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"Design-for-Testability for Functional Broadside Tests under Primary Input ..."

Irith Pomeranz (2016)

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DOI: 10.1145/2831231

access: closed

type: Journal Article

metadata version: 2018-11-06

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Irith Pomeranz:
Design-for-Testability for Functional Broadside Tests under Primary Input Constraints. ACM Trans. Design Autom. Electr. Syst. 21(2): 35:1-35:18 (2016)

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