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"Fault tolerance in systems design in VLSI using data compression under ..."

Sunil R. Das et al. (2001)

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DOI: 10.1109/19.982974

access: closed

type: Journal Article

metadata version: 2020-06-08

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Sunil R. Das, Chittoor V. Ramamoorthy, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone:
Fault tolerance in systems design in VLSI using data compression under constraints of failure probabilities. IEEE Trans. Instrum. Meas. 50(6): 1725-1747 (2001)

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