"Increasing the Fault Coverage of a Truncated Test Set."

Irith Pomeranz (2022)

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DOI: 10.1145/3508459

access: closed

type: Journal Article

metadata version: 2023-01-15

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Irith Pomeranz:
Increasing the Fault Coverage of a Truncated Test Set. ACM Trans. Design Autom. Electr. Syst. 27(6): 54:1-54:16 (2022)

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