10.1145/2348839.2348852

access: closed

type: Journal Article

metadata version: 2018-11-06

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  - https://dblp.org/rec/journals/todaes/WuWWJHLLH12
Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Wen-Ben Jone, Michael S. Hsiao, Fangfang Li, James Chien-Mo Li, Jiun-Lang Huang:
Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains. ACM Trans. Design Autom. Electr. Syst. 17(4): 48:1-48:16 (2012)

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