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"Yield Optimization for Analog Circuits over Multiple Corners via Bayesian ..."
Nanlin Guo et al. (2024)
- Nanlin Guo, Fulin Peng, Jiahe Shi, Fan Yang, Jun Tao, Xuan Zeng:
Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation. ACM Trans. Design Autom. Electr. Syst. 29(1): 12:1-12:17 (2024)
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