"N-Detection Test Sets for Circuits with Multiple Independent Scan ..."

Irith Pomeranz (2016)

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DOI: 10.1145/2897514

access: closed

type: Journal Article

metadata version: 2018-11-06

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Irith Pomeranz:
N-Detection Test Sets for Circuits with Multiple Independent Scan Chains. ACM Trans. Design Autom. Electr. Syst. 21(4): 68:1-68:15 (2016)

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