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"Diagnostic simulation of stuck-at faults in sequential circuits using ..."

Ismed Hartanto et al. (2001)

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DOI: 10.1145/502175.502177

access: closed

type: Journal Article

metadata version: 2018-11-06

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Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty:
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists. ACM Trans. Design Autom. Electr. Syst. 6(4): 471-489 (2001)

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